Frank Altmann

1.6k total citations
121 papers, 1.2k citations indexed

About

Frank Altmann is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials and Biomedical Engineering. According to data from OpenAlex, Frank Altmann has authored 121 papers receiving a total of 1.2k indexed citations (citations by other indexed papers that have themselves been cited), including 88 papers in Electrical and Electronic Engineering, 39 papers in Mechanics of Materials and 27 papers in Biomedical Engineering. Recurrent topics in Frank Altmann's work include Integrated Circuits and Semiconductor Failure Analysis (57 papers), Thermography and Photoacoustic Techniques (29 papers) and Semiconductor materials and devices (24 papers). Frank Altmann is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (57 papers), Thermography and Photoacoustic Techniques (29 papers) and Semiconductor materials and devices (24 papers). Frank Altmann collaborates with scholars based in Germany, United States and France. Frank Altmann's co-authors include Otwin Breitenstein, Viktor Mechtcherine, Christian Schmidt, Matthias Petzold, Andreas Graff, Sebastian Brand, Andreas Lindner, O. Breitenstein, D. S. Katzer and Christian U. Große and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Frank Altmann

113 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Frank Altmann Germany 19 695 318 286 187 177 121 1.2k
Xiaofan Gou China 19 232 0.3× 237 0.7× 448 1.6× 116 0.6× 281 1.6× 101 1.3k
Jaesun Lee South Korea 18 500 0.7× 292 0.9× 106 0.4× 179 1.0× 219 1.2× 94 1.1k
Satoshi IZUMI Japan 19 457 0.7× 435 1.4× 221 0.8× 155 0.8× 562 3.2× 158 1.6k
Yiping Wu China 16 626 0.9× 181 0.6× 98 0.3× 117 0.6× 191 1.1× 116 985
Baozhu Wang China 16 351 0.5× 118 0.4× 162 0.6× 80 0.4× 206 1.2× 82 883
Ming-Tzer Lin Taiwan 11 243 0.3× 160 0.5× 139 0.5× 75 0.4× 158 0.9× 62 600
G. Q. Zhang Netherlands 16 533 0.8× 266 0.8× 108 0.4× 85 0.5× 100 0.6× 50 844
K. Yamaguchi Japan 16 521 0.7× 131 0.4× 604 2.1× 81 0.4× 239 1.4× 98 1.2k
M. Ranjbar Singapore 17 214 0.3× 82 0.3× 380 1.3× 144 0.8× 82 0.5× 58 961

Countries citing papers authored by Frank Altmann

Since Specialization
Citations

This map shows the geographic impact of Frank Altmann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frank Altmann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frank Altmann more than expected).

Fields of papers citing papers by Frank Altmann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Frank Altmann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frank Altmann. The network helps show where Frank Altmann may publish in the future.

Co-authorship network of co-authors of Frank Altmann

This figure shows the co-authorship network connecting the top 25 collaborators of Frank Altmann. A scholar is included among the top collaborators of Frank Altmann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Frank Altmann. Frank Altmann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Geens, Karen, et al.. (2025). Doping investigation of structured GaN devices by highly lateral resolved TOF-SIMS. SHILAP Revista de lepidopterología. 10. 100082–100082. 1 indexed citations
2.
Brand, Sebastian, et al.. (2025). Localization enhancement in quantitative thermal lock-in analysis using spatial phase evaluation. Microelectronics Reliability. 168. 115690–115690.
3.
Altmann, Frank, et al.. (2024). On the insignificance of dislocations in reverse bias degradation of lateral GaN-on-Si devices. Journal of Applied Physics. 135(2). 1 indexed citations
4.
5.
Yurchenko, Olena, et al.. (2024). Co3O4-Based Materials as Potential Catalysts for Methane Detection in Catalytic Gas Sensors. Sensors. 24(8). 2599–2599. 8 indexed citations
6.
Amini, Elham, Shahin Tajik, Christian Boit, et al.. (2024). Comparative Study of E-beam and Optical Probing Approaches in Attacking the ICs. Journal of Failure Analysis and Prevention. 24(5). 2184–2193.
7.
Altmann, Frank, et al.. (2023). Test concept for a direct correlation between dislocations and the intrinsic degradation of lateral PIN diodes in GaN-on-Si under reverse bias. Microelectronics Reliability. 150. 115071–115071. 3 indexed citations
8.
Graff, Andreas, Frank Altmann, Fabiana Rampazzo, et al.. (2023). Novel approach of combined planar and cross-sectional defect analysis of stressed normally-on HEMT devices with leaky Schottky gates. Microelectronics Reliability. 150. 115096–115096.
9.
Altmann, Frank, et al.. (2023). SEM Based EBIC, EBAC, and E-Beam Probing Techniques. Proceedings - International Symposium for Testing and Failure Analysis. 84758. e1–e59.
10.
Yurchenko, Olena, et al.. (2023). Accelerated Deactivation of Mesoporous Co3O4-Supported Au–Pd Catalyst through Gas Sensor Operation. Chemosensors. 11(5). 271–271. 6 indexed citations
11.
12.
Graff, Andreas, et al.. (2022). Analysis of Mechanical Strain in AlGaN/GaN HFETs. physica status solidi (a). 220(16). 5 indexed citations
13.
Santi, Carlo De, Shuzhen You, Karen Geens, et al.. (2022). Study and characterization of GaN MOS capacitors: Planar vs trench topographies. Applied Physics Letters. 120(14). 8 indexed citations
14.
Santi, Carlo De, Matteo Borga, Karen Geens, et al.. (2021). Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization. Materials. 14(9). 2316–2316. 28 indexed citations
15.
Meneghini, Matteo, Fabiana Rampazzo, Benoît Lambert, et al.. (2020). On-Wafer Fast Evaluation of Failure Mechanism of 0.25-μm AlGaN/GaN HEMTs: Evidence of Sidewall Indiffusion. IEEE Transactions on Electron Devices. 67(7). 2765–2770. 2 indexed citations
16.
Graff, Andreas, et al.. (2018). Physical failure analysis methods for wide band gap semiconductor devices. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 3B.2–1. 4 indexed citations
17.
Malta, Dean, Christopher W. Gregory, Matthew Lueck, et al.. (2011). Characterization of thermo-mechanical stress and reliability issues for Cu-filled TSVs. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1815–1821. 29 indexed citations
18.
Altmann, Frank, et al.. (2006). TEM-Präparation mittels „low-voltage“-FIB. Practical Metallography. 43(8). 396–405. 3 indexed citations
19.
Altmann, Frank. (2005). TEM-Zielpräparation unter REM-Beobachtung mittels Zweistrahl-FIB. Practical Metallography. 42(4). 206–212. 2 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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