E. Volkerink
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Physical Unclonable Functions (PUFs) and Hardware Security
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- Integrated Circuits and Semiconductor Failure Analysis
- VLSI and FPGA Design Techniques
- Radiation Effects in Electronics
- Low-power high-performance VLSI design
- Advancements in Photolithography Techniques
Papers in
-
- VLSI and Analog Circuit Testing 12
-
- Integrated Circuits and Semiconductor Failure Analysis 11
- VLSI and FPGA Design Techniques 6
- Low-power high-performance VLSI design 2
- Radiation Effects in Electronics 1
- Advancements in Photolithography Techniques 1
- Electrostatic Discharge in Electronics 1
- Co-authors
- Subhasish Mitra (7 shared papers)E.J. McCluskey (3 shared papers)S. Eichenberger (1 shared paper)Sven Rogge (1 shared paper)Friedrich Hapke (1 shared paper)Harald Vranken (1 shared paper)Chao-Wen Tseng (1 shared paper)Kate Brand (1 shared paper)
- Journals
- Journal of Electronic Testing (1 paper)University of Twente Research Information (1 paper)IEEE Design & Test of Computers (1 paper)
- Partner nations
- United StatesNetherlandsGermany
In The Last Decade
E. Volkerink
12 papers receiving 378 citations
Peers
Comparison fields: 5 of 19
- Hardware and Architecture 387
- Electrical and Electronic Engineering 378
- Software 18
- Control and Systems Engineering 70
- Computer Networks and Communications 14
Countries citing papers authored by E. Volkerink
This map shows the geographic impact of E. Volkerink's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Volkerink with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Volkerink more than expected).
Fields of papers citing papers by E. Volkerink
This network shows the impact of papers produced by E. Volkerink. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Volkerink. The network helps show where E. Volkerink may publish in the future.
Co-authors
The 10 scholars most cited alongside E. Volkerink, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 58 | |
| 2 | 2003 | 55 | |
| 3 | 2004 | 54 | |
| 4 | 2003 | 48 | |
| 5 | 2004 | 42 | |
| 6 | 2003 | 38 | |
| 7 | 2005 | 36 | |
| 8 | 2004 | 27 | |
| 9 | 2002 | 17 | |
| 10 | 2005 | 15 | |
| 11 | 2003 | 6 | |
| 12 | 2007 | 3 |
About E. Volkerink
E. Volkerink is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Control and Systems Engineering, Infectious Diseases and Organic Chemistry, having authored 12 papers that have together received 399 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (12 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers), VLSI and FPGA Design Techniques (6 papers), Low-power high-performance VLSI design (2 papers), Engineering and Test Systems (1 paper), Radiation Effects in Electronics (1 paper), Advancements in Photolithography Techniques (1 paper) and Electrostatic Discharge in Electronics (1 paper). The work is most often cited by research in Hardware and Architecture (387 citations), Electrical and Electronic Engineering (378 citations), Software (18 citations), Control and Systems Engineering (70 citations) and Computer Networks and Communications (14 citations). E. Volkerink has collaborated with scholars based in United States, Netherlands and Germany. Frequent co-authors include Subhasish Mitra, E.J. McCluskey, S. Eichenberger, Sven Rogge, Friedrich Hapke, Harald Vranken, Chao-Wen Tseng, Kate Brand, Hans G. Kerkhoff and Jeff Rearick. Their work appears in journals such as Journal of Electronic Testing, University of Twente Research Information and IEEE Design & Test of Computers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.