T.W. Williams
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
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- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- VLSI and FPGA Design Techniques
- Electrostatic Discharge in Electronics
- Radiation Effects in Electronics
- Semiconductor materials and devices
Papers in
-
- VLSI and Analog Circuit Testing 7
-
- Integrated Circuits and Semiconductor Failure Analysis 6
- Low-power high-performance VLSI design 2
- Advancements in Semiconductor Devices and Circuit Design 2
- VLSI and FPGA Design Techniques 1
- Co-authors
- R. KapurR.H. DennardM.R. MercerMonica R. MalyDon MacMillenRaúl CamposanoDwight D. HillWilfried Daehn
- Journals
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (1 paper)IEEE Transactions on Power Delivery (1 paper)Journal of Lightwave Technology (1 paper)International Test Conference (4 papers)
- Partner nations
- United StatesSwitzerlandFrance
In The Last Decade
T.W. Williams
15 papers receiving 315 citations
Peers
Comparison fields: 5 of 37
- Hardware and Architecture 260
- Electrical and Electronic Engineering 294
- Software 6
- Industrial and Manufacturing Engineering 11
- Control and Systems Engineering 25
Countries citing papers authored by T.W. Williams
This map shows the geographic impact of T.W. Williams's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.W. Williams with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.W. Williams more than expected).
Fields of papers citing papers by T.W. Williams
This network shows the impact of papers produced by T.W. Williams. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.W. Williams. The network helps show where T.W. Williams may publish in the future.
Co-authors
The 21 scholars most cited alongside T.W. Williams, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2022 | 4 | |
| 2 | 2002 | 104 | |
| 3 | 2002 | 24 | |
| 4 | 2002 | 43 | |
| 5 | 2002 | 2 | |
| 6 | 2002 | 14 | |
| 7 | 2002 | 1 | |
| 8 | 2000 | 58 | |
| 9 | The Most Powerful Computers Available. | 1999 | 1 |
| 10 | 1999 | 1 | |
| 11 | 1988 | 1 | |
| 12 | TRIM : Testability Range by Ignoring the Memory. | 1986 | 3 |
| 13 | 1986 | 47 | |
| 14 | Sufficient testing in a self-testing environment | 1984 | 5 |
| 15 | A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. | 1982 | 28 |
About T.W. Williams
T.W. Williams is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Industrial and Manufacturing Engineering and Geophysics, having authored 15 papers that have together received 336 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Low-power high-performance VLSI design (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Engineering and Test Systems (2 papers), Force Microscopy Techniques and Applications (1 paper), VLSI and FPGA Design Techniques (1 paper) and Advanced Measurement and Metrology Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (260 citations), Electrical and Electronic Engineering (294 citations), Software (6 citations), Industrial and Manufacturing Engineering (11 citations) and Control and Systems Engineering (25 citations). T.W. Williams has collaborated with scholars based in United States, Switzerland and France. Frequent co-authors include R. Kapur, R.H. Dennard, M.R. Mercer, Monica R. Maly, Don MacMillen, Raúl Camposano, Dwight D. Hill, Wilfried Daehn, H. Grabinski and Prabhakar Goel. Their work appears in journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Power Delivery, Journal of Lightwave Technology and International Test Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.