J.J. Liou

1.9k citations

68 papers · 1.5k indexed · 1 hit paper · h-index 16

Impact in

Electrical and Electronic Engineering top 5%
- Advancements in Semiconductor Devices and Circuit Design
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Integrated Circuits and Semiconductor Failure Analysis
- Thin-Film Transistor Technologies
- Radio Frequency Integrated Circuit Design
- Silicon and Solar Cell Technologies
Atomic and Molecular Physics, and Optics top 10%
- Semiconductor materials and interfaces

Papers in

Electrical and Electronic Engineering 63
- Advancements in Semiconductor Devices and Circuit Design 37
- Silicon Carbide Semiconductor Technologies 23
- Semiconductor materials and devices 22
- Integrated Circuits and Semiconductor Failure Analysis 14
- Radio Frequency Integrated Circuit Design 11
- Electrostatic Discharge in Electronics 7
Hardware and Architecture 5

Co-authors: A. Ortíz-Conde Francisco J. García-Sánchez Y. Yue M. Estrada A. Cerdeira Waisum Wong C.I. Huang L.L. Liou
Journals: Solid-State Electronics (23 papers)IEEE Transactions on Electron Devices (6 papers)Microelectronics Reliability (4 papers)IEEE Electron Device Letters (2 papers)Journal of Applied Physics (2 papers)
Partner nations: United States Venezuela China

In The Last Decade

J.J. Liou

65 papers receiving 1.4k citations

Hit Papers

align trajectories log scale

A review of recent MOSFET threshold voltage extraction methods 2002 · 733 citations

Peers

Countries citing papers authored by J.J. Liou

Since Specialization

Citations

This map shows the geographic impact of J.J. Liou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.J. Liou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.J. Liou more than expected).

Fields of papers citing papers by J.J. Liou

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.J. Liou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.J. Liou. The network helps show where J.J. Liou may publish in the future.

Co-authors

The 25 scholars most cited alongside J.J. Liou, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.J. Liou Line = papers co-authored together J.J. Liou links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Overcoming multi finger turn-on in HV DIACs using local poly-ballasting Electrical Overstress/Electrostatic Discharge Symposium ·A Nisi, В.А. Ващенко, J.J. Liou, S Preyer	2014	2
2	Improved and physics-based model for symmetrical spiral inductors IEEE Transactions on Electron Devices ·Chen Ji, J.J. Liou	2006	20
3	Modeling the charge injection process in acoustic charge transport devices Anna Lakhina, J.J. Liou, D.C. Malocha	2003	1
4	RF/microwave transistors: evolution, current status, and future trend Journal of International Crisis and Risk Communication Research ·J.J. Liou, Frank Schwierz	2003	0
5	Analysis and design of a zero voltage switching dc-to-ac inverter Azeem Khan, Katharina Roessner, Issa Batarseh, J.J. Liou, H. Schroeder	2002	1
6	An improved definition for modeling the threshold voltage of MOSFETs Solid-State Electronics ·A. Ortíz-Conde, V. E. Kan, Xi Liang, J.J. Liou	1998	19
7	Drain and source resistances of short-channel LDD MOSFETs Solid-State Electronics ·J. Strait, J.J. Liou, A. Ortíz-Conde, Francisco J. García-Sánchez, Febrianto Anggardika	1997	4
8	Determination of physical mechanisms contributing to the difference between drain and source resistances in short-channel MOSFETs Solid-State Electronics ·A. Ortíz-Conde, J.J. Liou, Katharina Roessner, Francisco J. García-Sánchez	1996	15
9	An improved method for extracting the difference between drain and source resistances in MOSFETs Solid-State Electronics ·A. Ortíz-Conde, Francisco J. García-Sánchez, J.J. Liou	1996	14
10	Analysis of the validity of methods for extracting the effective channel length of short-channel LDD MOSFETs Solid-State Electronics ·Dominic G. Barrett, J.J. Liou, A. Ortíz-Conde, Francisco J. García-Sánchez, Е. Б. Смирнов, Nilayangode Preetha	1996	5
11	Surface oxidation of polycrystalline cadmium telluride thin films for Schottky barrier junction solar cells Solid-State Electronics ·Xianfeng Yi, J.J. Liou	1995	15
12	Two-dimensional numerical analysis for extracting the effective channel length of short-channel MOSFETs Solid-State Electronics ·Katharina Roessner, A. Ortíz-Conde, J.J. Liou, Francisco J. García-Sánchez, Gareth Byatt	1995	14
13	Determination of the fitting parameters for using uniform emitter and base doping profile in bipolar transistor modeling Solid-State Electronics ·J.J. Liou, O.V. Yanchenko, Liu Ru-yi	1994	1
14	A method to extract parameters in a generalized two-terminal device A. Ortíz-Conde, Francisco J. García-Sánchez, J.J. Liou, Jean Andrian, Tamás Erdós, Pierre Schmidt	1994	1
15	Physical models for predicting the performance of Si/Si, AlGaAs/GaAs, and Si/SiGe solar cells Solar Energy Materials and Solar Cells ·J.J. Liou	1993	13
16	An analytical model for current transport in AlGaAs/GaAs abrupt HBTs with a setback layer Solid-State Electronics ·J.J. Liou, O.V. Yanchenko, L.L. Liou, C.I. Huang	1993	36
17	Two-dimensional analysis of ion-implanted, bipolar-compatible, long- and short-channel junction field-effect transistors IEEE Transactions on Electron Devices ·Waisum Wong, J.J. Liou	1992	7
18	Collector signal delay time and collector transit time of HBTs including velocity overshoot Solid-State Electronics ·J.J. Liou, KandagatlaSai Charan	1992	7
19	Lifetime determination in p/n junction diodes and solar cells from open-circuit-voltage decay including junction capacitance effects Solid-State Electronics ·J.J. Liou, F.A. Lindholm	1987	10
20	High-forward-voltage junction capacitance including effects of excess carrier storage in electron-hole plasma Journal of Applied Physics ·J.J. Liou, F.A. Lindholm	1987	4

About J.J. Liou

J.J. Liou is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Statistics, Probability and Uncertainty and Condensed Matter Physics, having authored 68 papers that have together received 1.5k indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (37 papers), Silicon Carbide Semiconductor Technologies (23 papers), Semiconductor materials and devices (22 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Semiconductor Quantum Structures and Devices (13 papers), Semiconductor materials and interfaces (12 papers), Radio Frequency Integrated Circuit Design (11 papers) and Electrostatic Discharge in Electronics (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Atomic and Molecular Physics, and Optics (236 citations), Bioengineering (38 citations), Condensed Matter Physics (68 citations) and Biomedical Engineering (223 citations). J.J. Liou has collaborated with scholars based in United States, Venezuela and China. Frequent co-authors include A. Ortíz-Conde, Francisco J. García-Sánchez, Y. Yue, M. Estrada, A. Cerdeira, Waisum Wong, C.I. Huang, L.L. Liou, Chen Ji and Xianfeng Yi. Their work appears in journals such as Solid-State Electronics, IEEE Transactions on Electron Devices, Microelectronics Reliability, IEEE Electron Device Letters and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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