D.K. Bhavsar
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- VLSI and FPGA Design Techniques
- Semiconductor materials and devices
- Low-power high-performance VLSI design
Papers in
-
- VLSI and Analog Circuit Testing 21
-
- Integrated Circuits and Semiconductor Failure Analysis 18
- VLSI and FPGA Design Techniques 2
- Electrostatic Discharge in Electronics 2
- Co-authors
- Balakrishnan Krishnamurthy (1 shared paper)J.H. Edmondson (2 shared papers)Richard Davies (3 shared papers)M.K. Gowan (1 shared paper)J. Grodstein (1 shared paper)Chan Dai Truyen Thai (1 shared paper)R.W. Vook (1 shared paper)William J. Bowhill (1 shared paper)
- Journals
- IEEE Transactions on Components Hybrids and Manufacturing Technology (1 paper)International Test Conference (1 paper)IEEE Design & Test of Computers (4 papers)Design Automation Conference (1 paper)
- Partner nations
- United StatesGermanyIndia
In The Last Decade
D.K. Bhavsar
23 papers receiving 254 citations
Peers
Comparison fields: 5 of 26
- Hardware and Architecture 252
- Electrical and Electronic Engineering 243
- Software 11
- Computer Networks and Communications 47
- Control and Systems Engineering 43
Countries citing papers authored by D.K. Bhavsar
This map shows the geographic impact of D.K. Bhavsar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.K. Bhavsar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.K. Bhavsar more than expected).
Fields of papers citing papers by D.K. Bhavsar
This network shows the impact of papers produced by D.K. Bhavsar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.K. Bhavsar. The network helps show where D.K. Bhavsar may publish in the future.
Co-authors
The 12 scholars most cited alongside D.K. Bhavsar, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 89 | |
| 2 | Can we eliminate fault escape in self testing by polynomial division (signature analysis) | 1984 | 38 |
| 3 | Self-Testing by Polynomial Division. | 1981 | 30 |
| 4 | 2002 | 20 | |
| 5 | 1997 | 14 | |
| 6 | 2002 | 12 | |
| 7 | 1981 | 11 | |
| 8 | 1991 | 10 | |
| 9 | 2004 | 8 | |
| 10 | 2003 | 8 | |
| 11 | 2005 | 7 | |
| 12 | 1980 | 7 | |
| 13 | 1986 | 6 | |
| 14 | 1983 | 5 | |
| 15 | 2003 | 5 | |
| 16 | 2005 | 5 | |
| 17 | 2000 | 4 | |
| 18 | 2004 | 3 | |
| 19 | 2002 | 2 | |
| 20 | 2011 | 2 |
About D.K. Bhavsar
D.K. Bhavsar is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Artificial Intelligence and Media Technology, having authored 24 papers that have together received 292 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Engineering and Test Systems (13 papers), VLSI and FPGA Design Techniques (2 papers), Experimental Learning in Engineering (2 papers), Electrostatic Discharge in Electronics (2 papers), Electrical Contact Performance and Analysis (1 paper) and Metal and Thin Film Mechanics (1 paper). The work is most often cited by research in Hardware and Architecture (252 citations), Electrical and Electronic Engineering (243 citations), Software (11 citations), Computer Networks and Communications (47 citations) and Control and Systems Engineering (43 citations). D.K. Bhavsar has collaborated with scholars based in United States, Germany and India. Frequent co-authors include Balakrishnan Krishnamurthy, J.H. Edmondson, Richard Davies, M.K. Gowan, J. Grodstein, Chan Dai Truyen Thai, R.W. Vook, William J. Bowhill, Nancy H. Phillips and Jackson Ho. Their work appears in journals such as IEEE Transactions on Components Hybrids and Manufacturing Technology, International Test Conference, IEEE Design & Test of Computers and Design Automation Conference.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.