Klaus Edinger
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Biomedical Engineering top 10%
- Materials Chemistry
- Surfaces, Coatings and Films top 2%
- Co-authors
- M. GrunzeIvo W. RangelowChristof WoellTeodor GotszalkJ. MelngailisJ. OrloffChristophér C. DavisN. Abedinov
- Topics
- Electron and X-Ray Spectroscopy Techniques (24 papers)Integrated Circuits and Semiconductor Failure Analysis (19 papers)Advancements in Photolithography Techniques (18 papers)
- Partner nations
- United StatesGermanyPoland
In The Last Decade
Klaus Edinger
60 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 74
- Electrical and Electronic Engineering 931
- Atomic and Molecular Physics, and Optics 421
- Biomedical Engineering 397
- Materials Chemistry 348
- Surfaces, Coatings and Films 268
Countries citing papers authored by Klaus Edinger
This map shows the geographic impact of Klaus Edinger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Klaus Edinger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Klaus Edinger more than expected).
Fields of papers citing papers by Klaus Edinger
This network shows the impact of papers produced by Klaus Edinger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Klaus Edinger. The network helps show where Klaus Edinger may publish in the future.
Co-authorship network of co-authors of Klaus Edinger
This figure shows the co-authorship network connecting the top 25 collaborators of Klaus Edinger. A scholar is included among the top collaborators of Klaus Edinger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Klaus Edinger. Klaus Edinger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 3 | |
| 3 | 5 | |
| 4 | 4 | |
| 5 | 6 | |
| 6 | 7 | |
| 7 | 4 | |
| 8 | 6 | |
| 9 | 8 | |
| 10 | 1 | |
| 11 | 17 | |
| 12 | 84 | |
| 13 | 0 | |
| 14 | 27 | |
| 15 | 22 | |
| 16 | 1 | |
| 17 | 66 | |
| 18 | 39 | |
| 19 | 11 | |
| 20 | 17 |
About Klaus Edinger
Klaus Edinger is a scholar working on Structural Biology, Surfaces, Coatings and Films and Electrical and Electronic Engineering, having authored 63 papers that have together received 1.3k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (24 papers), Integrated Circuits and Semiconductor Failure Analysis (19 papers) and Advancements in Photolithography Techniques (18 papers). The work is most often cited by research in Structural Biology (157 citations), Surfaces, Coatings and Films (268 citations) and Electrical and Electronic Engineering (931 citations). Klaus Edinger has collaborated with scholars based in United States, Germany and Poland. Frequent co-authors include M. Grunze, Ivo W. Rangelow, Christof Woell, Teodor Gotszalk, J. Melngailis, J. Orloff, Christophér C. Davis, N. Abedinov, P. Grabiec and Armin Gölzhäuser. Their work appears in journals such as Applied Physics Letters, The Journal of Immunology and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.