Christian Boit

2.7k total citations
146 papers, 1.7k citations indexed

About

Christian Boit is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Christian Boit has authored 146 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 142 papers in Electrical and Electronic Engineering, 48 papers in Atomic and Molecular Physics, and Optics and 46 papers in Biomedical Engineering. Recurrent topics in Christian Boit's work include Integrated Circuits and Semiconductor Failure Analysis (117 papers), Force Microscopy Techniques and Applications (41 papers) and Semiconductor materials and devices (35 papers). Christian Boit is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (117 papers), Force Microscopy Techniques and Applications (41 papers) and Semiconductor materials and devices (35 papers). Christian Boit collaborates with scholars based in Germany, United States and Japan. Christian Boit's co-authors include Jean‐Pierre Seifert, Clemens Helfmeier, Dmitry Nedospasov, B. Ebersberger, Alexander Olbrich, Shahin Tajik, Heiko Lohrke, J. Otto, J. Kölzer and R. Sittig and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Christian Boit

132 papers receiving 1.6k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Christian Boit Germany 20 1.4k 845 361 289 240 146 1.7k
P. Olivo Italy 29 3.2k 2.4× 695 0.8× 290 0.8× 142 0.5× 248 1.0× 194 3.7k
Shinobu Fujita Japan 26 1.8k 1.3× 271 0.3× 688 1.9× 297 1.0× 81 0.3× 121 2.3k
P. Bradley United States 18 1.4k 1.0× 415 0.5× 765 2.1× 1.5k 5.3× 100 0.4× 44 2.1k
E. Nowak France 34 5.5k 4.1× 452 0.5× 465 1.3× 658 2.3× 198 0.8× 176 5.8k
Hugh Barnaby United States 34 4.3k 3.2× 388 0.5× 105 0.3× 166 0.6× 410 1.7× 223 4.5k
Xuanyao Fong Singapore 27 2.0k 1.5× 270 0.3× 914 2.5× 142 0.5× 217 0.9× 101 2.3k
Tetsuo Endoh Japan 30 3.0k 2.2× 360 0.4× 1.5k 4.3× 329 1.1× 41 0.2× 325 3.9k
M. Bohr United States 28 3.6k 2.7× 513 0.6× 344 1.0× 569 2.0× 32 0.1× 51 4.0k
R. Bez Italy 25 3.1k 2.3× 325 0.4× 257 0.7× 389 1.3× 98 0.4× 78 3.8k
Yangyuan Wang China 32 3.4k 2.5× 59 0.1× 218 0.6× 815 2.8× 315 1.3× 259 3.7k

Countries citing papers authored by Christian Boit

Since Specialization
Citations

This map shows the geographic impact of Christian Boit's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Christian Boit with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Christian Boit more than expected).

Fields of papers citing papers by Christian Boit

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Christian Boit. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Christian Boit. The network helps show where Christian Boit may publish in the future.

Co-authorship network of co-authors of Christian Boit

This figure shows the co-authorship network connecting the top 25 collaborators of Christian Boit. A scholar is included among the top collaborators of Christian Boit based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Christian Boit. Christian Boit is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Boit, Christian. (2017). Technologies for Heterogeneous Integration - Challenges and chances for fault isolation. Microelectronics Reliability. 76-77. 184–187. 1 indexed citations
2.
Tajik, Shahin, et al.. (2017). PUFMon: Security monitoring of FPGAs using physically unclonable functions. 186–191. 27 indexed citations
3.
Boit, Christian, et al.. (2014). Backside failure analysis techniques: What's the gain of silicon getting thinner?. 33. 17–21. 1 indexed citations
4.
Tajik, Shahin, Dmitry Nedospasov, Clemens Helfmeier, Jean‐Pierre Seifert, & Christian Boit. (2014). Emission Analysis of Hardware Implementations. 528–534. 16 indexed citations
5.
Helfmeier, Clemens, Christian Boit, Dmitry Nedospasov, Shahin Tajik, & Jean‐Pierre Seifert. (2014). Physical vulnerabilities of Physically Unclonable Functions. Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014. 1–4. 14 indexed citations
6.
Maresca, Bruno, Maurizio Angelillo, Giovanni Landi, et al.. (2013). Bio-Nano-Composite Materials Constructed With Single Cells and Carbon Nanotubes: Mechanical, Electrical, and Optical Properties. IEEE Transactions on Nanotechnology. 12(6). 1026–1030. 23 indexed citations
7.
Helfmeier, Clemens, et al.. (2013). Breaking and entering through the silicon. 733–744. 84 indexed citations
8.
Boit, Christian, et al.. (2013). Security Risks Posed by Modern IC Debug and Diagnosis Tools. 3–11. 26 indexed citations
9.
Boit, Christian, et al.. (2011). Can Illuminated IV-Characteristics of Micro-Regions in Solar Cells be Measured by Laser-Induced Stimulation?. Proceedings - International Symposium for Testing and Failure Analysis. 38268. 330–335.
10.
Breuer, Thomas, et al.. (2010). Ultra-Low-K dielectric degradation before breakdown. 890–894. 3 indexed citations
11.
Boit, Christian, et al.. (2010). Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC. Microelectronics Reliability. 50(9-11). 1899–1902. 1 indexed citations
12.
Boit, Christian, et al.. (2009). A Versatile Design of Solid Immersion Lenses in Bulk Silicon Using Focused Ion Beam Techniques. Proceedings - International Symposium for Testing and Failure Analysis. 30088. 119–125. 2 indexed citations
13.
Egger, P., et al.. (2009). Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. Microelectronics Reliability. 49(9-11). 1158–1164. 6 indexed citations
14.
Suzuki, Hiroyoshi, et al.. (2007). Systematic Characterization of Integrated Circuit Standard Components as Stimulated by Scanning Laser Beam. IEEE Transactions on Device and Materials Reliability. 7(1). 31–49. 19 indexed citations
15.
Jain, Rajesh K., et al.. (2007). Novel Flip-Chip Probing Methodology Using Electron Beam Probing. 39–43. 3 indexed citations
16.
Boit, Christian, et al.. (2006). Functional IC Analysis Through Chip Backside with Nano Scale Resolution—E-Beam Probing in FIB Trenches to STI Level. Proceedings - International Symposium for Testing and Failure Analysis. 30897. 376–381. 4 indexed citations
17.
Boit, Christian, et al.. (2006). Impact of back side circuit edit on active device performance in bulk silicon ICs. 792. 1236–1244. 12 indexed citations
18.
Boit, Christian, et al.. (2003). Voltage Contrast like Imaging of N-Wells. Proceedings - International Symposium for Testing and Failure Analysis. 30866. 331–337. 4 indexed citations
19.
Boit, Christian, et al.. (2001). <title>Failure analysis concepts for microelectronics technologies and manufacturing of the future</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4406. 1–12. 2 indexed citations
20.
Boit, Christian, B. Ebersberger, L. Frey, et al.. (2001). <title>In-line failure analysis on productive wafers with dual-beam SEM/FIB systems</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4406. 21–30. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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