B. Ebersberger

685 total citations
26 papers, 540 citations indexed

About

B. Ebersberger is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, B. Ebersberger has authored 26 papers receiving a total of 540 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 16 papers in Atomic and Molecular Physics, and Optics and 4 papers in Materials Chemistry. Recurrent topics in B. Ebersberger's work include Integrated Circuits and Semiconductor Failure Analysis (19 papers), Force Microscopy Techniques and Applications (16 papers) and Semiconductor materials and devices (12 papers). B. Ebersberger is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (19 papers), Force Microscopy Techniques and Applications (16 papers) and Semiconductor materials and devices (12 papers). B. Ebersberger collaborates with scholars based in Germany, Spain and United States. B. Ebersberger's co-authors include Alexander Olbrich, Christian Boit, M. Porti, X. Aymerich, M. Nafrı́a, Charles Lee, R. S. Bauer, J. Vancea, W. Hänni and Ph. Niedermann and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

B. Ebersberger

26 papers receiving 521 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
B. Ebersberger Germany 11 436 256 122 118 56 26 540
M. Hoshino Japan 13 672 1.5× 236 0.9× 122 1.0× 131 1.1× 109 1.9× 36 762
L. J. Chen Taiwan 13 309 0.7× 262 1.0× 128 1.0× 211 1.8× 42 0.8× 30 479
Kazuhiko Tsutsumi Japan 11 192 0.4× 147 0.6× 123 1.0× 121 1.0× 57 1.0× 51 338
C. Deguet France 14 494 1.1× 142 0.6× 197 1.6× 144 1.2× 37 0.7× 34 565
Hajime Koyanagi Japan 13 248 0.6× 374 1.5× 270 2.2× 97 0.8× 30 0.5× 37 503
Emil V. Jelenković Hong Kong 11 344 0.8× 94 0.4× 137 1.1× 223 1.9× 42 0.8× 40 466
Marek E. Schmidt Japan 12 256 0.6× 116 0.5× 146 1.2× 194 1.6× 35 0.6× 40 415
Mariusz Sochacki Poland 12 366 0.8× 167 0.7× 47 0.4× 94 0.8× 58 1.0× 50 440
Y. Morand France 16 690 1.6× 106 0.4× 191 1.6× 102 0.9× 95 1.7× 72 741
J. W. Honeycutt United States 8 300 0.7× 330 1.3× 45 0.4× 101 0.9× 29 0.5× 20 406

Countries citing papers authored by B. Ebersberger

Since Specialization
Citations

This map shows the geographic impact of B. Ebersberger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Ebersberger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Ebersberger more than expected).

Fields of papers citing papers by B. Ebersberger

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by B. Ebersberger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Ebersberger. The network helps show where B. Ebersberger may publish in the future.

Co-authorship network of co-authors of B. Ebersberger

This figure shows the co-authorship network connecting the top 25 collaborators of B. Ebersberger. A scholar is included among the top collaborators of B. Ebersberger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with B. Ebersberger. B. Ebersberger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ebersberger, B., et al.. (2008). Consideration of temperature and current stress testing on flip chip solder interconnects. Microelectronics Reliability. 48(11-12). 1847–1856. 9 indexed citations
2.
Ebersberger, B. & Charles Lee. (2008). Cu pillar bumps as a lead-free drop-in replacement for solder-bumped, flip-chip interconnects. 59–66. 42 indexed citations
3.
Ebersberger, B., et al.. (2005). Reliability of lead-free SnAg solder bumps: influence of electromigration and temperature. 2. 1407–1415. 31 indexed citations
4.
Ebersberger, B., et al.. (2004). Qualification of SnAg solder bumps for lead-free flip chip applications. 683–691. 16 indexed citations
5.
Ebersberger, B., et al.. (2003). Application of SCM for the microcharacterization of semiconductor devices. Applied Physics A. 76(6). 885–888. 3 indexed citations
6.
Porti, M., M. Nafrı́a, X. Aymerich, Alexander Olbrich, & B. Ebersberger. (2002). Post-breakdown electrical characterization of ultrathin SiO2 films with conductive atomic force microscopy. Nanotechnology. 13(3). 388–391. 2 indexed citations
7.
Porti, M., M. Nafrı́a, X. Aymerich, Alexander Olbrich, & B. Ebersberger. (2002). Electrical characterization of stressed and broken down SiO2 films at a nanometer scale using a conductive atomic force microscope. Journal of Applied Physics. 91(4). 2071–2079. 79 indexed citations
8.
Porti, M., Xavier Blasco, M. Nafrı́a, et al.. (2001). Pre- and post-breakdown switching behaviour in ultrathin SiO2layers detected by C-AFM. Nanotechnology. 12(2). 164–167. 4 indexed citations
9.
Olbrich, Alexander, B. Ebersberger, Christian Boit, et al.. (2001). Oxide thickness mapping of ultrathin Al2O3 at nanometer scale with conducting atomic force microscopy. Applied Physics Letters. 78(19). 2934–2936. 22 indexed citations
10.
Porti, M., M. Nafrı́a, X. Aymerich, Alexander Olbrich, & B. Ebersberger. (2001). Propagation of the SiO2 breakdown event on MOS structures observed with conductive atomic force microscopy. Microelectronic Engineering. 59(1-4). 265–269. 17 indexed citations
11.
Boit, Christian, B. Ebersberger, L. Frey, et al.. (2001). <title>In-line failure analysis on productive wafers with dual-beam SEM/FIB systems</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4406. 21–30. 5 indexed citations
12.
Ebersberger, B., Alexander Olbrich, & Christian Boit. (2001). Scanning probe microscopy in semiconductor failure analysis. Microelectronics Reliability. 41(8). 1231–1236. 1 indexed citations
13.
Porti, M., M. Nafrı́a, X. Aymerich, Alexander Olbrich, & B. Ebersberger. (2001). Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy. Applied Physics Letters. 78(26). 4181–4183. 44 indexed citations
14.
Boit, Christian, B. Ebersberger, Hans Zimmermann, et al.. (2000). Wafer Conserving Full Range Construction Analysis for IC Fabrication and Process Development Based on FIB/Dual Beam Inline Application. Proceedings - International Symposium for Testing and Failure Analysis. 30842. 393–396. 4 indexed citations
15.
Olbrich, Alexander, B. Ebersberger, & Christian Boit. (2000). Local Electrical Thickness-Mapping of Thin Oxides with Conducting Atomic Force Microscopy. Proceedings - International Symposium for Testing and Failure Analysis. 30842. 511–519. 2 indexed citations
16.
Olbrich, Alexander, et al.. (1999). A new AFM-based tool for testing dielectric quality and reliability on a nanometer scale. Microelectronics Reliability. 39(6-7). 941–946. 7 indexed citations
17.
Olbrich, Alexander, B. Ebersberger, Christian Boit, et al.. (1999). High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 17(4). 1570–1574. 39 indexed citations
18.
Olbrich, Alexander, B. Ebersberger, & Christian Boit. (1998). Nanoscale electrical characterization of thin oxides with conducting atomic force microscopy. 163–168. 14 indexed citations
19.
20.
Ebersberger, B., W. Krühler, W. Fuhs, & H. Mell. (1994). Equilibrium defect density in hydrogenated amorphous germanium. Applied Physics Letters. 65(13). 1683–1685. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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