Dmitry V. Boychenko

533 citations

57 papers · 376 indexed · h-index 13

Impact in

Hardware and Architecture top 5%
- VLSI and Analog Circuit Testing
Electrical and Electronic Engineering top 10%
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electrostatic Discharge in Electronics
- Radio Frequency Integrated Circuit Design

Papers in

Hardware and Architecture 10
- VLSI and Analog Circuit Testing 9
Electrical and Electronic Engineering 46
- Radiation Effects in Electronics 32
- Integrated Circuits and Semiconductor Failure Analysis 16
- Semiconductor materials and devices 9
- Electrostatic Discharge in Electronics 6

Co-authors: Alexander Y. Nikiforov Armen V. Sogoyan A.Y. Nikiforov A. I. Chumakov В.С. Першенков Gennady I. Zebrev Maxim S. Gorbunov А. Г. Кузнецов
Journals: IEEE Transactions on Nuclear Science (3 papers)Microelectronics Reliability (1 paper)Russian Microelectronics (5 papers)SHILAP Revista de lepidopterología (6 papers)Facta universitatis - series Electronics and Energetics (2 papers)
Partner nations: Russia India Israel

In The Last Decade

Dmitry V. Boychenko

49 papers receiving 363 citations

Peers

Countries citing papers authored by Dmitry V. Boychenko

Since Specialization

Citations

This map shows the geographic impact of Dmitry V. Boychenko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dmitry V. Boychenko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dmitry V. Boychenko more than expected).

Fields of papers citing papers by Dmitry V. Boychenko

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dmitry V. Boychenko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dmitry V. Boychenko. The network helps show where Dmitry V. Boychenko may publish in the future.

