Wilfried Daehn

542 total citations
23 papers, 364 citations indexed

About

Wilfried Daehn is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Molecular Biology. According to data from OpenAlex, Wilfried Daehn has authored 23 papers receiving a total of 364 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Hardware and Architecture, 19 papers in Electrical and Electronic Engineering and 4 papers in Molecular Biology. Recurrent topics in Wilfried Daehn's work include VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and VLSI and FPGA Design Techniques (4 papers). Wilfried Daehn is often cited by papers focused on VLSI and Analog Circuit Testing (19 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and VLSI and FPGA Design Techniques (4 papers). Wilfried Daehn collaborates with scholars based in Germany, United States and Canada. Wilfried Daehn's co-authors include T.W. Williams, T.W. Williams, K.D. Wagner, A. Ivanov and V.K. Agarwal and has published in prestigious journals such as IEEE Transactions on Computers, IBM Journal of Research and Development and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

In The Last Decade

Wilfried Daehn

18 papers receiving 347 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Wilfried Daehn Germany 9 320 294 45 44 37 23 364
Slawomir Pilarski Canada 12 317 1.0× 298 1.0× 20 0.4× 19 0.4× 34 0.9× 29 364
M. Damiani Italy 10 313 1.0× 332 1.1× 44 1.0× 9 0.2× 77 2.1× 30 428
Steffen Tarnick Germany 8 567 1.8× 551 1.9× 23 0.5× 91 2.1× 19 0.5× 19 586
K. Bartlett United States 6 345 1.1× 332 1.1× 31 0.7× 9 0.2× 141 3.8× 7 421
V. Boppana United States 11 280 0.9× 268 0.9× 15 0.3× 31 0.7× 53 1.4× 22 326
V.V. Saposhnikov Germany 7 102 0.3× 141 0.5× 71 1.6× 26 0.6× 9 0.2× 11 216
Petr Fišer Czechia 10 176 0.6× 178 0.6× 100 2.2× 13 0.3× 104 2.8× 51 300
T.M. Niermann United States 9 806 2.5× 765 2.6× 16 0.4× 93 2.1× 34 0.9× 9 839
A. Saldanha United States 11 390 1.2× 349 1.2× 25 0.6× 15 0.3× 122 3.3× 23 453
Shih-Chieh Chang Taiwan 9 213 0.7× 191 0.6× 79 1.8× 3 0.1× 32 0.9× 30 300

Countries citing papers authored by Wilfried Daehn

Since Specialization
Citations

This map shows the geographic impact of Wilfried Daehn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Daehn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Daehn more than expected).

Fields of papers citing papers by Wilfried Daehn

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wilfried Daehn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Daehn. The network helps show where Wilfried Daehn may publish in the future.

Co-authorship network of co-authors of Wilfried Daehn

This figure shows the co-authorship network connecting the top 25 collaborators of Wilfried Daehn. A scholar is included among the top collaborators of Wilfried Daehn based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wilfried Daehn. Wilfried Daehn is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
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Daehn, Wilfried. (2003). A switching criterion for hybrid ATPG. 87. 26–32.
4.
Williams, T.W. & Wilfried Daehn. (2003). Aliasing errors in multiple input signature analysis registers. 338–345. 9 indexed citations
5.
Daehn, Wilfried, et al.. (2002). Accelerated test pattern generation by cone-oriented circuit partitioning. 418–421. 7 indexed citations
6.
Daehn, Wilfried, et al.. (1995). Fault modeling of differential ECL. European Design Automation Conference. 190–195. 2 indexed citations
7.
Daehn, Wilfried. (1991). Fault simulation using small fault samples. Journal of Electronic Testing. 2(2). 191–203. 10 indexed citations
8.
Daehn, Wilfried. (1991). Load balancing in a hybrid ATPG environment. IEEE Transactions on Computers. 40(7). 878–882. 1 indexed citations
9.
Ivanov, A., et al.. (1991). Iterative algorithms for computing aliasing probabilities. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 10(2). 260–265. 7 indexed citations
10.
Daehn, Wilfried, et al.. (1990). Accelerated test pattern generation by cone-oriented circuit partitioning. European Design Automation Conference. 418–421. 4 indexed citations
11.
Daehn, Wilfried, T.W. Williams, & K.D. Wagner. (1990). Aliasing errors in linear automata used as multiple-input signature analyzers. IBM Journal of Research and Development. 34(2.3). 363–380. 32 indexed citations
12.
Williams, T.W., et al.. (1988). Bounds and analysis of aliasing errors in linear feedback shift registers. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 7(1). 75–83. 83 indexed citations
13.
Williams, T.W., et al.. (1987). Aliasing Errors in Signature in Analysis Registers. IEEE Design & Test of Computers. 4(2). 39–45. 69 indexed citations
14.
Williams, T.W., et al.. (1986). Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials.. International Test Conference. 20(6). 282–289. 47 indexed citations
15.
Daehn, Wilfried. (1986). A Unified Treatment of PLA Faults by Boolean Differences. Design Automation Conference. 334–338. 2 indexed citations
16.
Daehn, Wilfried, et al.. (1986). A Test Generator IC for Testing Large CMOS-RAMs.. International Test Conference. 18–24. 10 indexed citations
17.
Daehn, Wilfried, et al.. (1986). Self-Test in a Standard Cell Environment. IEEE Design & Test of Computers. 3(6). 35–41. 5 indexed citations
18.
Daehn, Wilfried. (1986). A unified treatment of PLA faults by Boolean differences. 334–338.
19.
Daehn, Wilfried, et al.. (1981). Hardware Test Pattern Generation for Built-In Testing.. International Test Conference. 110–120. 52 indexed citations
20.
Daehn, Wilfried, et al.. (1981). A hardware approach to self-testing of large programmable logic arrays. IEEE Transactions on Circuits and Systems. 28(11). 1033–1037. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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