J. Orloff

948 total citations
52 papers, 629 citations indexed

About

J. Orloff is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Surfaces, Coatings and Films. According to data from OpenAlex, J. Orloff has authored 52 papers receiving a total of 629 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Electrical and Electronic Engineering, 22 papers in Computational Mechanics and 17 papers in Surfaces, Coatings and Films. Recurrent topics in J. Orloff's work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), Ion-surface interactions and analysis (16 papers) and Electron and X-Ray Spectroscopy Techniques (16 papers). J. Orloff is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (18 papers), Ion-surface interactions and analysis (16 papers) and Electron and X-Ray Spectroscopy Techniques (16 papers). J. Orloff collaborates with scholars based in United States, Japan and Germany. J. Orloff's co-authors include L. W. Swanson, J. Melngailis, Klaus Edinger, Mikano Sato, S. K. Guharay, Richard A. Elliott, Richard K. DeFreez, A. Steele, Jabez J. McClelland and B. Knuffman and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

J. Orloff

49 papers receiving 572 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Orloff United States 16 416 271 200 140 139 52 629
R. L. Seliger United States 12 484 1.2× 370 1.4× 147 0.7× 72 0.5× 160 1.2× 23 664
R. L. Kubena United States 16 771 1.9× 403 1.5× 162 0.8× 316 2.3× 362 2.6× 63 967
Hisao Hashimoto Japan 17 545 1.3× 242 0.9× 123 0.6× 313 2.2× 90 0.6× 47 657
F. Le Pimpec Switzerland 13 370 0.9× 59 0.2× 131 0.7× 222 1.6× 118 0.8× 39 553
M. M. El Gomati United Kingdom 15 335 0.8× 84 0.3× 571 2.9× 244 1.7× 56 0.4× 47 723
P. J. McMarr United States 18 962 2.3× 209 0.8× 99 0.5× 400 2.9× 306 2.2× 65 1.3k
Kenzo Akita Japan 18 876 2.1× 99 0.4× 168 0.8× 667 4.8× 145 1.0× 70 1.0k
M. Taneya Japan 16 526 1.3× 75 0.3× 140 0.7× 292 2.1× 107 0.8× 50 703
Katsumi Ura Japan 16 464 1.1× 27 0.1× 428 2.1× 162 1.2× 103 0.7× 87 706
B.E. Newnam United States 12 361 0.9× 95 0.4× 38 0.2× 233 1.7× 86 0.6× 36 544

Countries citing papers authored by J. Orloff

Since Specialization
Citations

This map shows the geographic impact of J. Orloff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Orloff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Orloff more than expected).

Fields of papers citing papers by J. Orloff

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Orloff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Orloff. The network helps show where J. Orloff may publish in the future.

Co-authorship network of co-authors of J. Orloff

This figure shows the co-authorship network connecting the top 25 collaborators of J. Orloff. A scholar is included among the top collaborators of J. Orloff based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Orloff. J. Orloff is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Steele, A., B. Knuffman, Jabez J. McClelland, & J. Orloff. (2010). Focused chromium ion beam. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 28(6). C6F1–C6F5. 18 indexed citations
2.
Guharay, S. K., J. Orloff, & M. Wada. (2005). Ion beams and their applications in high-resolution probe formation. IEEE Transactions on Plasma Science. 33(6). 1911–1930. 13 indexed citations
3.
Pai, S. P., Bin Ming, Dae Joon Kang, et al.. (1999). Fabrication of HTS Josephson junctions on substrates prepared by focused ion beam system. IEEE Transactions on Applied Superconductivity. 9(2). 2894–2897. 1 indexed citations
4.
Guharay, S. K., et al.. (1999). Characteristics of ion beams from a Penning source for focused ion beam applications. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 17(6). 2779–2782. 21 indexed citations
5.
Didenko, L., S. K. Guharay, J. Orloff, & J. Melngailis. (1999). Coulomb interactions in a focused ion beam column and design guidelines for an experimental system: comparison of results from MONTEC and BOERSCH. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 427(1-2). 121–125. 4 indexed citations
6.
Guharay, S. K., et al.. (1998). Characteristics of focused beam spots using negative ion beams from a compact surface plasma source and merits for new applications. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(6). 3370–3373. 7 indexed citations
7.
Pai, S. P., C. J. Lobb, T. Venkatesan, et al.. (1998). Fabrication of high-temperature superconducting Josephson junctions on substrates patterned by focused ion beam. Applied Physics Letters. 73(12). 1730–1732. 7 indexed citations
8.
Guharay, S. K., et al.. (1996). High-brightness ion source for ion projection lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 3907–3910. 11 indexed citations
9.
Guharay, S. K., et al.. (1995). Study of H− beams for ion-projection lithography. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2597–2599. 2 indexed citations
10.
Orloff, J., et al.. (1991). Experimental study of a focused ion beam probe size and comparison with theory. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(5). 2609–2612. 19 indexed citations
11.
DeFreez, Richard K., David Bossert, John Hunt, et al.. (1990). Spectral locking in an extended area two-dimensional coherent grating surface emitting laser array. IEEE Photonics Technology Letters. 2(1). 6–8. 8 indexed citations
12.
Bossert, David, Richard K. DeFreez, Richard A. Elliott, et al.. (1990). Grating-surface-emitting lasers in a ring configuration. Applied Physics Letters. 56(21). 2068–2070. 9 indexed citations
13.
DeFreez, Richard K., et al.. (1989). Focused-Ion-Beam Micromachined Diode Laser Mirrors. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1043. 25–25. 4 indexed citations
14.
Munro, Eric, et al.. (1988). High-resolution, low-energy beams by means of mirror optics. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 6(6). 1971–1976. 15 indexed citations
15.
DeFreez, Richard K., et al.. (1987). 300 mW operation of a surface-emitting phase-locked array of diode lasers. Electronics Letters. 23(3). 130–131. 7 indexed citations
16.
DeFreez, Richard K., et al.. (1986). CW operation of widely and continuously tunable micromachined-coupled-cavity diode lasers. Electronics Letters. 22(17). 919–921. 6 indexed citations
17.
Orloff, J.. (1984). A Comparison of Lanthanum Hexaboride, Cold FIeld Emission and Thermal Field Emission Electron Guns for Low Voltage Scanning Electron Microscopy. Digital Commons - USU (Utah State University). 3(1). 15. 1 indexed citations
18.
Orloff, J., et al.. (1981). An improved method for numerical analysis of point electron and ion source optics. Journal of Vacuum Science and Technology. 19(4). 1077–1081. 17 indexed citations
19.
Orloff, J. & L. W. Swanson. (1979). Angular intensity of a gas-phase field ionization source. Journal of Applied Physics. 50(9). 6026–6027. 19 indexed citations
20.
Orloff, J. & L. W. Swanson. (1979). An asymmetric electrostatic lens for field-emission microprobe applications. Journal of Applied Physics. 50(4). 2494–2501. 56 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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