Paul R. Besser
- Electrical and Electronic Engineering top 5%
- Electronic, Optical and Magnetic Materials top 5%
- Mechanics of Materials top 5%
- Atomic and Molecular Physics, and Optics top 10%
- Materials Chemistry
- Co-authors
- J. C. BravmanPaul A. FlinnYoung‐Chang JooMichael C. MaddenLinda VanasupaS. BrennanJohn E. SanchezDavid P. Field
- Topics
- Copper Interconnects and Reliability (47 papers)Semiconductor materials and devices (28 papers)Metal and Thin Film Mechanics (25 papers)
- Cited by
- Electronic, Optical and Magnetic MaterialsElectrical and Electronic EngineeringMechanics of Materials
- Partner nations
- United StatesCanadaBelgium
In The Last Decade
Paul R. Besser
66 papers receiving 855 citations
Peers
Comparison fields: 5 of 36
- Electrical and Electronic Engineering 719
- Electronic, Optical and Magnetic Materials 523
- Mechanics of Materials 257
- Atomic and Molecular Physics, and Optics 195
- Materials Chemistry 149
Countries citing papers authored by Paul R. Besser
This map shows the geographic impact of Paul R. Besser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Paul R. Besser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Paul R. Besser more than expected).
Fields of papers citing papers by Paul R. Besser
This network shows the impact of papers produced by Paul R. Besser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Paul R. Besser. The network helps show where Paul R. Besser may publish in the future.
Co-authorship network of co-authors of Paul R. Besser
This figure shows the co-authorship network connecting the top 25 collaborators of Paul R. Besser. A scholar is included among the top collaborators of Paul R. Besser based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Paul R. Besser. Paul R. Besser is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 11 | |
| 2 | 2 | |
| 3 | 3 | |
| 4 | 4 | |
| 5 | 6 | |
| 6 | 1 | |
| 7 | 1 | |
| 8 | 7 | |
| 9 | 4 | |
| 10 | 4 | |
| 11 | Gallium-Doped Silicon Blocked-Impurity-Band Detectors | 1 |
| 12 | 41 | |
| 13 | 2 | |
| 14 | 7 | |
| 15 | 26 | |
| 16 | 22 | |
| 17 | 4 | |
| 18 | 5 | |
| 19 | 64 | |
| 20 | 9 |
About Paul R. Besser
Paul R. Besser is a scholar working on Electronic, Optical and Magnetic Materials, Mechanics of Materials and Electrical and Electronic Engineering, having authored 68 papers that have together received 903 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (47 papers), Semiconductor materials and devices (28 papers) and Metal and Thin Film Mechanics (25 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (523 citations), Electrical and Electronic Engineering (719 citations) and Mechanics of Materials (257 citations). Paul R. Besser has collaborated with scholars based in United States, Canada and Belgium. Frequent co-authors include J. C. Bravman, Paul A. Flinn, Young‐Chang Joo, Michael C. Madden, Linda Vanasupa, S. Brennan, John E. Sanchez, David P. Field, T. Marieb and Karen Maex. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.