J.M. Higman

715 citations
35 papers · 387 · h-index 12

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advanced Memory and Neural Computing
    • Silicon Carbide Semiconductor Technologies
    • Low-power high-performance VLSI design

Papers in

J.M. Higman

32 papers receiving 364 citations

Peers

J.M. Higman
Comparison fields: 5 of 27
  • Electrical and Electronic Engineering 356
  • Hardware and Architecture 30
  • Atomic and Molecular Physics, and Optics 100
  • Computer Networks and Communications 22
  • Condensed Matter Physics 10
Replace H. Iizuka with:
H. Iizuka Japan
N. Lindert United States
E. Morifuji Japan
T. Bucelot United States
Thomas A. DeMassa United States
C. Kuo United States
H. DeMan Belgium
M. Togo Japan
S. Ramey United States
J. Cai United States
J.M. Higman relative to H. Iizuka Japan H. Iizuka's profile →
Citations per field
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H. Iizuka · 1×
Citations per year

Countries citing papers authored by J.M. Higman

Since Specialization
Citations

This map shows the geographic impact of J.M. Higman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Higman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Higman more than expected).

Fields of papers citing papers by J.M. Higman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.M. Higman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Higman. The network helps show where J.M. Higman may publish in the future.

Co-authors

The 25 scholars most cited alongside J.M. Higman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.M. Higman Line = papers co-authored together J.M. Higman links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.

#Work
1 198956
2 200750
3 199837
4 199227
5 198722
6 199321
7 199320
8 200619
9 200219
10 198816
11 200315
12 198812
13 198611
14 20208
15 20037
16 20026
17 19896
18 19875
19 20024
20 20204

About J.M. Higman

J.M. Higman is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Computer Networks and Communications, Hardware and Architecture and Surfaces, Coatings and Films, having authored 35 papers that have together received 387 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), Advancements in Semiconductor Devices and Circuit Design (27 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Low-power high-performance VLSI design (5 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Advanced Data Storage Technologies (4 papers), VLSI and Analog Circuit Testing (4 papers) and Silicon Carbide Semiconductor Technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (356 citations), Hardware and Architecture (30 citations), Atomic and Molecular Physics, and Optics (100 citations), Computer Networks and Communications (22 citations) and Condensed Matter Physics (10 citations). J.M. Higman has collaborated with scholars based in United States, Italy and Netherlands. Frequent co-authors include K. Hess, R.W. Dutton, David C. Burnett, Gary A. Anderson, A. Haggag, G. C. Abeln, J. Bude, C.T. Swift, P. Douglas Yoder and M.A. Emanuel. Their work appears in journals such as IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Electron Device Letters, Solid-State Electronics, Journal of Applied Physics and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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