Michael T. Postek

4.1k total citations · 1 hit paper
196 papers, 2.9k citations indexed

About

Michael T. Postek is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Michael T. Postek has authored 196 papers receiving a total of 2.9k indexed citations (citations by other indexed papers that have themselves been cited), including 135 papers in Surfaces, Coatings and Films, 117 papers in Electrical and Electronic Engineering and 47 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Michael T. Postek's work include Electron and X-Ray Spectroscopy Techniques (135 papers), Advancements in Photolithography Techniques (105 papers) and Surface and Thin Film Phenomena (36 papers). Michael T. Postek is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (135 papers), Advancements in Photolithography Techniques (105 papers) and Surface and Thin Film Phenomena (36 papers). Michael T. Postek collaborates with scholars based in United States, Hungary and Japan. Michael T. Postek's co-authors include András Vládar, John A. Dagata, C. J. Evans, Irving A. Mendelssohn, H. H. Harary, J. Bennett, J. Schneir, John S. Villarrubia, Bin Ming and Samuel N. Jones and has published in prestigious journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Michael T. Postek

187 papers receiving 2.8k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air

1990 570 citations Michael T. Postek et al. profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Michael T. Postek United States	28	1.3k	966	955	759	409	196	2.9k
András Vládar United States	28	1.3k 1.0×	475 0.5×	977 1.0×	612 0.8×	406 1.0×	149	2.5k
Kristian Mølhave Denmark	35	1.0k 0.8×	854 0.9×	269 0.3×	981 1.3×	1.3k 3.2×	122	3.5k
Quan Sun China	33	803 0.6×	725 0.8×	168 0.2×	1.4k 1.8×	637 1.6×	93	3.4k
John Henry J. Scott United States	16	728 0.6×	207 0.2×	841 0.9×	511 0.7×	905 2.2×	47	2.8k
Ludwig Reimer Germany	18	1.1k 0.8×	545 0.6×	1.3k 1.3×	405 0.5×	764 1.9×	43	2.9k
Keith A. Brown United States	39	893 0.7×	661 0.7×	239 0.3×	1.7k 2.2×	1.5k 3.6×	154	4.7k
John C. Hermanson United States	29	516 0.4×	1.8k 1.8×	595 0.6×	212 0.3×	665 1.6×	98	3.2k
Yifang Chen China	25	1.1k 0.8×	647 0.7×	379 0.4×	1.5k 2.0×	546 1.3×	188	2.9k
C.R.M. Grovenor United Kingdom	44	1.7k 1.3×	434 0.4×	127 0.1×	1.0k 1.4×	2.8k 6.7×	266	6.4k
Kai Zhang China	32	1.3k 1.0×	209 0.2×	96 0.1×	668 0.9×	1.1k 2.8×	245	4.3k

Countries citing papers authored by Michael T. Postek

Since Specialization

Citations

This map shows the geographic impact of Michael T. Postek's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael T. Postek with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael T. Postek more than expected).

Fields of papers citing papers by Michael T. Postek

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael T. Postek. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael T. Postek. The network helps show where Michael T. Postek may publish in the future.

Co-authorship network of co-authors of Michael T. Postek

This figure shows the co-authorship network connecting the top 25 collaborators of Michael T. Postek. A scholar is included among the top collaborators of Michael T. Postek based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael T. Postek. Michael T. Postek is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Poster, Dianne L., Carl C. Miller, Richard A. Martinello, et al.. (2021). Ultraviolet Radiation Technologies and Healthcare Associated Infections: Standards and Metrology Needs. Journal of Research of the National Institute of Standards and Technology. 126. 126014–126014. 13 indexed citations

Vládar, András, John S. Villarrubia, Bin Ming, et al.. (2014). 10 nm Three-Dimensional CD-SEM Metrology | NIST. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1 indexed citations

Stefaniak, Aleksandr B., Vincent A. Hackley, Gert Roebben, et al.. (2012). Nanoscale reference materials for environmental, health and safety measurements: needs, gaps and opportunities. Nanotoxicology. 7(8). 1325–1337. 81 indexed citations

Postek, Michael T., András Vládar, Bin Ming, & Charles N. Archie. (2011). Review of Current Progress in Nanometrology with Helium Ions | NIST. Measurement Science and Technology. 22. 1 indexed citations

Postek, Michael T. & András Vládar. (2011). Modeling for accurate dimensional scanning electron microscope metrology: then and now. Scanning. 33(3). 111–125. 17 indexed citations

Čižmár, Petr, András Vládar, & Michael T. Postek. (2009). Real-Time Image Composition with Correction of Drift Distortion. arXiv (Cornell University). 2 indexed citations

Vládar, András, K.P. Purushotham, & Michael T. Postek. (2008). Contamination specification for dimensional metrology SEMs. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6922. 692217–692217. 22 indexed citations

Postek, Michael T., et al.. (2007). Helium Ion Microscopy: A New Technique for Semiconductor Metrology and Nanotechnology | NIST. 1 indexed citations

Vládar, András, et al.. (2005). Nano-tip Electron Gun for the Scanning Electron Microscope. Microscopy and Microanalysis. 11(S02). 1 indexed citations

10.

Villarrubia, John S., András Vládar, & Michael T. Postek. (2003). A Simulation Study of Repeatability and Bias in the CD-SEM | NIST. 4(3). 4 indexed citations

11.

Postek, Michael T., et al.. (2002). Two‐dimensional simulation and modeling in scanning electron microscope imaging and metrology research. Scanning. 24(4). 179–185. 13 indexed citations

12.

Postek, Michael T., et al.. (2001). Application of the low‐loss scanning electron microscope image to integrated circuit technology. Part 1– applications to accurate dimension measurements. Scanning. 23(5). 298–304. 11 indexed citations

13.

Allgair, John A., et al.. (2000). <title>Benchmarking of advanced CD-SEMs against the new unified specification for sub-0.18-um lithography</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3998. 12–27. 2 indexed citations

14.

Lowney, Jeremiah R., Michael T. Postek, Samuel N. Jones, S. C. Mayo, & Michael W. Cresswell. (1998). Simulation and Measurement of Subsurface Features in Scanning Electron Microscopy Metrology | NIST. Scanning. 1 indexed citations

15.

Postek, Michael T., et al.. (1994). Electron Beam Interaction Modeling as Applied to X-Ray Lithography Mask SEM Linewidth Metrology | NIST. Scanning. 16. 1 indexed citations

16.

Postek, Michael T., et al.. (1993). Interalaboratory study on the lithographically produced scanning electron microscope magnification standard prototype. Journal of Research of the National Institute of Standards and Technology. 98(4). 447–447. 23 indexed citations

17.

Postek, Michael T.. (1989). Scanning Electron Microscope-Based Metrological Electron Microscope System and New Prototype SEM Magnification Standard. Scanning microscopy. 3(4). 11 indexed citations

18.

Postek, Michael T.. (1989). Scanning Electron Microscope-based Metrological Electron Microscope System and New Prototype Scanning Electron Microscope Magnification Standard. Scanning microscopy. 3(4). 10. 16 indexed citations

19.

Postek, Michael T. & David C. Joy. (1986). Microelectronics Dimensional Metrology in the Scanning Electron Microscope, Part II. Solid State Technology. 12. 3 indexed citations

20.

Gryczyński, Zygmunt, et al.. (1982). Detonation behavior of suspension-type explosives with various textures. Combustion Explosion and Shock Waves. 18(3). 363–366. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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