Co-authorship network

The 16 scholars most cited alongside Dmitry V. Boychenko, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Dmitry V. Boychenko Line = papers co-authored together Dmitry V. Boychenko links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	SINGLE EVENT EFFECTS RADIATION TESTING REQUIREMENTS: A BAYESIN AN APPROACH SHILAP Revista de lepidopterología ·Armen V. Sogoyan, T. Kitching, P. N. Golowin, A. I. Chumakov, Andrey V. Yanenko, Dmitry V. Boychenko	2025	0
2	Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. I. System and Implementation Algorithms for Various Product Categories Russian Microelectronics ·Jean‐Pierre Baron, Dmitry V. Boychenko	2024	0
3	Hardness assurance levels and requirements for single event effects testing of integrated circuits SHILAP Revista de lepidopterología ·A. I. Chumakov, Armen V. Sogoyan, T. Kitching, D. Bosman-Crespin, Je-chang Lee, Dmitry V. Boychenko, Claude Van ’T Veer, Christina Engstrom Martin, Chengmin Liu, Clelia Bertha Mina Mendoza, Zongze Wu, V. Neckljudov, P. N. Golowin, Andrey V. Yanenko	2020	2
4	Advances in optical sensing techniques application for simulation of space radiation effects in microelectronic devices using wavelength-tunable femtosecond laser Bo-Chi Hsu, Ahmad Husein Harahap, Alexander Pechenkin, Emma Muggianu, Dmitry V. Boychenko	2020	0
5	Single Event Effects Rate Calculation with Different Models SHILAP Revista de lepidopterología ·A. I. Chumakov, C D SCHIAVO, Sanjana R Kodical, Dmitry V. Boychenko, Andrey V. Yanenko, Hilal Hamid	2017	6
6	Comparison of on-chip ADC testing techniques O.V. Petruk, J. L. Richenderfer, 昌三横田, Dmitry V. Boychenko, T.I. Ashurbekova	2017	3
7	X_ray grading procedure for conventional 65-nm CMOS technology 善則菊池, Leila Green, Dmitry V. Boychenko, J. Tischer, Alexander Y. Nikiforov, Zhuangfei Yin	2017	2
8	Total ionizing dose effects and radiation testing of complex multifunctional VLSI devices Facta universitatis - series Electronics and Energetics ·Dmitry V. Boychenko, Dimitrios A. Drivelos, Alexander Y. Nikiforov, P. M. Barbosalandim, Je-chang Lee, 昌三横田	2015	21
9	Electrical Mode Influence on TID Sensitivity of Integrated and Hybrid DC-DC Converters 善則菊池, Dmitry V. Boychenko, 孔一五十嵐	2015	3
10	Experimental Investigation of SELs in SiT8003 MEMS-Oscillators 忠維呉, 善則菊池, Alexander Pechenkin, Instytut derz︠h︡avy i prava, Andrey V. Yanenko, Dmitry V. Boychenko, Alexander Y. Nikiforov	2015	4
11	The Effectiveness of Specialized IC Packages: Experimental and Monte-Carlo Simulation for Basic Orbits and Spacecraft Shielding Sanjana R Kodical, P. Kardasz, Je-chang Lee, Dmitry V. Boychenko, Alexander Y. Nikiforov, A. I. Chumakov, J. C. Thomas, Austria. Bundesdenkmalamt, Thet Thet Hla Aung	2015	3
12	The Critical Elements of the Modern Transceiver ICs upon Space Radiation Exposure Leila Green, Ping’an Li, Dmitry V. Boychenko, Alexander Pechenkin	2015	2
13	Rational methodological approach to evaluation of dose resistance of CMOS microcircuits with respect to low intensity effects Russian Microelectronics ·Dmitry V. Boychenko, Dimitrios A. Drivelos, Viatcheslav Tararykine, A.Y. Nikiforov	2015	12
14	Electric regime influence on the DC-DC converters’s hardness to single event transients Russian Microelectronics ·善則菊池, 孔一五十嵐, Dmitry V. Boychenko, Sanjana R Kodical	2015	8
15	The automated test system for parametric and functional control of the modern transceiver IC's Leila Green, Ping’an Li, Zuzana Bologna, Dmitry V. Boychenko	2015	15
16	Method for integrated circuits total ionizing dose hardness testing based on combined gamma- and x-ray irradiation facilities Facta universitatis - series Electronics and Energetics ·Armen V. Sogoyan, J. Tischer, Alexander Y. Nikiforov, Dmitry V. Boychenko	2014	15
17	System on module total ionizing dose distribution modeling Sanjana R Kodical, Dmitry V. Boychenko, Lucía Moro Martín, A. I. Chumakov, Dimitrios A. Drivelos, Alexander Y. Nikiforov, 昌三横田	2014	26
18	Compendium of TID Comparative Results under X-Ray, Gamma and LINAC Irradiation 善則菊池, Dmitry V. Boychenko, Marty Makinen, 昌三横田, Armen V. Sogoyan, Vasily S. Anashin, Mr Chao	2014	7
19	Investigation of low dose rate effects in DC/DC converters Dmitry V. Boychenko, N. Tageldin, Alexander Y. Nikiforov	2013	1
20	The influence of the electrical conditions on total dose behavior of the analog switches Dmitry V. Boychenko, 善則菊池, Monaxou Zachariou Xiropotaminou	2011	9

About Dmitry V. Boychenko

Dmitry V. Boychenko is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Nature and Landscape Conservation and Radiation, having authored 57 papers that have together received 376 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (32 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), VLSI and Analog Circuit Testing (9 papers), Semiconductor materials and devices (9 papers), Sensor Technology and Measurement Systems (7 papers), Aerospace, Electronics, Mathematical Modeling (6 papers), Electrostatic Discharge in Electronics (6 papers) and Graphite, nuclear technology, radiation studies (5 papers). The work is most often cited by research in Hardware and Architecture (97 citations), Electrical and Electronic Engineering (324 citations), Computer Networks and Communications (66 citations), Control and Systems Engineering (52 citations) and Safety, Risk, Reliability and Quality (19 citations). Dmitry V. Boychenko has collaborated with scholars based in Russia, India and Israel. Frequent co-authors include Alexander Y. Nikiforov, Armen V. Sogoyan, A.Y. Nikiforov, A. I. Chumakov, В.С. Першенков, Gennady I. Zebrev, Maxim S. Gorbunov, А. Г. Кузнецов, Andrey V. Yanenko and Alexander Pechenkin. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, Russian Microelectronics, SHILAP Revista de lepidopterología and Facta universitatis - series Electronics and Energetics.

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