A.Y. Nikiforov

511 total citations
48 papers, 386 citations indexed

About

A.Y. Nikiforov is a scholar working on Electrical and Electronic Engineering, Computational Mechanics and Instrumentation. According to data from OpenAlex, A.Y. Nikiforov has authored 48 papers receiving a total of 386 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Electrical and Electronic Engineering, 8 papers in Computational Mechanics and 4 papers in Instrumentation. Recurrent topics in A.Y. Nikiforov's work include Integrated Circuits and Semiconductor Failure Analysis (22 papers), Radiation Effects in Electronics (20 papers) and Semiconductor materials and devices (16 papers). A.Y. Nikiforov is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (22 papers), Radiation Effects in Electronics (20 papers) and Semiconductor materials and devices (16 papers). A.Y. Nikiforov collaborates with scholars based in Russia, India and Slovakia. A.Y. Nikiforov's co-authors include A. I. Chumakov, В.С. Першенков, Armen V. Sogoyan, Dmitry V. Boychenko, V.V. Belyakov, Gennady I. Zebrev, Andrey V. Yanenko, В. П. Иванов, V. Levin and A. V. Shelyakov and has published in prestigious journals such as SHILAP Revista de lepidopterología, IEEE Transactions on Nuclear Science and Microelectronics Reliability.

In The Last Decade

A.Y. Nikiforov

40 papers receiving 325 citations

Peers

A.Y. Nikiforov
C. Chatry France
Edward P. Wilcox United States
K. Lilja United States
Jianyong Xie United States
Pascale Gouker United States
Cong Ma China
A.Y. Nikiforov
Citations per year, relative to A.Y. Nikiforov A.Y. Nikiforov (= 1×) peers Armen V. Sogoyan

Countries citing papers authored by A.Y. Nikiforov

Since Specialization
Citations

This map shows the geographic impact of A.Y. Nikiforov's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.Y. Nikiforov with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.Y. Nikiforov more than expected).

Fields of papers citing papers by A.Y. Nikiforov

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.Y. Nikiforov. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.Y. Nikiforov. The network helps show where A.Y. Nikiforov may publish in the future.

Co-authorship network of co-authors of A.Y. Nikiforov

This figure shows the co-authorship network connecting the top 25 collaborators of A.Y. Nikiforov. A scholar is included among the top collaborators of A.Y. Nikiforov based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.Y. Nikiforov. A.Y. Nikiforov is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Nikiforov, A.Y., et al.. (2022). Congenital chloride diarrhea. Experimental and Clinical Gastroenterology. 192–196.
4.
Nikiforov, A.Y., et al.. (2015). Radiation Behavior and Test Specifics of A-D and D-A Converters. 45(2). 153–159. 7 indexed citations
5.
Boychenko, Dmitry V., et al.. (2015). Rational methodological approach to evaluation of dose resistance of CMOS microcircuits with respect to low intensity effects. Russian Microelectronics. 44(1). 1–7. 12 indexed citations
6.
Першенков, В.С., et al.. (2009). The conversion model of low dose rate effect in bipolar transistors. 290–297. 20 indexed citations
7.
Nikiforov, A.Y., et al.. (2008). Simulating the response of SOS CMOS building blocks to pulsed ionizing irradiation. Russian Microelectronics. 37(1). 25–40. 9 indexed citations
9.
10.
Nikiforov, A.Y. & Armen V. Sogoyan. (2004). Modeling of High-Dose-Rate Pulsed Radiation Effects in the Parasitic MOS Structures of CMOS LSI Circuits. Russian Microelectronics. 33(2). 80–91. 2 indexed citations
11.
Nikiforov, A.Y., et al.. (2003). Influence of Temperature on Pulsed Laser SEE Testing. ESA Special Publication. 536. 153–155. 4 indexed citations
12.
Belyakov, V.V., В.С. Першенков, Gennady I. Zebrev, et al.. (2003). Methods for the Prediction of Total-Dose Effects on Modern Integrated Semiconductor Devices in Space: A Review. Russian Microelectronics. 32(1). 25–39. 19 indexed citations
13.
Belyakov, V.V., et al.. (2003). Prediction of Local and Global Ionization Effects on ICs: The Synergy between Numerical and Physical Simulation. Russian Microelectronics. 32(2). 105–118. 9 indexed citations
14.
Nikiforov, A.Y., et al.. (2002). Radiation hard bulk CMOS ROM dose rate upset: detailed analysis technique and results. 44–47. 1 indexed citations
16.
Nikiforov, A.Y., et al.. (2002). Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers. Russian Microelectronics. 31(6). 375–383. 4 indexed citations
17.
Nikiforov, A.Y., et al.. (2000). Influence of temperature on dose rate laser simulation adequacy. IEEE Transactions on Nuclear Science. 47(6). 2442–2446. 2 indexed citations
18.
Belyakov, V.V., et al.. (2000). IC’s radiation effects modeling and estimation. Microelectronics Reliability. 40(12). 1997–2018. 17 indexed citations
19.
Maltsev, P. P., et al.. (1998). Radiation effects in ultraviolet sensors based on natural diamond. IEEE Transactions on Nuclear Science. 45(6). 2805–2807. 1 indexed citations
20.
Першенков, В.С., et al.. (1995). Effect of electron traps on reversibility of annealing. IEEE Transactions on Nuclear Science. 42(6). 1750–1757. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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