J. Orloff
Impact in
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 18
- Advancements in Photolithography Techniques 10
- Photonic and Optical Devices 6
-
- Ion-surface interactions and analysis 16
- Laser Material Processing Techniques 5
- Co-authors
- L. W. Swanson (10 shared papers)J. Melngailis (10 shared papers)Klaus Edinger (8 shared papers)Mikano Sato (3 shared papers)S. K. Guharay (8 shared papers)Richard K. DeFreez (10 shared papers)Richard A. Elliott (10 shared papers)Jabez J. McClelland (3 shared papers)
- Journals
- Applied Physics Letters (4 papers)Electronics Letters (3 papers)Journal of Applied Physics (2 papers)Ultramicroscopy (2 papers)IEEE Photonics Technology Letters (1 paper)
- Partner nations
- United StatesJapanGermany
In The Last Decade
J. Orloff
49 papers receiving 574 citations
Peers
Comparison fields: 5 of 47
- Structural Biology 109
- Surfaces, Coatings and Films 200
- Computational Mechanics 271
- Electrical and Electronic Engineering 417
- Atomic and Molecular Physics, and Optics 140
Countries citing papers authored by J. Orloff
This map shows the geographic impact of J. Orloff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Orloff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Orloff more than expected).
Fields of papers citing papers by J. Orloff
This network shows the impact of papers produced by J. Orloff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Orloff. The network helps show where J. Orloff may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Orloff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 52 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1979 | 56 | |
| 2 | 1975 | 51 | |
| 3 | 1997 | 46 | |
| 4 | 2011 | 32 | |
| 5 | 1986 | 28 | |
| 6 | 1998 | 26 | |
| 7 | 1979 | 23 | |
| 8 | 1999 | 21 | |
| 9 | 1987 | 20 | |
| 10 | 1979 | 19 | |
| 11 | 1991 | 19 | |
| 12 | 1991 | 19 | |
| 13 | 1978 | 18 | |
| 14 | 2010 | 18 | |
| 15 | 1981 | 17 | |
| 16 | 1988 | 15 | |
| 17 | 1989 | 14 | |
| 18 | 1992 | 13 | |
| 19 | 2005 | 13 | |
| 20 | 1998 | 12 |
About J. Orloff
J. Orloff is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Surfaces, Coatings and Films, Biomedical Engineering and Atomic and Molecular Physics, and Optics, having authored 52 papers that have together received 630 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), Electron and X-Ray Spectroscopy Techniques (16 papers), Ion-surface interactions and analysis (16 papers), Advancements in Photolithography Techniques (10 papers), Metal and Thin Film Mechanics (7 papers), Photonic and Optical Devices (6 papers), Advanced Materials Characterization Techniques (6 papers) and Laser Material Processing Techniques (5 papers). The work is most often cited by research in Structural Biology (109 citations), Surfaces, Coatings and Films (200 citations), Computational Mechanics (271 citations), Electrical and Electronic Engineering (417 citations) and Atomic and Molecular Physics, and Optics (140 citations). J. Orloff has collaborated with scholars based in United States, Japan and Germany. Frequent co-authors include L. W. Swanson, J. Melngailis, Klaus Edinger, Mikano Sato, S. K. Guharay, Richard K. DeFreez, Richard A. Elliott, Jabez J. McClelland, A. Steele and B. Knuffman. Their work appears in journals such as Applied Physics Letters, Electronics Letters, Journal of Applied Physics, Ultramicroscopy and IEEE Photonics Technology Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.