D.K. Bhavsar

435 total citations
24 papers, 292 citations indexed

About

D.K. Bhavsar is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, D.K. Bhavsar has authored 24 papers receiving a total of 292 indexed citations (citations by other indexed papers that have themselves been cited), including 22 papers in Hardware and Architecture, 19 papers in Electrical and Electronic Engineering and 13 papers in Control and Systems Engineering. Recurrent topics in D.K. Bhavsar's work include VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers) and Engineering and Test Systems (13 papers). D.K. Bhavsar is often cited by papers focused on VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers) and Engineering and Test Systems (13 papers). D.K. Bhavsar collaborates with scholars based in United States, Germany and India. D.K. Bhavsar's co-authors include Balakrishnan Krishnamurthy, J.H. Edmondson, Richard Davies, M.K. Gowan, J. Grodstein, William J. Bowhill, R.W. Vook, Thomas R. Shiple, Chan Dai Truyen Thai and Jackson Ho and has published in prestigious journals such as IEEE Transactions on Components Hybrids and Manufacturing Technology, IEEE Design & Test of Computers and Design Automation Conference.

In The Last Decade

D.K. Bhavsar

23 papers receiving 254 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
D.K. Bhavsar United States 9 252 243 47 43 11 24 292
A.S.M. Hassan Canada 5 309 1.2× 320 1.3× 28 0.6× 40 0.9× 6 0.5× 6 340
T.W. Williams United States 7 260 1.0× 294 1.2× 22 0.5× 25 0.6× 9 0.8× 15 336
K.D. Wagner United States 8 233 0.9× 220 0.9× 20 0.4× 36 0.8× 15 1.4× 12 260
Kazumi Hatayama Japan 11 261 1.0× 290 1.2× 21 0.4× 16 0.4× 8 0.7× 52 332
M.H. Tehranipour United States 8 265 1.1× 268 1.1× 48 1.0× 42 1.0× 4 0.4× 13 302
Samy Makar United States 10 310 1.2× 343 1.4× 62 1.3× 25 0.6× 12 1.1× 16 380
Sreejit Chakravarty United States 13 485 1.9× 507 2.1× 19 0.4× 55 1.3× 7 0.6× 57 538
S. Shoukourian Switzerland 10 289 1.1× 298 1.2× 58 1.2× 23 0.5× 4 0.4× 32 350
D.B. Lavo United States 9 306 1.2× 304 1.3× 96 2.0× 64 1.5× 4 0.4× 10 397
W.H. McAnney United States 10 477 1.9× 459 1.9× 14 0.3× 93 2.2× 13 1.2× 17 497

Countries citing papers authored by D.K. Bhavsar

Since Specialization
Citations

This map shows the geographic impact of D.K. Bhavsar's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.K. Bhavsar with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.K. Bhavsar more than expected).

Fields of papers citing papers by D.K. Bhavsar

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.K. Bhavsar. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.K. Bhavsar. The network helps show where D.K. Bhavsar may publish in the future.

Co-authorship network of co-authors of D.K. Bhavsar

This figure shows the co-authorship network connecting the top 25 collaborators of D.K. Bhavsar. A scholar is included among the top collaborators of D.K. Bhavsar based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D.K. Bhavsar. D.K. Bhavsar is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
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Bhavsar, D.K.. (2005). A Built-in Self-Test Method for Write-only Content Addressable Memories. 9–14. 7 indexed citations
3.
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Bhavsar, D.K., et al.. (2004). Testability features of the alpha 21364 microprocessor. 1. 764–772. 3 indexed citations
5.
Grodstein, J., et al.. (2004). Automatic generation of critical-path tests for a partial-scan microprocessor. 180–186. 8 indexed citations
6.
Bhavsar, D.K. & Richard Davies. (2003). Scan Islands - a scan partitioning architecture and its implementation on the Alpha 21364 processor. 16–21. 8 indexed citations
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Bhavsar, D.K., et al.. (2002). Observability register architecture for efficient production test and debug of VLSI circuits. 1997. 385–390. 2 indexed citations
9.
Bhavsar, D.K., et al.. (2002). Testability access of the high speed test features in the Alpha 21264 microprocessor. 487–495. 12 indexed citations
10.
Bhavsar, D.K., et al.. (2002). A highly testable and diagnosable fabrication process test chip. 853–861. 2 indexed citations
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Bhavsar, D.K.. (2000). Synchronizing the IEEE 1149.1 test access port for chip level testability. IEEE Design & Test of Computers. 17(2). 94–99. 4 indexed citations
14.
Bhavsar, D.K. & J.H. Edmondson. (1997). Alpha 21164 testability strategy. IEEE Design & Test of Computers. 14(1). 25–33. 14 indexed citations
15.
Bhavsar, D.K.. (1991). Testing interconnections to static RAMs. IEEE Design & Test of Computers. 8(2). 63–71. 10 indexed citations
16.
Bhavsar, D.K.. (1986). A New Economical Implementation for Scannable Flip-Flops in MOS. IEEE Design & Test of Computers. 3(3). 52–56. 6 indexed citations
17.
Bhavsar, D.K. & Balakrishnan Krishnamurthy. (1984). Can we eliminate fault escape in self testing by polynomial division (signature analysis). 134–139. 38 indexed citations
18.
Bhavsar, D.K.. (1983). Design for Test Calculus: An Algorithm for DFT Rules Checking. Design Automation Conference. 300–307. 5 indexed citations
19.
Bhavsar, D.K., et al.. (1981). Self-Testing by Polynomial Division.. International Test Conference. 208–216. 30 indexed citations
20.
Vook, R.W., et al.. (1980). Elemental Surface Composition of Slip Ring Copper as a Function of Temperature. IEEE Transactions on Components Hybrids and Manufacturing Technology. 3(1). 9–12. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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