J. Otto
- Electrical and Electronic Engineering
- Biomedical Engineering
- Radiology, Nuclear Medicine and Imaging top 10%
- Mechanical Engineering
- Surfaces, Coatings and Films
- Co-authors
- J. KölzerG. MitićWolfgang ZinthErich PliesG. SölknerChristian BoitGerald DeboyDietmar Weinmann
- Topics
- Integrated Circuits and Semiconductor Failure Analysis (8 papers)Electron and X-Ray Spectroscopy Techniques (7 papers)Optical Imaging and Spectroscopy Techniques (5 papers)
- Cited by
- Radiology, Nuclear Medicine and ImagingAcoustics and UltrasonicsSurfaces, Coatings and Films
- Journals
- Journal of Applied PhysicsIBM Journal of Research and DevelopmentMicroelectronics Reliability
- Partner nations
- GermanyUnited States
In The Last Decade
J. Otto
19 papers receiving 329 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 199
- Biomedical Engineering 182
- Radiology, Nuclear Medicine and Imaging 133
- Mechanical Engineering 41
- Surfaces, Coatings and Films 39
Countries citing papers authored by J. Otto
This map shows the geographic impact of J. Otto's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Otto with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Otto more than expected).
Fields of papers citing papers by J. Otto
This network shows the impact of papers produced by J. Otto. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Otto. The network helps show where J. Otto may publish in the future.
Co-authorship network of co-authors of J. Otto
This figure shows the co-authorship network connecting the top 25 collaborators of J. Otto. A scholar is included among the top collaborators of J. Otto based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Otto. J. Otto is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 4 | |
| 4 | 65 | |
| 5 | 10 | |
| 6 | 3 | |
| 7 | 16 | |
| 8 | 6 | |
| 9 | 8 | |
| 10 | 108 | |
| 11 | 5 | |
| 12 | 2 | |
| 13 | 75 | |
| 14 | 9 | |
| 15 | 12 | |
| 16 | 1 | |
| 17 | 10 | |
| 18 | 6 | |
| 19 | 14 | |
| 20 | On-wafer failure analysis of LSI-MOS memory circuits by scanning electron microscopy | 1 |
About J. Otto
J. Otto is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering, having authored 21 papers that have together received 356 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (8 papers), Electron and X-Ray Spectroscopy Techniques (7 papers) and Optical Imaging and Spectroscopy Techniques (5 papers). The work is most often cited by research in Radiology, Nuclear Medicine and Imaging (133 citations), Acoustics and Ultrasonics (5 citations) and Surfaces, Coatings and Films (39 citations). J. Otto has collaborated with scholars based in Germany and United States. Frequent co-authors include J. Kölzer, G. Mitić, Wolfgang Zinth, Erich Plies, G. Sölkner, Christian Boit, Gerald Deboy, Dietmar Weinmann, R. Dudek and B. Michel. Their work appears in journals such as Journal of Applied Physics, IBM Journal of Research and Development and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.