Steven Kasapi

831 total citations · 1 hit paper
29 papers, 637 citations indexed

About

Steven Kasapi is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Steven Kasapi has authored 29 papers receiving a total of 637 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 14 papers in Biomedical Engineering and 12 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Steven Kasapi's work include Integrated Circuits and Semiconductor Failure Analysis (22 papers), Near-Field Optical Microscopy (11 papers) and Force Microscopy Techniques and Applications (6 papers). Steven Kasapi is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (22 papers), Near-Field Optical Microscopy (11 papers) and Force Microscopy Techniques and Applications (6 papers). Steven Kasapi collaborates with scholars based in United States, United Kingdom and Japan. Steven Kasapi's co-authors include Steven Chu, David S. Weiss, Mark A. Kasevich, Erling Riis, Kathryn A. Moler, Kurt Gibble, Y. Yamamoto, K. Wilsher, Gary Woods and Roman Sobolewski and has published in prestigious journals such as Physical Review Letters, Optics Letters and Journal of the Optical Society of America B.

In The Last Decade

Steven Kasapi

27 papers receiving 571 citations

Hit Papers

Atomic velocity selection using stimulated Raman transitions 1991 2026 2002 2014 1991 50 100 150 200

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Steven Kasapi United States 11 466 252 108 100 77 29 637
Masaaki Maezawa Japan 14 454 1.0× 521 2.1× 106 1.0× 60 0.6× 22 0.3× 93 770
Janice C. Lee United States 8 358 0.8× 353 1.4× 35 0.3× 265 2.6× 178 2.3× 11 760
Charles Slayman United States 12 88 0.2× 452 1.8× 45 0.4× 21 0.2× 151 2.0× 26 488
Francisco M. Soares Germany 16 427 0.9× 804 3.2× 42 0.4× 38 0.4× 2 0.0× 70 853
Xujiao Gao United States 10 98 0.2× 178 0.7× 22 0.2× 13 0.1× 8 0.1× 37 268
J. Gay France 9 179 0.4× 79 0.3× 75 0.7× 5 0.1× 9 0.1× 35 315
J. Troska Switzerland 16 143 0.3× 716 2.8× 26 0.2× 39 0.4× 31 0.4× 103 915
Mohsen K. Akhlaghi Canada 7 185 0.4× 120 0.5× 34 0.3× 172 1.7× 4 0.1× 9 296
Sung Moon South Korea 16 457 1.0× 84 0.3× 28 0.3× 492 4.9× 5 0.1× 49 605
Julia Cline United States 14 505 1.1× 105 0.4× 28 0.3× 235 2.4× 4 0.1× 24 614

Countries citing papers authored by Steven Kasapi

Since Specialization
Citations

This map shows the geographic impact of Steven Kasapi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Steven Kasapi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Steven Kasapi more than expected).

Fields of papers citing papers by Steven Kasapi

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Steven Kasapi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Steven Kasapi. The network helps show where Steven Kasapi may publish in the future.

Co-authorship network of co-authors of Steven Kasapi

This figure shows the co-authorship network connecting the top 25 collaborators of Steven Kasapi. A scholar is included among the top collaborators of Steven Kasapi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Steven Kasapi. Steven Kasapi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Kasapi, Steven, et al.. (2011). Advanced Scan Chain Failure Analysis Using Laser Modulation Mapping and Continuous Wave Probing. Proceedings - International Symposium for Testing and Failure Analysis. 38268. 12–17. 10 indexed citations
3.
Block, Joel A., et al.. (2011). Foundry workflow for dynamic-EFA-based yield ramp. Microelectronics Reliability. 51(9-11). 1668–1672. 1 indexed citations
4.
Kasapi, Steven, et al.. (2010). Volume Electrical Failure Analysis for Product-Specific Yield Enhancement. Proceedings - International Symposium for Testing and Failure Analysis. 30415. 38–48. 2 indexed citations
5.
Kasapi, Steven, et al.. (2010). Laser Voltage Imaging: A New Perspective of Laser Voltage Probing. Proceedings - International Symposium for Testing and Failure Analysis. 30415. 5–13. 38 indexed citations
6.
Kasapi, Steven, et al.. (2010). Scan chain failure analysis using laser voltage imaging. Microelectronics Reliability. 50(9-11). 1422–1426. 13 indexed citations
7.
Ton, T.N., et al.. (2009). Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. Microelectronics Reliability. 49(9-11). 1127–1131.
8.
Boit, Christian, et al.. (2008). Physical IC debug – backside approach and nanoscale challenge. Advances in radio science. 6. 265–272. 6 indexed citations
9.
Boit, Christian, et al.. (2008). Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. Microelectronics Reliability. 48(8-9). 1322–1326. 10 indexed citations
10.
Stellari, Franco, et al.. (2008). Evaluating PICA Capability for Future Low Voltage SOI Chips. Proceedings - International Symposium for Testing and Failure Analysis. 30910. 407–416. 6 indexed citations
11.
Ispasoiu, Radu, et al.. (2006). Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection. Microelectronics Reliability. 46(9-11). 1504–1507. 4 indexed citations
12.
Kasapi, Steven & Gary Woods. (2006). Voltage Noise and Jitter Measurement Using Time-Resolved Emission. Proceedings - International Symposium for Testing and Failure Analysis. 30897. 438–443. 7 indexed citations
13.
Woods, Gary & Steven Kasapi. (2004). Spectrally- and temporally-resolved dynamic emission from CMOS ICs. 2. 598–599. 6 indexed citations
14.
Ton, T.N., et al.. (2003). PC Card Based Optical Probing of Advanced Graphics Processor Using Time Resolved Emission. Proceedings - International Symposium for Testing and Failure Analysis. 30866. 36–39. 9 indexed citations
15.
Kasapi, Steven, et al.. (2002). Practical, non-invasive optical probing for flip-chip devices. 433–442. 9 indexed citations
16.
Kasapi, Steven, et al.. (2001). Comparison of Laser and Emission Based Optical Probe Techniques. Proceedings - International Symposium for Testing and Failure Analysis. 30859. 33–42. 5 indexed citations
17.
Bruce, Mike, et al.. (1999). Waveform Acquisition from the Backside of Silicon Using Electro-Optic Probing. Proceedings - International Symposium for Testing and Failure Analysis. 30835. 19–25. 11 indexed citations
18.
Kasapi, Steven, et al.. (1998). Sub-shot-noise FM noise spectroscopy of trapped rubidium atoms. Journal of the Optical Society of America B. 15(10). 2626–2626. 3 indexed citations
19.
Kasapi, Steven, et al.. (1995). Subshot noise FM spectroscopy with an amplitude-squeezed diode laser at room temperature. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2378. 108–108.
20.
Kasevich, Mark A., David S. Weiss, Erling Riis, et al.. (1991). Atomic velocity selection using stimulated Raman transitions. Physical Review Letters. 66(18). 2297–2300. 237 indexed citations breakdown →

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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