S. S. Laderman

3.0k total citations
47 papers, 2.3k citations indexed

About

S. S. Laderman is a scholar working on Condensed Matter Physics, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering. According to data from OpenAlex, S. S. Laderman has authored 47 papers receiving a total of 2.3k indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Condensed Matter Physics, 18 papers in Atomic and Molecular Physics, and Optics and 18 papers in Electrical and Electronic Engineering. Recurrent topics in S. S. Laderman's work include Physics of Superconductivity and Magnetism (21 papers), Semiconductor materials and devices (11 papers) and Magnetic properties of thin films (9 papers). S. S. Laderman is often cited by papers focused on Physics of Superconductivity and Magnetism (21 papers), Semiconductor materials and devices (11 papers) and Magnetic properties of thin films (9 papers). S. S. Laderman collaborates with scholars based in United States, Japan and China. S. S. Laderman's co-authors include A. F. Marshall, R. D. Jacowitz, Chang‐Beom Eom, A. Kapitulnik, T. H. Geballe, R. C. Taber, T. H. Geballe, K. Char, Jian Sun and Kiyoshi Yamamoto and has published in prestigious journals such as Science, The Journal of Chemical Physics and Physical review. B, Condensed matter.

In The Last Decade

S. S. Laderman

46 papers receiving 2.2k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. S. Laderman United States 21 1.8k 843 803 770 487 47 2.3k
J. Geerk Germany 26 2.2k 1.2× 935 1.1× 813 1.0× 823 1.1× 401 0.8× 129 2.6k
G. Saemann‐Ischenko Germany 27 2.8k 1.5× 1.0k 1.2× 1.1k 1.3× 693 0.9× 409 0.8× 148 3.3k
R. S. List United States 24 1.9k 1.0× 1.1k 1.3× 865 1.1× 661 0.9× 511 1.0× 63 2.7k
B. Obst Germany 24 1.4k 0.8× 598 0.7× 689 0.9× 464 0.6× 154 0.3× 75 2.0k
B. Roas Germany 20 2.0k 1.1× 885 1.0× 583 0.7× 615 0.8× 484 1.0× 54 2.3k
Hiromasa Mazaki Japan 25 2.2k 1.3× 712 0.8× 1.2k 1.4× 428 0.6× 206 0.4× 113 2.6k
H. Adrian Germany 31 2.5k 1.4× 1.0k 1.2× 1.7k 2.1× 884 1.1× 321 0.7× 238 3.3k
K. T. Short United States 26 1.8k 1.0× 843 1.0× 1.2k 1.5× 991 1.3× 1.1k 2.3× 70 3.2k
J. N. Eckstein United States 21 1.3k 0.7× 597 0.7× 716 0.9× 495 0.6× 270 0.6× 57 2.0k
S. B. Woods Canada 21 1.3k 0.7× 866 1.0× 1.1k 1.4× 712 0.9× 285 0.6× 81 2.5k

Countries citing papers authored by S. S. Laderman

Since Specialization
Citations

This map shows the geographic impact of S. S. Laderman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. S. Laderman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. S. Laderman more than expected).

Fields of papers citing papers by S. S. Laderman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. S. Laderman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. S. Laderman. The network helps show where S. S. Laderman may publish in the future.

