N. Nagi

875 total citations
22 papers, 569 citations indexed

About

N. Nagi is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, N. Nagi has authored 22 papers receiving a total of 569 indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Hardware and Architecture, 21 papers in Electrical and Electronic Engineering and 3 papers in Biomedical Engineering. Recurrent topics in N. Nagi's work include VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Low-power high-performance VLSI design (9 papers). N. Nagi is often cited by papers focused on VLSI and Analog Circuit Testing (21 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers) and Low-power high-performance VLSI design (9 papers). N. Nagi collaborates with scholars based in United States. N. Nagi's co-authors include Jacob A. Abraham, Abhijit Chatterjee, Stephen Sunter, P.N. Variyam, A. Chatterjee and Hong Zheng and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Computer Standards & Interfaces and Analog Integrated Circuits and Signal Processing.

In The Last Decade

N. Nagi

20 papers receiving 527 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
N. Nagi United States	14	532	519	115	56	25	22	569
P.N. Variyam United States	9	397 0.7×	373 0.7×	42 0.4×	53 0.9×	12 0.5×	16	440
Yiorgos Tsiatouhas Greece	11	603 1.1×	323 0.6×	85 0.7×	15 0.3×	26 1.0×	113	631
H. Hashempour United States	12	392 0.7×	278 0.5×	50 0.4×	28 0.5×	15 0.6×	32	412
Eric Felt United States	10	385 0.7×	288 0.6×	48 0.4×	20 0.4×	12 0.5×	15	423
R. Raina United States	13	391 0.7×	389 0.7×	19 0.2×	58 1.0×	5 0.2×	29	445
Mariane Comte France	9	273 0.5×	235 0.5×	35 0.3×	12 0.2×	30 1.2×	48	324
Aseem Agarwal United States	11	797 1.5×	618 1.2×	47 0.4×	8 0.1×	46 1.8×	13	828
Soner Yaldiz United States	12	303 0.6×	152 0.3×	60 0.5×	19 0.3×	9 0.4×	28	369
R. Rajsuman United States	12	513 1.0×	513 1.0×	22 0.2×	78 1.4×	80 3.2×	47	624
Mango C.-T. Chao Taiwan	14	454 0.9×	335 0.6×	20 0.2×	26 0.5×	38 1.5×	78	515

Countries citing papers authored by N. Nagi

Since Specialization

Citations

This map shows the geographic impact of N. Nagi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Nagi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Nagi more than expected).

Fields of papers citing papers by N. Nagi

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Nagi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Nagi. The network helps show where N. Nagi may publish in the future.

Co-authorship network of co-authors of N. Nagi

This figure shows the co-authorship network connecting the top 25 collaborators of N. Nagi. A scholar is included among the top collaborators of N. Nagi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with N. Nagi. N. Nagi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Sunter, Stephen & N. Nagi. (2003). Test metrics for analog parametric faults. 226–234. 62 indexed citations

2.

Nagi, N. & Jacob A. Abraham. (2003). Hierarchical fault modeling for analog and mixed-signal circuits. 96–101. 27 indexed citations

3.

Sunter, Stephen & N. Nagi. (2002). A simplified polynomial-fitting algorithm for DAC and ADC BIST. 389–395. 107 indexed citations

4.

Variyam, P.N., et al.. (2002). Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. 261–266. 11 indexed citations

5.

Nagi, N., Abhijit Chatterjee, & Jacob A. Abraham. (2002). A signature analyzer for analog and mixed-signal circuits. 284–287. 30 indexed citations

6.

Nagi, N. & Jacob A. Abraham. (2002). Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits. 142–142. 2 indexed citations

7.

Chatterjee, Abhijit & N. Nagi. (2002). Design for testability and built-in self-test of mixed-signal circuits: a tutorial. 388–392. 17 indexed citations

8.

Nagi, N., Abhijit Chatterjee, & Jacob A. Abraham. (2002). MIXER: Mixed-signal fault simulator. 568–571. 4 indexed citations

9.

Nagi, N., et al.. (2002). Efficient multisine testing of analog circuits. 234–238. 9 indexed citations

10.

Nagi, N., et al.. (2002). Fault-based automatic test generator for linear analog circuits. 88–91. 30 indexed citations

11.

Variyam, P.N., et al.. (2002). Hierarchical statistical inference model for specification based testing of analog circuits. 145–150. 11 indexed citations

12.

Sunter, Stephen & N. Nagi. (1999). Simplified polynomial-fitting algorithm for DAC and ADC bist. Computer Standards & Interfaces. 21(2). 98–98.

13.

Nagi, N., et al.. (1998). Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 17(6). 540–546. 23 indexed citations

14.

Zheng, Hong, et al.. (1996). A unified approach for fault simulation of linear mixed-signal circuits. Journal of Electronic Testing. 9(1-2). 29–41. 14 indexed citations

15.

Nagi, N. & Jacob A. Abraham. (1996). Hierarchical fault modeling for linear analog circuits. Analog Integrated Circuits and Signal Processing. 10(1-2). 89–99. 23 indexed citations

16.

Nagi, N.. (1995). A comprehensive test framework for analog and mixed-signal circuits.

17.

Nagi, N., et al.. (1993). Fault-based automatic test generator for linear analog circuits. International Conference on Computer Aided Design. 88–91. 74 indexed citations

18.

Nagi, N., Abhijit Chatterjee, & Jacob A. Abraham. (1993). Fault simulation of linear analog circuits. Journal of Electronic Testing. 4(4). 345–360. 36 indexed citations

19.

Nagi, N., Abhijit Chatterjee, & Jacob A. Abraham. (1993). DRAFTS. 509–514. 40 indexed citations

20.

Nagi, N., Abhijit Chatterjee, & Jacob A. Abraham. (1993). Fault simulation of linear analog circuits. Analog Integrated Circuits and Signal Processing. 4(3). 245–260. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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