R.K. Treece

409 total citations
16 papers, 259 citations indexed

About

R.K. Treece is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Molecular Biology. According to data from OpenAlex, R.K. Treece has authored 16 papers receiving a total of 259 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 7 papers in Hardware and Architecture and 1 paper in Molecular Biology. Recurrent topics in R.K. Treece's work include Radiation Effects in Electronics (11 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and VLSI and Analog Circuit Testing (7 papers). R.K. Treece is often cited by papers focused on Radiation Effects in Electronics (11 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers) and VLSI and Analog Circuit Testing (7 papers). R.K. Treece collaborates with scholars based in United States. R.K. Treece's co-authors include C.F. Hawkins, J.M. Soden, F.W. Sexton, G.L. Hash, Wayne T. Corbett, P. J. McWhorter, Carl L. Axness, Daniel M. Fleetwood, K.L. Hughes and P.S. Winokur and has published in prestigious journals such as IEEE Transactions on Nuclear Science, OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information) and International Test Conference.

In The Last Decade

R.K. Treece

16 papers receiving 230 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
R.K. Treece United States 9 252 163 8 7 6 16 259
M. Bellato Italy 6 174 0.7× 133 0.8× 5 0.6× 5 0.7× 3 0.5× 16 196
Yi-Shing Chang United States 11 341 1.4× 232 1.4× 7 0.9× 5 0.7× 3 0.5× 28 351
Alan Righter United States 11 426 1.7× 287 1.8× 19 2.4× 5 0.7× 2 0.3× 24 433
D. Overhauser United States 10 289 1.1× 119 0.7× 5 0.6× 9 1.5× 20 304
Quan Shi United States 3 305 1.2× 162 1.0× 4 0.5× 16 2.3× 2 0.3× 6 316
T.W. Houston United States 10 234 0.9× 64 0.4× 2 0.3× 8 1.3× 32 261
A. Pavlov Canada 8 300 1.2× 129 0.8× 3 0.4× 1 0.1× 3 0.5× 13 319
A. Ochoa United States 11 411 1.6× 88 0.5× 9 1.1× 1 0.2× 24 422
T. Rahal-Arabi United States 8 375 1.5× 119 0.7× 2 0.3× 4 0.7× 17 385
Bogdan Tutuianu United States 5 447 1.8× 221 1.4× 3 0.4× 14 2.3× 6 461

Countries citing papers authored by R.K. Treece

Since Specialization
Citations

This map shows the geographic impact of R.K. Treece's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.K. Treece with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.K. Treece more than expected).

Fields of papers citing papers by R.K. Treece

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.K. Treece. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.K. Treece. The network helps show where R.K. Treece may publish in the future.

Co-authorship network of co-authors of R.K. Treece

This figure shows the co-authorship network connecting the top 25 collaborators of R.K. Treece. A scholar is included among the top collaborators of R.K. Treece based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.K. Treece. R.K. Treece is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

16 of 16 papers shown
1.
Soden, J.M., et al.. (2003). CMOS IC stuck-open-fault electrical effects and design considerations. 423–430. 26 indexed citations
2.
Soden, J.M., et al.. (2002). Increased CMOS IC stuck-at fault coverage with reduced I/sub DDQ/ test sets. 427–435. 31 indexed citations
3.
Hash, G.L., et al.. (1991). Transient radiation hardness of the CMOSV 1.25 micron technology. IEEE Transactions on Nuclear Science. 38(6). 1392–1397. 7 indexed citations
4.
Sexton, F.W., Wayne T. Corbett, Carl L. Axness, et al.. (1991). SEU response of design- and resistor-hardened D-latches in the SA3300 microprocessor. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 2 indexed citations
5.
Sexton, F.W., Wayne T. Corbett, R.K. Treece, et al.. (1991). SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor. IEEE Transactions on Nuclear Science. 38(6). 1521–1528. 27 indexed citations
6.
Soden, J.M., et al.. (1990). Increased CMOS IC stuck-at fault coverage with reduced I DDQ test sets.. International Test Conference. 427–435. 61 indexed citations
7.
Soden, J.M., et al.. (1990). Increased stuck-at fault coverage with reduced I sub DDQ test sets. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 2 indexed citations
8.
Sexton, F.W., R.K. Treece, K.L. Hughes, et al.. (1990). SEU characterization and design dependence of the SA3300 microprocessor. IEEE Transactions on Nuclear Science. 37(6). 1861–1868. 7 indexed citations
9.
Treece, R.K., et al.. (1989). A radiation-hardened 16/32-bit microprocessor. IEEE Transactions on Nuclear Science. 36(6). 2252–2257. 13 indexed citations
10.
Soden, J.M., et al.. (1989). Electrical measurements for CMOS IC stuck-open faults. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 1 indexed citations
11.
Treece, R.K., et al.. (1986). VLSI modeling and design for radiation environments. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 8 indexed citations
12.
Fleetwood, Daniel M., F.W. Sexton, P.S. Winokur, et al.. (1986). Using a 10-keV X-Ray Source for Hardness Assurance. IEEE Transactions on Nuclear Science. 33(6). 1330–1336. 40 indexed citations
13.
Treece, R.K., et al.. (1985). Single Event Upset Immune Integrated Circuits for Project Galileo. IEEE Transactions on Nuclear Science. 32(6). 4159–4163. 13 indexed citations
14.
Treece, R.K., et al.. (1985). SEU immune ICs for project Galileo. OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information). 2 indexed citations
15.
Sexton, F.W., Richard E. Anderson, Wayne T. Corbett, et al.. (1983). Radiation Testing of the CMOS 8085 Microprocessor Family. IEEE Transactions on Nuclear Science. 30(6). 4235–4239. 7 indexed citations
16.
Corbett, Wayne T., et al.. (1983). Radiation-Hard Design Principles Utilized in CMOS 8085 Microprocessor Family. IEEE Transactions on Nuclear Science. 30(6). 4229–4234. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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