Co-authorship network of co-authors of S. S. Laderman

This figure shows the co-authorship network connecting the top 25 collaborators of S. S. Laderman. A scholar is included among the top collaborators of S. S. Laderman based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. S. Laderman. S. S. Laderman is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Laderman, S. S., et al.. (1995). High-Sensitivity Total Reflection X-Ray Fluorescence Spectroscopy of Silicon Wafers Using Synchrotron Radiation. Analytical Sciences. 11(3). 515–518. 4 indexed citations
2.
Brennan, S., N. Takaura, P. Pianetta, et al.. (1994). Wide band-pass approaches to total-reflection X-ray fluorescence using synchrotron radiation. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 347(1-3). 417–421. 15 indexed citations
3.
Merchant, Paul, et al.. (1992). Surface resistance of epitaxial YBa2Cu3O7 thin films on CeO2 diffusion barriers on sapphire. Applied Physics Letters. 60(6). 763–765. 61 indexed citations
4.
Eom, Chang‐Beom, A. F. Marshall, Jean‐Marc Triscone, et al.. (1991). A -Axis—Oriented YBa 2 Cu 3 O 7 /PrBa 2 Cu 3 O 7 Superlattices. Science. 251(4995). 780–783. 42 indexed citations
5.
Hiskes, R., Steve DiCarolis, James L. Young, et al.. (1991). Single source metalorganic chemical vapor deposition of low microwave surface resistance YBa2Cu3O7. Applied Physics Letters. 59(5). 606–607. 87 indexed citations
6.
Eom, Chang‐Beom, Jian Sun, B. M. Lairson, et al.. (1990). Synthesis and properties of YBa2Cu3O7 thin films grown in situ by 90° off-axis single magnetron sputtering. Physica C Superconductivity. 171(3-4). 354–383. 183 indexed citations
7.
Char, K., N. Newman, S. M. Garrison, et al.. (1990). Microwave surface resistance of epitaxial YBa2Cu3O7 thin films on sapphire. Applied Physics Letters. 57(4). 409–411. 89 indexed citations
8.
Char, K., D. K. Fork, T. H. Geballe, et al.. (1990). Properties of epitaxial YBa2Cu3O7 thin films on Al2O3 {1012}. Applied Physics Letters. 56(8). 785–787. 67 indexed citations
9.
Eom, Chang‐Beom, Jian Sun, Seol Ryu, et al.. (1989). Orientation dependent resistive transition broadening in magnetic field of YBa 2 Cu 3 O 7−x thin films. Physica C Superconductivity. 162-164. 605–606. 4 indexed citations
10.
Missert, Nancy A., Robert B. Hammond, J. E. Mooij, et al.. (1989). In situ growth of superconducting YBaCuO using reactive electron-beam coevaporation. IEEE Transactions on Magnetics. 25(2). 2418–2421. 55 indexed citations
11.
King, C. A., Judy L. Hoyt, D. B. Noble, et al.. (1989). Epitaxial Growth of Sil-xGex/Si Heterostructures by Limited Reaction Processing for Minority Carrier Device Applications. MRS Proceedings. 146. 6 indexed citations
12.
King, C. A., Judy L. Hoyt, D. B. Noble, et al.. (1989). Electrical and material quality of Si/sub 1-x/Ge/sub x//Si p-N heterojunctions produced by limited reaction processing. IEEE Electron Device Letters. 10(4). 159–161. 29 indexed citations
13.
Char, K., R. Barton, A. F. Marshall, A. Kapitulnik, & S. S. Laderman. (1988). Analogy between Y2Ba4Cu8O16− and Bi4Ca2Sr4Cu4O16+. Physica C Superconductivity. 152(5). 475–478. 12 indexed citations
14.
Marshall, A. F., R. Barton, K. Char, et al.. (1988). Ordered-defect structure in epitaxialYBa2Cu3O7−xthin films. Physical review. B, Condensed matter. 37(16). 9353–9358. 168 indexed citations
15.
Fischer-Colbrie, A., et al.. (1988). Growth and characterization of AlGaAs/InGaAs/GaAs pseudomorphic structures. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(2). 620–624. 37 indexed citations
16.
Liang, K. S., S. S. Laderman, & J. H. Sinfelt. (1987). Structural study of small catalytic particles using differential anomalous x-ray scattering. The Journal of Chemical Physics. 86(4). 2352–2355. 18 indexed citations
17.
Rosner, S. J., et al.. (1986). Microstructure of thin layers of MBE-grown GaAs on Si substrates. MRS Proceedings. 67. 5 indexed citations
18.
Kamins, T. I., S. S. Laderman, D. Coulman, & J. E. Turner. (1986). Interaction Between CVD Tungsten Films and Silicon during Annealing. Journal of The Electrochemical Society. 133(7). 1438–1442. 10 indexed citations
19.
Scott, M. P., S. S. Laderman, & A. G. Elliot. (1985). Microscopic identification of defects propagating through the center of silicon and indium-doped liquid encapsulated Czochralski grown GaAs using x-ray topography. Applied Physics Letters. 47(12). 1280–1282. 13 indexed citations
20.
Laderman, S. S., et al.. (1985). Application Of X-Ray Diffraction Techniques To Semiconductor Materials Characterization. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 524. 13–13. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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