Linda Milor

2.4k citations

156 papers · 1.8k indexed · h-index 19

Electrical and Electronic Engineering top 2%
Hardware and Architecture top 0.5%
Electronic, Optical and Magnetic Materials top 10%
Biomedical Engineering
Control and Systems Engineering top 10%

Co-authors: V. Visvanathan Alberto Sangiovanni‐Vincentelli Chang-Chih Chen Michael Orshansky Fahad Ahmed Chenming Hu Muhammad Bashir Kexin Yang
Topics: Semiconductor materials and devices (100 papers)Integrated Circuits and Semiconductor Failure Analysis (68 papers)Advancements in Semiconductor Devices and Circuit Design (58 papers)
Cited by: Hardware and Architecture Electrical and Electronic Engineering Electronic, Optical and Magnetic Materials
Journals: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Transactions on Very Large Scale Integration (VLSI) Systems Microelectronics Reliability
Partner nations: United States Taiwan China

In The Last Decade

Linda Milor

144 papers receiving 1.8k citations

Peers

Countries citing papers authored by Linda Milor

Since Specialization

Citations

This map shows the geographic impact of Linda Milor's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Linda Milor with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Linda Milor more than expected).

Fields of papers citing papers by Linda Milor

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Linda Milor. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Linda Milor. The network helps show where Linda Milor may publish in the future.

Co-authorship network of co-authors of Linda Milor

This figure shows the co-authorship network connecting the top 25 collaborators of Linda Milor. A scholar is included among the top collaborators of Linda Milor based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Linda Milor. Linda Milor is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Calibration and efficient evaluation of electromigration lifetime for interconnect wire sizing of multi-port networks 2023 ·Microelectronics Reliability ·Linda Milor,(unknown)	2
2	Extraction of wearout model parameters using on-line test of an SRAM 2020 ·Microelectronics Reliability ·(unknown),(unknown),(unknown),Kexin Yang,(unknown),Linda Milor	1
3	Inverse Design of FinFET SRAM Cells 2020 ·(unknown),Zhaocheng Liu,Kexin Yang,(unknown),Wenshan Cai,Linda Milor	1
4	Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor 2019 ·(unknown),Kexin Yang,(unknown),Linda Milor	4
5	Modeling of FinFET SRAM array reliability degradation due to electromigration 2019 ·Microelectronics Reliability ·(unknown),Kexin Yang,(unknown),Linda Milor	6
6	Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown 2017 ·(unknown),(unknown),Kexin Yang,Linda Milor	10
7	Analysis of time-dependent dielectric breakdown induced aging of SRAM cache with different configurations 2017 ·Microelectronics Reliability ·(unknown),(unknown),Kexin Yang,Linda Milor	7
8	The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system 2015 ·Microelectronics Reliability ·Soonyoung Cha,Dae-Hyun Kim,(unknown),Linda Milor	3
9	System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown 2015 ·Microelectronics Reliability ·(unknown),Chang-Chih Chen,Soonyoung Cha,Linda Milor	19
10	Comprehensive reliability and aging analysis on SRAMs within microprocessor systems 2015 ·Microelectronics Reliability ·(unknown),Chang-Chih Chen,(unknown),Linda Milor	11
11	Wearout-aware compiler-directed register assignment for embedded systems 2012 ·Infoscience (Ecole Polytechnique Fédérale de Lausanne) ·Fahad Ahmed,Mohamed M. Sabry,David Atienza,Linda Milor	8
12	Towards a chip level reliability simulator for copper/low-k backend processes 2010 ·Design, Automation, and Test in Europe ·Muhammad Bashir,Linda Milor	18
13	Via wearout detection with on chip monitors 2009 ·Fahad Ahmed,Linda Milor	2
14	Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements 2009 ·IEEE Design & Test of Computers ·Muhammad Bashir,Linda Milor	13
15	Timing Analysis with Compact Variation-Aware Standard Cell Models 2009 ·(unknown),Linda Milor	1
16	Diagnosis of Optical Lithography Faults With Product Test Sets 2008 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Munkang Choi,Linda Milor	3
17	Characterization of Spatial Intrafield Gate CD Variability, Its Impact on Circuit Performance, and Spatial Mask-Level Correction 2004 ·IEEE Transactions on Semiconductor Manufacturing ·Michael Orshansky,Linda Milor,Chenming Hu	83
18	Impact of spatial intrachip gate length variability on the performance of high-speed digital circuits 2002 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Michael Orshansky,Linda Milor,Pinhong Chen,Kurt Keutzer,Chenming Hu	118
19	Application of in-situ particle monitoring in defect management system under clean manufacturing environment 2002 ·(unknown),(unknown),Linda Milor,(unknown)	2
20	Minimizing production test time to detect faults in analog circuits 1994 ·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ·Linda Milor,Alberto Sangiovanni‐Vincentelli	142

About Linda Milor

Linda Milor is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials, having authored 156 papers that have together received 1.8k indexed citations. Recurring topics across this work include Semiconductor materials and devices (100 papers), Integrated Circuits and Semiconductor Failure Analysis (68 papers) and Advancements in Semiconductor Devices and Circuit Design (58 papers). The work is most often cited by research in Hardware and Architecture (1.0k citations), Electrical and Electronic Engineering (1.7k citations) and Electronic, Optical and Magnetic Materials (173 citations). Linda Milor has collaborated with scholars based in United States, Taiwan and China. Frequent co-authors include V. Visvanathan, Alberto Sangiovanni‐Vincentelli, Chang-Chih Chen, Michael Orshansky, Fahad Ahmed, Chenming Hu, Muhammad Bashir, Kexin Yang, Soonyoung Cha and Pinhong Chen. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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