S. Morarka
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- Silicon and Solar Cell Technologies 6
- Thin-Film Transistor Technologies 5
- Semiconductor materials and devices 3
- Advancements in Semiconductor Devices and Circuit Design 2
- Radio Frequency Integrated Circuit Design 2
- Advancements in Photolithography Techniques 1
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- Semiconductor materials and interfaces 1
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- Advanced Surface Polishing Techniques 3
- Co-authors
- Mark E. LawK. S. JonesR. G. EllimanNicholas G. RudawskiSaid RamiQiang YuYu ZhangM Armstrong
- Cited by
- Electrical and Electronic EngineeringAtomic and Molecular Physics, and OpticsCondensed Matter Physics
- Journals
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Journal of Applied Physics (2 papers)JSTS Journal of Semiconductor Technology and Science (1 paper)
- Partner nations
- United StatesAustraliaGreece
In The Last Decade
S. Morarka
8 papers receiving 89 citations
Peers
Comparison fields: 5 of 14
- Electrical and Electronic Engineering 80
- Atomic and Molecular Physics, and Optics 21
- Condensed Matter Physics 7
- Computational Mechanics 10
- Materials Chemistry 21
Countries citing papers authored by S. Morarka
This map shows the geographic impact of S. Morarka's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Morarka with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Morarka more than expected).
Fields of papers citing papers by S. Morarka
This network shows the impact of papers produced by S. Morarka. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Morarka. The network helps show where S. Morarka may publish in the future.
Co-authorship network
The 16 scholars most cited alongside S. Morarka, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 7 | |
| 2 | 2019 | 13 | |
| 3 | 2011 | 2 | |
| 4 | 2010 | 3 | |
| 5 | 2009 | 16 | |
| 6 | 2009 | 34 | |
| 7 | 2008 | 14 | |
| 8 | A 2-D Model for the Potential Distribution and Threshold Voltage of Fully Depleted Short-Channel Ion - Implanted Silicon MESFET's | 2005 | 3 |
About S. Morarka
S. Morarka is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Infectious Diseases, having authored 8 papers that have together received 92 indexed citations. Recurring topics across this work include Silicon and Solar Cell Technologies (6 papers), Thin-Film Transistor Technologies (5 papers), Advanced Surface Polishing Techniques (3 papers), Semiconductor materials and devices (3 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Radio Frequency Integrated Circuit Design (2 papers), Advancements in Photolithography Techniques (1 paper) and Semiconductor materials and interfaces (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (80 citations), Atomic and Molecular Physics, and Optics (21 citations), Condensed Matter Physics (7 citations), Computational Mechanics (10 citations) and Materials Chemistry (21 citations). S. Morarka has collaborated with scholars based in United States, Australia and Greece. Frequent co-authors include Mark E. Law, K. S. Jones, R. G. Elliman, Nicholas G. Rudawski, Said Rami, Qiang Yu, Yu Zhang, M Armstrong, B. Sell and Guannan Liu. Their work appears in journals such as Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal of Applied Physics, JSTS Journal of Semiconductor Technology and Science and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.