Shigeki Nojima

490 total citations
44 papers, 352 citations indexed

About

Shigeki Nojima is a scholar working on Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Hardware and Architecture. According to data from OpenAlex, Shigeki Nojima has authored 44 papers receiving a total of 352 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 19 papers in Industrial and Manufacturing Engineering and 11 papers in Hardware and Architecture. Recurrent topics in Shigeki Nojima's work include Advancements in Photolithography Techniques (38 papers), Industrial Vision Systems and Defect Detection (16 papers) and VLSI and FPGA Design Techniques (10 papers). Shigeki Nojima is often cited by papers focused on Advancements in Photolithography Techniques (38 papers), Industrial Vision Systems and Defect Detection (16 papers) and VLSI and FPGA Design Techniques (10 papers). Shigeki Nojima collaborates with scholars based in Japan, United States and China. Shigeki Nojima's co-authors include Tetsuaki Matsunawa, Chikaaki Kodama, David Z. Pan, Yuki Watanabe, Taiki Kimura, Yibo Lin, Koichi Nakayama, Meng Li, Xiaoqing Xu and Atsushi Takahashi and has published in prestigious journals such as Japanese Journal of Applied Physics, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and Journal of Micro/Nanolithography MEMS and MOEMS.

In The Last Decade

Shigeki Nojima

37 papers receiving 331 citations

Peers

Shigeki Nojima

EEE

IME

CVPR

Tetsuaki Matsunawa Japan

Luigi Capodieci United States

Chikaaki Kodama Japan

R.P. Kraft United States

Zheng Shi China

Yuelin Du United States

Jeong-Taek Kong South Korea

C. H. Yu Taiwan

Tomohiro Nakai Japan

Daehwan Lho South Korea

Tetsuaki Matsunawa Japan

Shigeki Nojima

376 ×1.2

EEE

223 ×1.6

IME

67 ×1.0

108 ×1.7

CVPR

37 ×0.8

Citations per year, relative to Shigeki Nojima Shigeki Nojima (= 1×) peers Tetsuaki Matsunawa

Countries citing papers authored by Shigeki Nojima

Since Specialization

Citations

This map shows the geographic impact of Shigeki Nojima's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shigeki Nojima with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shigeki Nojima more than expected).

Fields of papers citing papers by Shigeki Nojima

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shigeki Nojima. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shigeki Nojima. The network helps show where Shigeki Nojima may publish in the future.

Co-authorship network of co-authors of Shigeki Nojima

This figure shows the co-authorship network connecting the top 25 collaborators of Shigeki Nojima. A scholar is included among the top collaborators of Shigeki Nojima based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shigeki Nojima. Shigeki Nojima is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Higuchi, Jiro, et al.. (2020). Advanced memory cell design optimization with inverse lithography technology. 5–5. 1 indexed citations

Ye, Wei, Mohamed Baker Alawieh, Yuki Watanabe, et al.. (2020). TEMPO: Fast Mask Topography Effect Modeling with Deep Learning. 127–134. 15 indexed citations

Nojima, Shigeki, et al.. (2018). Hotspot detection based on surrounding optical feature. 7275. 18–18. 1 indexed citations

Xu, Xiaoqing, Yibo Lin, Meng Li, et al.. (2017). Subresolution Assist Feature Generation With Supervised Data Learning. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 37(6). 1225–1236. 22 indexed citations

Tomioka, Yoichi, Tetsuaki Matsunawa, Chikaaki Kodama, & Shigeki Nojima. (2017). Lithography hotspot detection by two-stage cascade classifier using histogram of oriented light propagation. 81–86. 18 indexed citations

Xu, Xiaoqing, et al.. (2016). A Machine Learning Based Framework for Sub-Resolution Assist Feature Generation. 161–168. 23 indexed citations

Kodama, Chikaaki, et al.. (2015). Self-Aligned Double and Quadruple Patterning Aware Grid Routing Methods. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 34(5). 753–765. 9 indexed citations

Matsui, Tomomi, Yoko Yokoyama, Chikaaki Kodama, et al.. (2015). Fast mask assignment using positive semidefinite relaxation in LELECUT triple patterning lithography. 665–670. 3 indexed citations

Kodama, Chikaaki, et al.. (2015). Self-aligned quadruple patterning-compliant placement. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9427. 942708–942708. 2 indexed citations

10.

Kodama, Chikaaki, et al.. (2014). Self-Aligned Double and Quadruple Patterning-Aware Grid Routing. IEICE Technical Report; IEICE Tech. Rep.. 113(454). 99–104. 1 indexed citations

11.

Yokoyama, Yoko, et al.. (2014). Yield-aware decomposition for LELE double patterning. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9053. 90530T–90530T. 4 indexed citations

12.

Kodama, Chikaaki, Koichi Nakayama, Takayuki Kotani, et al.. (2013). Self-Aligned Double and Quadruple Patterning-aware grid routing with hotspots control. 267–272. 34 indexed citations

13.

Matsunawa, Tetsuaki, et al.. (2012). <title>Clean pattern matching for full chip verification</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8327. 83270T–83270T.

14.

Nakayama, Koichi, et al.. (2012). <title>Self-aligned double and quadruple patterning layout principle</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8327. 83270V–83270V. 15 indexed citations

15.

Matsunawa, Tetsuaki, Shigeki Nojima, Hirokazu Nosato, et al.. (2012). Generator of predictive verification pattern using vision system based on higher-order local autocorrelation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8326. 832615–832615. 6 indexed citations

16.

Nosato, Hirokazu, Tetsuaki Matsunawa, Shigeki Nojima, et al.. (2010). Ultimately accurate SRAF replacement for practical phases using an adaptive search algorithm based on the optimal gradient method. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7640. 764018–764018. 6 indexed citations

17.

Hashimoto, Kohji, et al.. (2009). Tolerance-Based Wafer Verification Methodologies with a Die-to-Database Inspection System. Japanese Journal of Applied Physics. 48(7R). 76502–76502. 2 indexed citations

18.

Nojima, Shigeki, et al.. (2008). Accurate model base verification scheme to eliminate hotspots and manage warmspots. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6925. 69250Z–69250Z. 2 indexed citations

19.

Kobayashi, Sachiko, et al.. (2005). Lithography simulation system for total CD control from design to manufacturing. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5756. 219–219. 1 indexed citations

20.

Nojima, Shigeki, et al.. (2002). Flexible mask specifications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4889. 187–187. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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