Wilfried Daehn
- Hardware and Architecture top 2%
- Electrical and Electronic Engineering
- Artificial Intelligence
- Control and Systems Engineering
- Computational Theory and Mathematics top 10%
- Topics
- VLSI and Analog Circuit Testing (19 papers)Integrated Circuits and Semiconductor Failure Analysis (12 papers)VLSI and FPGA Design Techniques (4 papers)
- Journals
- IEEE Transactions on ComputersIBM Journal of Research and DevelopmentIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Partner nations
- GermanyUnited StatesCanada
In The Last Decade
Wilfried Daehn
18 papers receiving 347 citations
Peers
Comparison fields: 5 of 22
- Hardware and Architecture 320
- Electrical and Electronic Engineering 294
- Artificial Intelligence 45
- Control and Systems Engineering 44
- Computational Theory and Mathematics 37
Countries citing papers authored by Wilfried Daehn
This map shows the geographic impact of Wilfried Daehn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Daehn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Daehn more than expected).
Fields of papers citing papers by Wilfried Daehn
This network shows the impact of papers produced by Wilfried Daehn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Daehn. The network helps show where Wilfried Daehn may publish in the future.
Co-authorship network of co-authors of Wilfried Daehn
This figure shows the co-authorship network connecting the top 25 collaborators of Wilfried Daehn. A scholar is included among the top collaborators of Wilfried Daehn based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wilfried Daehn. Wilfried Daehn is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 9 | |
| 5 | 7 | |
| 6 | 1 | |
| 7 | 2 | |
| 8 | 10 | |
| 9 | 1 | |
| 10 | 7 | |
| 11 | 4 | |
| 12 | 32 | |
| 13 | 83 | |
| 14 | 69 | |
| 15 | A Test Generator IC for Testing Large CMOS-RAMs. | 10 |
| 16 | 2 | |
| 17 | 47 | |
| 18 | 5 | |
| 19 | Hardware Test Pattern Generation for Built-In Testing. | 52 |
| 20 | 7 |
About Wilfried Daehn
Wilfried Daehn is a scholar working on Hardware and Architecture, Software and Electrical and Electronic Engineering, having authored 23 papers that have together received 364 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and VLSI and FPGA Design Techniques (4 papers). The work is most often cited by research in Hardware and Architecture (320 citations), Electrical and Electronic Engineering (294 citations) and Software (12 citations). Wilfried Daehn has collaborated with scholars based in Germany, United States and Canada. Frequent co-authors include T.W. Williams, T.W. Williams, K.D. Wagner, V.K. Agarwal and A. Ivanov. Their work appears in journals such as IEEE Transactions on Computers, IBM Journal of Research and Development and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.