R. Joseph Kline

15.9k total citations · 7 hit papers
114 papers, 13.9k citations indexed

About

R. Joseph Kline is a scholar working on Electrical and Electronic Engineering, Polymers and Plastics and Materials Chemistry. According to data from OpenAlex, R. Joseph Kline has authored 114 papers receiving a total of 13.9k indexed citations (citations by other indexed papers that have themselves been cited), including 90 papers in Electrical and Electronic Engineering, 54 papers in Polymers and Plastics and 29 papers in Materials Chemistry. Recurrent topics in R. Joseph Kline's work include Organic Electronics and Photovoltaics (71 papers), Conducting polymers and applications (53 papers) and Thin-Film Transistor Technologies (28 papers). R. Joseph Kline is often cited by papers focused on Organic Electronics and Photovoltaics (71 papers), Conducting polymers and applications (53 papers) and Thin-Film Transistor Technologies (28 papers). R. Joseph Kline collaborates with scholars based in United States, United Kingdom and France. R. Joseph Kline's co-authors include Michael F. Toney, Michael D. McGehee, Dean M. DeLongchamp, Martin Heeney, Iain McCulloch, Jean M. J. Fréchet, Lee J. Richter, Ekaterina N. Kadnikova, Michael L. Chabinyc and Daniel A. Fischer and has published in prestigious journals such as Journal of the American Chemical Society, Advanced Materials and Nature Communications.

In The Last Decade

R. Joseph Kline

114 papers receiving 13.7k citations

Hit Papers

Liquid-crystalline semico... 2003 2026 2010 2018 2006 2005 2003 2006 2013 500 1000 1.5k

Author Peers

Peers are selected by citation overlap in the author's most active subfields. citations · hero ref

Author Last Decade Papers Cites
R. Joseph Kline 12.2k 8.8k 2.5k 2.4k 1.2k 114 13.9k
Christopher R. McNeill 14.6k 1.2× 10.5k 1.2× 4.3k 1.7× 2.0k 0.8× 1.1k 0.9× 323 16.4k
Hagen Klauk 15.1k 1.2× 4.9k 0.6× 3.7k 1.5× 5.5k 2.3× 1.2k 1.1× 244 17.7k
Jana Zaumseil 9.3k 0.8× 4.1k 0.5× 4.7k 1.9× 2.7k 1.1× 1.6k 1.4× 166 12.6k
Ananth Dodabalapur 13.4k 1.1× 5.1k 0.6× 4.7k 1.9× 3.6k 1.5× 2.2k 1.8× 267 15.9k
Wolfgang Kowalsky 9.1k 0.7× 3.5k 0.4× 3.9k 1.5× 1.3k 0.5× 1.2k 1.0× 291 10.5k
Stefan C. B. Mannsfeld 15.7k 1.3× 8.6k 1.0× 6.0k 2.4× 6.5k 2.7× 1.4k 1.2× 187 21.0k
Nir Tessler 10.9k 0.9× 4.8k 0.5× 4.5k 1.8× 1.5k 0.6× 1.6k 1.4× 231 12.7k
Thomas N. Jackson 13.7k 1.1× 3.6k 0.4× 5.0k 2.0× 5.2k 2.2× 2.7k 2.4× 308 18.1k
Martijn Kemerink 9.7k 0.8× 6.6k 0.7× 3.4k 1.3× 2.3k 1.0× 1.3k 1.1× 222 11.9k
Aram Amassian 21.4k 1.8× 9.9k 1.1× 13.0k 5.2× 2.3k 1.0× 1.1k 0.9× 242 24.1k

Countries citing papers authored by R. Joseph Kline

Since Specialization
Citations

This map shows the geographic impact of R. Joseph Kline's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Joseph Kline with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Joseph Kline more than expected).

Fields of papers citing papers by R. Joseph Kline

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Joseph Kline. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Joseph Kline. The network helps show where R. Joseph Kline may publish in the future.

