Andrey V. Yanenko

436 total citations
38 papers, 346 citations indexed

About

Andrey V. Yanenko is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Materials Chemistry. According to data from OpenAlex, Andrey V. Yanenko has authored 38 papers receiving a total of 346 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Electrical and Electronic Engineering, 13 papers in Hardware and Architecture and 6 papers in Materials Chemistry. Recurrent topics in Andrey V. Yanenko's work include Radiation Effects in Electronics (30 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers) and VLSI and Analog Circuit Testing (11 papers). Andrey V. Yanenko is often cited by papers focused on Radiation Effects in Electronics (30 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers) and VLSI and Analog Circuit Testing (11 papers). Andrey V. Yanenko collaborates with scholars based in Russia, India and Israel. Andrey V. Yanenko's co-authors include A. I. Chumakov, Alexander Pechenkin, A.Y. Nikiforov, Armen V. Sogoyan, В. С. Баранов, Vasily S. Anashin, Maxim S. Gorbunov, Gennady I. Zebrev, Dmitry V. Boychenko and Alexander Y. Nikiforov and has published in prestigious journals such as SHILAP Revista de lepidopterología, IEEE Transactions on Nuclear Science and Radiation Measurements.

In The Last Decade

Andrey V. Yanenko

33 papers receiving 321 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Andrey V. Yanenko Russia 12 311 95 57 39 38 38 346
Armen V. Sogoyan Russia 12 343 1.1× 73 0.8× 15 0.3× 29 0.7× 21 0.6× 52 376
A.Y. Nikiforov Russia 13 359 1.2× 65 0.7× 30 0.5× 23 0.6× 15 0.4× 48 386
Fernando Aguirre Brazil 10 239 0.8× 148 1.6× 29 0.5× 34 0.9× 50 1.3× 20 317
Edward P. Wilcox United States 13 461 1.5× 52 0.5× 23 0.4× 23 0.6× 26 0.7× 60 485
T.L. Turflinger United States 18 1.1k 3.7× 427 4.5× 24 0.4× 34 0.9× 68 1.8× 35 1.2k
J.L. Titus United States 24 1.5k 4.7× 170 1.8× 44 0.8× 38 1.0× 48 1.3× 53 1.5k
H. Puchner United States 15 591 1.9× 218 2.3× 12 0.2× 33 0.8× 30 0.8× 53 614
Megan C. Casey United States 14 588 1.9× 180 1.9× 19 0.3× 19 0.5× 21 0.6× 60 606
C. Chatry France 10 284 0.9× 58 0.6× 12 0.2× 8 0.2× 24 0.6× 20 314
Pascale Gouker United States 12 622 2.0× 220 2.3× 12 0.2× 22 0.6× 21 0.6× 38 648

Countries citing papers authored by Andrey V. Yanenko

Since Specialization
Citations

This map shows the geographic impact of Andrey V. Yanenko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andrey V. Yanenko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andrey V. Yanenko more than expected).

Fields of papers citing papers by Andrey V. Yanenko

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Andrey V. Yanenko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andrey V. Yanenko. The network helps show where Andrey V. Yanenko may publish in the future.

Co-authorship network of co-authors of Andrey V. Yanenko

This figure shows the co-authorship network connecting the top 25 collaborators of Andrey V. Yanenko. A scholar is included among the top collaborators of Andrey V. Yanenko based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Andrey V. Yanenko. Andrey V. Yanenko is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Sogoyan, Armen V., et al.. (2025). SINGLE EVENT EFFECTS RADIATION TESTING REQUIREMENTS: A BAYESIN AN APPROACH. SHILAP Revista de lepidopterología. 32(1). 30–45.
2.
Chumakov, A. I., Armen V. Sogoyan, & Andrey V. Yanenko. (2022). Limitations of Methods for Evaluating the Hardness of Microelectronic Devices to Single Event Effects on Ion Accelerators. Russian Microelectronics. 51(1). 16–23.
3.
Chumakov, A. I., et al.. (2020). Hardness assurance levels and requirements for single event effects testing of integrated circuits. SHILAP Revista de lepidopterología. 27(1). 83–97. 2 indexed citations
5.
Chumakov, A. I., et al.. (2017). Single Event Effects Rate Calculation with Different Models. SHILAP Revista de lepidopterología. 73–84. 6 indexed citations
6.
Yanenko, Andrey V., et al.. (2016). NI Based System for Seu Testing of Memory Chips for Avionics. SHILAP Revista de lepidopterología. 79. 1028–1028. 4 indexed citations
7.
Pechenkin, Alexander, et al.. (2016). Influence of FRAM operational mode on its SEE susceptibility. 1–4. 4 indexed citations
8.
Chumakov, A. I., et al.. (2016). A method for registration of multiple cell upsets in high capacity memory cells induced by single nuclear particles. Russian Microelectronics. 45(4). 292–297. 6 indexed citations
9.
Pechenkin, Alexander, et al.. (2015). Experimental Investigation of SELs in SiT8003 MEMS-Oscillators. 1–4. 4 indexed citations
10.
Yanenko, Andrey V., et al.. (2013). Proton accelerator with adjustable energy for ICs radiation test. 1–3. 8 indexed citations
11.
Gorbunov, Maxim S., et al.. (2013). Fault-Tolerant SOI Microprocessor for Space Applications. IEEE Transactions on Nuclear Science. 60(4). 2762–2767. 9 indexed citations
12.
Chumakov, A. I., et al.. (2013). Study of SEL and SEU in SRAM using different laser techniques. 22 indexed citations
13.
Gorbunov, Maxim S., Gennady I. Zebrev, Vasily S. Anashin, et al.. (2012). Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods. IEEE Transactions on Nuclear Science. 59(4). 1130–1135. 17 indexed citations
14.
Chumakov, A. I., et al.. (2012). Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination. Russian Microelectronics. 41(4). 221–225. 16 indexed citations
15.
Chumakov, A. I., et al.. (2011). Local laser irradiation technique for SEE testing of ICs. 449–453. 37 indexed citations
16.
Бетелин, В. Б., et al.. (2009). Prospects for using submicron CMOS VLSI in fault-tolerant equipment operating under exposure to atmospheric neutrons. Russian Microelectronics. 38(1). 43–47. 9 indexed citations
17.
Chumakov, A. I., et al.. (2004). Evaluation of Moderately Focused Laser Irradiation as a Method for Simulating Single-Event Effects. Russian Microelectronics. 33(2). 106–110. 13 indexed citations
18.
Chumakov, A. I., et al.. (1999). IC space radiation effects experimental simulation and estimation methods. Radiation Measurements. 30(5). 547–552. 16 indexed citations
19.
Chumakov, A. I., et al.. (1998). Laser technique of single event latchup threshold estimation. 471–475. 2 indexed citations
20.
Chumakov, A. I., et al.. (1997). Single event latchup threshold estimation based on laser dose rate test results. IEEE Transactions on Nuclear Science. 44(6). 2034–2039. 26 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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