Michael T. Postek
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications 32
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques 135
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- Surface and Thin Film Phenomena 36
- Force Microscopy Techniques and Applications 15
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- Advancements in Photolithography Techniques 105
- Integrated Circuits and Semiconductor Failure Analysis 28
- Biomedical Engineering top 5%
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- Surface Roughness and Optical Measurements 14
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- Non-Destructive Testing Techniques 9
- Co-authors
- András VládarJohn A. DagataC. J. EvansIrving A. MendelssohnH. H. HararyJ. BennettJ. SchneirJohn S. Villarrubia
- Journals
- Microscopy and Microanalysis (9 papers)Journal of Research of the National Institute of Standards and Technology (6 papers)Journal of Phycology (4 papers)
- Partner nations
- United StatesHungaryJapan
In The Last Decade
Michael T. Postek
187 papers receiving 2.8k citations
Hit Papers
Peers
Comparison fields: 5 of 143
- Structural Biology 343
- Surfaces, Coatings and Films 955
- Atomic and Molecular Physics, and Optics 966
- Electrical and Electronic Engineering 1.3k
- Biomedical Engineering 759
Countries citing papers authored by Michael T. Postek
This map shows the geographic impact of Michael T. Postek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael T. Postek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael T. Postek more than expected).
Fields of papers citing papers by Michael T. Postek
This network shows the impact of papers produced by Michael T. Postek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael T. Postek. The network helps show where Michael T. Postek may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Michael T. Postek, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2021 | 13 | |
| 2 | 10 nm Three-Dimensional CD-SEM Metrology | NIST | 2014 | 1 |
| 3 | 2012 | 81 | |
| 4 | Review of Current Progress in Nanometrology with Helium Ions | NIST | 2011 | 1 |
| 5 | 2011 | 17 | |
| 6 | Real-Time Image Composition with Correction of Drift Distortion | 2009 | 2 |
| 7 | 2008 | 22 | |
| 8 | Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology | NIST | 2007 | 1 |
| 9 | 2005 | 1 | |
| 10 | A Simulation Study of Repeatability and Bias in the CD-SEM | NIST | 2003 | 4 |
| 11 | 2002 | 13 | |
| 12 | 2001 | 11 | |
| 13 | 2000 | 2 | |
| 14 | Simulation and Measurement of Subsurface Features in Scanning Electron Microscopy Metrology | NIST | 1998 | 1 |
| 15 | Electron Beam Interaction Modeling as Applied to X-Ray Lithography Mask SEM Linewidth Metrology | NIST | 1994 | 1 |
| 16 | 1993 | 23 | |
| 17 | Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard | 1989 | 11 |
| 18 | Scanning Electron Microscope-based Metrological Electron Microscope System and New Prototype Scanning Electron Microscope Magnification Standard | 1989 | 16 |
| 19 | Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part II | 1986 | 3 |
| 20 | 1982 | 3 |
About Michael T. Postek
Michael T. Postek is a scholar working on Structural Biology, Surfaces, Coatings and Films, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomaterials, having authored 196 papers that have together received 2.9k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (135 papers), Advancements in Photolithography Techniques (105 papers), Surface and Thin Film Phenomena (36 papers), Advanced Electron Microscopy Techniques and Applications (32 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Force Microscopy Techniques and Applications (15 papers), Surface Roughness and Optical Measurements (14 papers) and Non-Destructive Testing Techniques (9 papers). The work is most often cited by research in Structural Biology (343 citations), Surfaces, Coatings and Films (955 citations), Atomic and Molecular Physics, and Optics (966 citations), Electrical and Electronic Engineering (1.3k citations) and Biomedical Engineering (759 citations). Michael T. Postek has collaborated with scholars based in United States, Hungary and Japan. Frequent co-authors include András Vládar, John A. Dagata, C. J. Evans, Irving A. Mendelssohn, H. H. Harary, J. Bennett, J. Schneir, John S. Villarrubia, Bin Ming and Samuel N. Jones. Their work appears in journals such as Microscopy and Microanalysis, Journal of Research of the National Institute of Standards and Technology, Journal of Phycology, Measurement Science and Technology and American Journal of Botany.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.