J. Kölzer
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing 4
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- Electron and X-Ray Spectroscopy Techniques 6
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- Integrated Circuits and Semiconductor Failure Analysis 14
- Semiconductor materials and devices 6
- Advancements in Photolithography Techniques 5
- Advancements in Semiconductor Devices and Circuit Design 3
- Photonic and Optical Devices 1
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- Force Microscopy Techniques and Applications 4
- Co-authors
- Gerald DeboyJ. OttoErich PliesE. OesterschulzeG. SölknerWolfgang ZinthG. MitićChristian Boit
- Journals
- Microelectronic Engineering (4 papers)Quality and Reliability Engineering International (3 papers)Semiconductor Science and Technology (1 paper)
- Partner nations
- GermanyUnited StatesSouth Korea
In The Last Decade
J. Kölzer
18 papers receiving 329 citations
Peers
Comparison fields: 5 of 39
- Hardware and Architecture 35
- Acoustics and Ultrasonics 4
- Radiology, Nuclear Medicine and Imaging 101
- Biomedical Engineering 190
- Surfaces, Coatings and Films 29
Countries citing papers authored by J. Kölzer
This map shows the geographic impact of J. Kölzer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Kölzer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Kölzer more than expected).
Fields of papers citing papers by J. Kölzer
This network shows the impact of papers produced by J. Kölzer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Kölzer. The network helps show where J. Kölzer may publish in the future.
Co-authorship network
The 12 scholars most cited alongside J. Kölzer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 3 | |
| 2 | 1998 | 10 | |
| 3 | 1996 | 59 | |
| 4 | 1994 | 108 | |
| 5 | 1994 | 36 | |
| 6 | 1992 | 7 | |
| 7 | 1992 | 2 | |
| 8 | 1992 | 2 | |
| 9 | 1992 | 75 | |
| 10 | Contactless Testing for Chip Verification | 1991 | 1 |
| 11 | 1991 | 4 | |
| 12 | 1991 | 9 | |
| 13 | 1991 | 13 | |
| 14 | 1990 | 12 | |
| 15 | 1990 | 1 | |
| 16 | 1990 | 1 | |
| 17 | 1990 | 10 | |
| 18 | 1987 | 2 |
About J. Kölzer
J. Kölzer is a scholar working on Surfaces, Coatings and Films, Hardware and Architecture, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering, having authored 18 papers that have together received 355 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (14 papers), Electron and X-Ray Spectroscopy Techniques (6 papers), Semiconductor materials and devices (6 papers), Advancements in Photolithography Techniques (5 papers), Force Microscopy Techniques and Applications (4 papers), VLSI and Analog Circuit Testing (4 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers) and Photonic and Optical Devices (1 paper). The work is most often cited by research in Hardware and Architecture (35 citations), Acoustics and Ultrasonics (4 citations), Radiology, Nuclear Medicine and Imaging (101 citations), Biomedical Engineering (190 citations) and Surfaces, Coatings and Films (29 citations). J. Kölzer has collaborated with scholars based in Germany, United States and South Korea. Frequent co-authors include Gerald Deboy, J. Otto, Erich Plies, E. Oesterschulze, G. Sölkner, Wolfgang Zinth, G. Mitić, Christian Boit, Dietmar Weinmann and D. Schmitt‐Landsiedel. Their work appears in journals such as Microelectronic Engineering, Quality and Reliability Engineering International, Semiconductor Science and Technology, IBM Journal of Research and Development and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.