Friedrich Hapke

1.3k total citations
36 papers, 992 citations indexed

About

Friedrich Hapke is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Software. According to data from OpenAlex, Friedrich Hapke has authored 36 papers receiving a total of 992 indexed citations (citations by other indexed papers that have themselves been cited), including 36 papers in Hardware and Architecture, 32 papers in Electrical and Electronic Engineering and 5 papers in Software. Recurrent topics in Friedrich Hapke's work include VLSI and Analog Circuit Testing (36 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers) and Advancements in Photolithography Techniques (7 papers). Friedrich Hapke is often cited by papers focused on VLSI and Analog Circuit Testing (36 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers) and Advancements in Photolithography Techniques (7 papers). Friedrich Hapke collaborates with scholars based in Germany, United States and Netherlands. Friedrich Hapke's co-authors include Andreas Glowatz, Juergen Schloeffel, Hans-Joachim Wunderlich, Michael Reese, Rolf Drechsler, Görschwin Fey, J. Rajski, Martin Keim, S. Eichenberger and H. Hashempour and has published in prestigious journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Very Large Scale Integration (VLSI) Systems and IEEE Design and Test.

In The Last Decade

Friedrich Hapke

36 papers receiving 955 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Friedrich Hapke Germany 18 942 919 84 66 54 36 992
Andreas Glowatz Germany 14 665 0.7× 642 0.7× 53 0.6× 59 0.9× 51 0.9× 28 707
Juergen Schloeffel Germany 13 564 0.6× 584 0.6× 33 0.4× 35 0.5× 32 0.6× 30 634
N. Tamarapalli United States 14 1.2k 1.3× 1.2k 1.3× 192 2.3× 45 0.7× 21 0.4× 17 1.3k
S. Venkataraman United States 12 702 0.7× 690 0.8× 107 1.3× 45 0.7× 16 0.3× 27 745
Rohit Kapur United States 13 494 0.5× 462 0.5× 86 1.0× 31 0.5× 46 0.9× 46 537
H.T. Vierhaus Germany 13 512 0.5× 524 0.6× 40 0.5× 48 0.7× 26 0.5× 109 595
Michael A. Kochte Germany 17 788 0.8× 748 0.8× 41 0.5× 45 0.7× 29 0.5× 76 871
Mark Kassab United States 16 1.6k 1.6× 1.5k 1.7× 242 2.9× 49 0.7× 11 0.2× 49 1.6k
A. Krstić United States 19 869 0.9× 877 1.0× 58 0.7× 58 0.9× 30 0.6× 32 945
C. Landrault France 21 1.4k 1.5× 1.4k 1.5× 185 2.2× 57 0.9× 19 0.4× 101 1.5k

Countries citing papers authored by Friedrich Hapke

Since Specialization
Citations

This map shows the geographic impact of Friedrich Hapke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Friedrich Hapke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Friedrich Hapke more than expected).

Fields of papers citing papers by Friedrich Hapke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Friedrich Hapke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Friedrich Hapke. The network helps show where Friedrich Hapke may publish in the future.

Co-authorship network of co-authors of Friedrich Hapke

This figure shows the co-authorship network connecting the top 25 collaborators of Friedrich Hapke. A scholar is included among the top collaborators of Friedrich Hapke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Friedrich Hapke. Friedrich Hapke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hapke, Friedrich, et al.. (2020). Defect-Oriented Test: Effectiveness in High Volume Manufacturing. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 40(3). 584–597. 17 indexed citations
2.
3.
Maxwell, Alexander P., et al.. (2017). Bridge over troubled waters: Critical area based pattern generation. 1–6. 11 indexed citations
4.
Feltham, D.B.I., M.J. Patyra, Friedrich Hapke, et al.. (2016). On New Test Points for Compact Cell-Aware Tests. IEEE Design and Test. 33(6). 7–14. 5 indexed citations
5.
Tang, Huaxing, et al.. (2015). Diagnosing timing related cell internal defects for FinFET technology. 1–4. 7 indexed citations
6.
Keim, Martin, et al.. (2013). Industrial Application of IEEE P1687 for an Automotive Product. 453–461. 16 indexed citations
7.
Marinissen, Erik Jan, et al.. (2012). EDA solutions to new-defect detection in advanced process technologies. 123–128. 2 indexed citations
8.
Glowatz, Andreas, et al.. (2012). A new SAT-based ATPG for generating highly compacted test sets. 230–235. 17 indexed citations
9.
Hapke, Friedrich, et al.. (2012). Cell-aware Production test results from a 32-nm notebook processor. 1–9. 51 indexed citations
10.
Eggersglüß, Stephan, Görschwin Fey, Andreas Glowatz, et al.. (2010). MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. Journal of Electronic Testing. 26(3). 307–322. 13 indexed citations
11.
Hapke, Friedrich, et al.. (2010). Defect-oriented cell-internal testing. 37 indexed citations
12.
Holst, Stefan, et al.. (2009). Restrict Encoding for Mixed-Mode BIST. Fachbereich Informatik (University of Stuttgart). 179–184. 37 indexed citations
13.
Glowatz, Andreas, et al.. (2009). Using a two-dimensional fault list for compact Automatic Test Pattern Generation. 1–6. 3 indexed citations
14.
Drechsler, Rolf, Stephan Eggersglüß, Görschwin Fey, et al.. (2008). On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 27(7). 1329–1333. 81 indexed citations
15.
Eggersglüß, Stephan, Görschwin Fey, Rolf Drechsler, et al.. (2007). Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. 2919. 181–187. 8 indexed citations
16.
Eggersglüß, Stephan, et al.. (2007). Studies on Integrating SAT-based ATPG in an Industrial Environment. 2 indexed citations
17.
Wunderlich, Hans-Joachim, et al.. (2007). Programmable deterministic Built-In Self-Test. Fachbereich Informatik (University of Stuttgart). 1–9. 45 indexed citations
18.
Eggersglüß, Stephan, et al.. (2007). Experimental Studies on SAT-Based ATPG for Gate Delay Faults. 2919. 6–6. 7 indexed citations
19.
Tang, Yuyi, et al.. (2006). X-masking during logic BIST and its impact on defect coverage. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 14(2). 193–202. 75 indexed citations
20.
Vranken, Harald, Sandeep Goel, Andreas Glowatz, Juergen Schloeffel, & Friedrich Hapke. (2006). Fault detection and diagnosis with parity trees for space compaction of test responses. 1095–1095. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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