Co-authorship network of co-authors of R. Joseph Kline

This figure shows the co-authorship network connecting the top 25 collaborators of R. Joseph Kline. A scholar is included among the top collaborators of R. Joseph Kline based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R. Joseph Kline. R. Joseph Kline is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Zhu, Weigang, Guoping Li, S. Mukherjee, et al.. (2023). Quantitative relationships between film morphology, charge carrier dynamics, and photovoltaic performance in bulk-heterojunction binary vs. ternary acceptor blends. Energy & Environmental Science. 16(3). 1234–1250. 13 indexed citations
2.
Sunday, Daniel F., Jacob L. Thelen, Chun Zhou, et al.. (2021). Buried Structure in Block Copolymer Films Revealed by Soft X-ray Reflectivity. ACS Nano. 15(6). 9577–9587. 4 indexed citations
3.
Gann, Eliot, Thomas Crofts, Glenn Holland, et al.. (2021). A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II. Journal of Physics Condensed Matter. 33(16). 164001–164001. 15 indexed citations
4.
Sunday, Daniel F., Moshe Dolejsi, Alice B. Chang, et al.. (2020). Confinement and Processing Can Alter the Morphology and Periodicity of Bottlebrush Block Copolymers in Thin Films. ACS Nano. 14(12). 17476–17486. 25 indexed citations
5.
Sunday, Daniel F., Xuanxuan Chen, T. R. Albrecht, et al.. (2020). Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography. Chemistry of Materials. 32(6). 2399–2407. 19 indexed citations
6.
Liu, Philip L.‐F., Michael J. Maher, Christopher M. Bates, et al.. (2020). Spatial Control of the Self-assembled Block Copolymer Domain Orientation and Alignment on Photopatterned Surfaces. ACS Applied Materials & Interfaces. 12(20). 23399–23409. 7 indexed citations
7.
Thelen, Jacob L., Camille Bishop, Kushal Bagchi, et al.. (2020). Molecular Orientation Depth Profiles in Organic Glasses Using Polarized Resonant Soft X-ray Reflectivity. Chemistry of Materials. 32(15). 6295–6309. 13 indexed citations
8.
Jin, Hyeong Min, Xiao Li, James A. Dolan, et al.. (2020). Soft crystal martensites: An in situ resonant soft x-ray scattering study of a liquid crystal martensitic transformation. Science Advances. 6(13). eaay5986–eaay5986. 34 indexed citations
9.
Sunday, Daniel F., et al.. (2019). X-ray characterization of contact holes for block copolymer lithography. Journal of Applied Crystallography. 52(1). 106–114. 7 indexed citations
10.
Rech, Jeromy James, Yuanxiang Feng, Carr Hoi Yi Ho, et al.. (2018). Panchromatic All‐Polymer Photodetector with Tunable Polarization Sensitivity. Advanced Optical Materials. 7(4). 44 indexed citations
11.
Hannon, Adam F., Daniel F. Sunday, Gurdaman Khaira, et al.. (2018). Optimizing self-consistent field theory block copolymer models with X-ray metrology. Molecular Systems Design & Engineering. 3(2). 376–389. 14 indexed citations
12.
Khaira, Gurdaman, Manolis Doxastakis, Jiaxing Ren, et al.. (2017). Derivation of Multiple Covarying Material and Process Parameters Using Physics-Based Modeling of X-ray Data. Macromolecules. 50(19). 7783–7793. 29 indexed citations
13.
Sunday, Daniel F., Michael J. Maher, Adam F. Hannon, et al.. (2017). Characterizing the Interface Scaling of High χ Block Copolymers near the Order–Disorder Transition. Macromolecules. 51(1). 173–180. 36 indexed citations
14.
Sunday, Daniel F., Jiaxing Ren, Christopher D. Liman, et al.. (2017). Characterizing Patterned Block Copolymer Thin Films with Soft X-rays. ACS Applied Materials & Interfaces. 9(37). 31325–31334. 16 indexed citations
15.
Sunday, Daniel F., et al.. (2015). Template–polymer commensurability and directed self‐assembly block copolymer lithography. Journal of Polymer Science Part B Polymer Physics. 53(8). 595–603. 29 indexed citations
16.
Villarrubia, John S., András Vládar, Bin Ming, et al.. (2015). Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library. Ultramicroscopy. 154. 15–28. 83 indexed citations
17.
Cho, Eunkyung, Chad Risko, Dongwook Kim, et al.. (2014). The Three-dimensional Packing Structure and Electronic Properties of Biaxially-oriented Poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophene) Films. Journal of the American Chemical Society. 1 indexed citations
18.
Vládar, András, John S. Villarrubia, Bin Ming, et al.. (2014). 10 nm Three-Dimensional CD-SEM Metrology | NIST. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1 indexed citations
19.
Krumrey, Michael, et al.. (2014). Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating. Journal of Applied Crystallography. 47(6). 1912–1920. 11 indexed citations
20.
Gundlach, David J., James E. Royer, S. Subramanian, et al.. (2008). Contact-induced crystallinity for high-performance soluble acene-based transistors and circuits. Nature Materials. 7(3). 216–221. 400 indexed citations breakdown →

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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