A. Haggag

597 total citations
33 papers, 407 citations indexed

About

A. Haggag is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications and Finance. According to data from OpenAlex, A. Haggag has authored 33 papers receiving a total of 407 indexed citations (citations by other indexed papers that have themselves been cited), including 29 papers in Electrical and Electronic Engineering, 2 papers in Computer Networks and Communications and 2 papers in Finance. Recurrent topics in A. Haggag's work include Semiconductor materials and devices (26 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). A. Haggag is often cited by papers focused on Semiconductor materials and devices (26 papers), Advancements in Semiconductor Devices and Circuit Design (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (20 papers). A. Haggag collaborates with scholars based in United States, China and Taiwan. A. Haggag's co-authors include K. Hess, William E. McMahon, Joseph W. Lyding, S. Kalpat, Kangguo Cheng, Gary A. Anderson, David C. Burnett, E. Lyumkis, V. Reddy and J.M. Higman and has published in prestigious journals such as Journal of Applied Physics, IEEE Transactions on Electron Devices and Electrochemical and Solid-State Letters.

In The Last Decade

A. Haggag

30 papers receiving 382 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Haggag United States 11 389 32 29 25 12 33 407
Campbell Millar United Kingdom 14 567 1.5× 26 0.8× 33 1.1× 75 3.0× 6 0.5× 44 600
Rainer Minixhofer Austria 10 302 0.8× 15 0.5× 5 0.2× 26 1.0× 4 0.3× 44 319
Mi-Chang Chang United States 8 301 0.8× 45 1.4× 34 1.2× 22 0.9× 31 2.6× 26 335
A. Juge France 11 458 1.2× 27 0.8× 13 0.4× 22 0.9× 7 0.6× 47 466
K.N. Quader United States 10 369 0.9× 9 0.3× 7 0.2× 47 1.9× 22 1.8× 20 403
B. Kleveland United States 11 460 1.2× 35 1.1× 22 0.8× 47 1.9× 7 0.6× 24 480
Andrew R. Brown United Kingdom 9 284 0.7× 43 1.3× 9 0.3× 13 0.5× 4 0.3× 23 294
Rafael Rios United States 10 426 1.1× 35 1.1× 37 1.3× 9 0.4× 5 0.4× 18 440
Edward J. Nowak United States 7 372 1.0× 35 1.1× 69 2.4× 62 2.5× 9 0.8× 14 406
Haldun Küflüoğlu United States 15 1.4k 3.5× 52 1.6× 43 1.5× 123 4.9× 11 0.9× 23 1.4k

Countries citing papers authored by A. Haggag

Since Specialization
Citations

This map shows the geographic impact of A. Haggag's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Haggag with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Haggag more than expected).

Fields of papers citing papers by A. Haggag

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Haggag. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Haggag. The network helps show where A. Haggag may publish in the future.

Co-authorship network of co-authors of A. Haggag

This figure shows the co-authorship network connecting the top 25 collaborators of A. Haggag. A scholar is included among the top collaborators of A. Haggag based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Haggag. A. Haggag is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Haggag, A., et al.. (2019). Network Optimization for Improved Performance and Speed for SDN and Security Analysis of SDN Vulnerabilities. Journal of Computer Networks and Communications. 7(5). 83–90. 1 indexed citations
2.
Haggag, A., et al.. (2015). Mitigating “No trouble found” component returns. 3C.5.1–3C.5.5. 5 indexed citations
3.
Wang, Xiaoxiao, et al.. (2014). Fast aging degradation rate prediction during production test. 6B.5.1–6B.5.5. 2 indexed citations
4.
Haggag, A., et al.. (2014). Protecting against emerging vmin failures in advanced technology nodes. 1–7. 4 indexed citations
5.
Haggag, A., et al.. (2014). Impact of VLSI scaling on die qualification. 3B.5.1–3B.5.3. 4 indexed citations
6.
Haggag, A., et al.. (2010). Product failures: Power-law or exponential voltage dependence?. 125–128. 1 indexed citations
7.
8.
Trivedi, Vishal, B. Winstead, Luyao Kang, et al.. (2007). High performance, highly reliable FD/SOI I/O MOSFETs in contemporary high-performance PD/SOI CMOS. 83–84.
9.
Schaeffer, J., D. C. Gilmer, S. Samavedam, et al.. (2007). On the positive channel threshold voltage of metal gate electrodes on high-permittivity gate dielectrics. Journal of Applied Physics. 102(7). 13 indexed citations
10.
Haggag, A., et al.. (2006). Novel Model for HCI Degradation and Impact of Conventional and Non-Conventional Scaling. 737–738. 1 indexed citations
11.
Haggag, A., David C. Burnett, G. C. Abeln, et al.. (2006). Realistic Projections of Product Fails from NBTI and TDDB. 541–544. 19 indexed citations
12.
Haggag, A., et al.. (2006). Flash Oxide Scalability Model and Impact of Program/Erase Method. 73–75. 5 indexed citations
13.
Haggag, A., et al.. (2005). Physical model for the power-law voltage and current acceleration of TDDB. Microelectronics Reliability. 45(12). 1855–1860. 15 indexed citations
14.
McMahon, William E., A. Haggag, & K. Hess. (2003). Reliability scaling issues for nanoscale devices. IEEE Transactions on Nanotechnology. 2(1). 33–38. 73 indexed citations
15.
McMahon, William E., A. Haggag, & K. Hess. (2002). Modeling failure modes for submicron devices. 28. 161–164. 1 indexed citations
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17.
18.
Haggag, A., et al.. (2002). Impact of scaling on CMOS IC failure rate and design rules for reliability. 49–50. 2 indexed citations
19.
Hess, K., et al.. (2001). The physics of determining chip reliability. IEEE Circuits and Devices Magazine. 17(3). 33–38. 22 indexed citations
20.
Haggag, A., William E. McMahon, K. Hess, Björn Fischer, & Leonard F. Register. (2001). Impact of Scaling on CMOS Chip Failure Rate,and Design Rules for Hot Carrier Reliability. VLSI design. 13(1-4). 111–115. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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