Bin Ming
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications 6
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 13
- Biomaterials top 10%
- Advanced Cellulose Research Studies 2
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- Advancements in Photolithography Techniques 12
- Integrated Circuits and Semiconductor Failure Analysis 6
- Computational Mechanics top 10%
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- Force Microscopy Techniques and Applications 3
- Surface and Thin Film Phenomena 2
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- GaN-based semiconductor devices and materials 2
- Co-authors
- András VládarMichael T. PostekJohn S. VillarrubiaJ. S. ChawlaS. ListR. Joseph KlineDaniel F. SundayJohn A. Dagata
- Journals
- Measurement Science and Technology (3 papers)Ultramicroscopy (1 paper)MRS Internet Journal of Nitride Semiconductor Research (1 paper)
- Partner nations
- United StatesGermanyEgypt
In The Last Decade
Bin Ming
23 papers receiving 418 citations
Peers
Comparison fields: 5 of 63
- Structural Biology 57
- Surfaces, Coatings and Films 158
- Biomaterials 93
- Electrical and Electronic Engineering 226
- Computational Mechanics 70
Countries citing papers authored by Bin Ming
This map shows the geographic impact of Bin Ming's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bin Ming with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bin Ming more than expected).
Fields of papers citing papers by Bin Ming
This network shows the impact of papers produced by Bin Ming. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bin Ming. The network helps show where Bin Ming may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Bin Ming, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2020 | 1 | |
| 2 | 2015 | 83 | |
| 3 | 2015 | 22 | |
| 4 | 2015 | 4 | |
| 5 | 2015 | 11 | |
| 6 | 10 nm Three-Dimensional CD-SEM Metrology | NIST | 2014 | 1 |
| 7 | 2014 | 2 | |
| 8 | 2012 | 1 | |
| 9 | Review of Current Progress in Nanometrology with Helium Ions | NIST | 2011 | 1 |
| 10 | 2011 | 1 | |
| 11 | 2010 | 29 | |
| 12 | 2010 | 78 | |
| 13 | 2009 | 27 | |
| 14 | 2009 | 5 | |
| 15 | 2008 | 36 | |
| 16 | 2008 | 20 | |
| 17 | 2008 | 3 | |
| 18 | 2000 | 4 | |
| 19 | 1999 | 1 | |
| 20 | 1999 | 3 |
About Bin Ming
Bin Ming is a scholar working on Structural Biology, Surfaces, Coatings and Films, Electrical and Electronic Engineering, Internal Medicine and Condensed Matter Physics, having authored 24 papers that have together received 446 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (13 papers), Advancements in Photolithography Techniques (12 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advanced Electron Microscopy Techniques and Applications (6 papers), Force Microscopy Techniques and Applications (3 papers), Advanced Cellulose Research Studies (2 papers), Surface and Thin Film Phenomena (2 papers) and GaN-based semiconductor devices and materials (2 papers). The work is most often cited by research in Structural Biology (57 citations), Surfaces, Coatings and Films (158 citations), Biomaterials (93 citations), Electrical and Electronic Engineering (226 citations) and Computational Mechanics (70 citations). Bin Ming has collaborated with scholars based in United States, Germany and Egypt. Frequent co-authors include András Vládar, Michael T. Postek, John S. Villarrubia, J. S. Chawla, S. List, R. Joseph Kline, Daniel F. Sunday, John A. Dagata, Ronald Sabo and Theodore H. Wegner. Their work appears in journals such as Measurement Science and Technology, Ultramicroscopy, MRS Internet Journal of Nitride Semiconductor Research, Microscopy and Microanalysis and IEEE Transactions on Applied Superconductivity.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.