E. Volkerink

490 total citations
12 papers, 402 citations indexed

About

E. Volkerink is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering and Control and Systems Engineering. According to data from OpenAlex, E. Volkerink has authored 12 papers receiving a total of 402 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Hardware and Architecture, 12 papers in Electrical and Electronic Engineering and 1 paper in Control and Systems Engineering. Recurrent topics in E. Volkerink's work include VLSI and Analog Circuit Testing (12 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and VLSI and FPGA Design Techniques (6 papers). E. Volkerink is often cited by papers focused on VLSI and Analog Circuit Testing (12 papers), Integrated Circuits and Semiconductor Failure Analysis (11 papers) and VLSI and FPGA Design Techniques (6 papers). E. Volkerink collaborates with scholars based in United States, Netherlands and Germany. E. Volkerink's co-authors include Subhasish Mitra, E.J. McCluskey, S. Eichenberger, Chao-Wen Tseng, Sven Rogge, Harald Vranken, Friedrich Hapke, Kate Brand, Hans G. Kerkhoff and Jeff Rearick and has published in prestigious journals such as Journal of Electronic Testing and IEEE Design & Test of Computers.

In The Last Decade

E. Volkerink

12 papers receiving 377 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
E. Volkerink United States	10	390	381	70	18	14	12	402
G. Hetherington United States	6	451 1.2×	447 1.2×	65 0.9×	8 0.4×	20 1.4×	8	466
Vivek Chickermane United States	15	573 1.5×	597 1.6×	50 0.7×	19 1.1×	14 1.0×	43	623
P. Wohl United States	15	708 1.8×	688 1.8×	112 1.6×	33 1.8×	12 0.9×	38	722
Shianling Wu United States	8	303 0.8×	299 0.8×	53 0.8×	12 0.7×	9 0.6×	23	313
A.S.M. Hassan Canada	5	309 0.8×	320 0.8×	40 0.6×	9 0.5×	28 2.0×	6	340
P. Varma United States	7	295 0.8×	278 0.7×	53 0.8×	11 0.6×	25 1.8×	18	307
F. P. M. Beenker Netherlands	10	491 1.3×	480 1.3×	67 1.0×	30 1.7×	42 3.0×	19	520
D.B.I. Feltham United States	9	308 0.8×	317 0.8×	30 0.4×	17 0.9×	10 0.7×	13	344
Rubin Parekhji India	12	293 0.8×	312 0.8×	33 0.5×	19 1.1×	29 2.1×	65	332
T.J. Snethen United States	7	406 1.0×	397 1.0×	78 1.1×	21 1.2×	12 0.9×	11	411

Countries citing papers authored by E. Volkerink

Since Specialization

Citations

This map shows the geographic impact of E. Volkerink's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Volkerink with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Volkerink more than expected).

Fields of papers citing papers by E. Volkerink

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Volkerink. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Volkerink. The network helps show where E. Volkerink may publish in the future.

Co-authorship network of co-authors of E. Volkerink

This figure shows the co-authorship network connecting the top 25 collaborators of E. Volkerink. A scholar is included among the top collaborators of E. Volkerink based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Volkerink. E. Volkerink is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

1.

Volkerink, E., et al.. (2007). Empirical Validation of Yield Recovery Using Idle-Cycle Insertion. IEEE Design & Test of Computers. 24(4). 362–372. 3 indexed citations

2.

Brand, Kate, Subhasish Mitra, E. Volkerink, & E.J. McCluskey. (2005). Speed clustering of integrated circuits. 1128–1137. 15 indexed citations

3.

Volkerink, E. & Subhasish Mitra. (2005). Response compaction with any number of unknowns using a new LFSR architecture. 117–117. 37 indexed citations

4.

McCluskey, E.J., et al.. (2004). ELF-Murphy data on defects and test sets. 16–22. 43 indexed citations

5.

Mitra, Subhasish, E. Volkerink, E.J. McCluskey, & S. Eichenberger. (2004). Delay defect screening using process monitor structures. 43–48. 55 indexed citations

6.

Vranken, Harald, et al.. (2004). Atpg padding and ate vector repeat per port for reducing test data volume. 1. 1069–1078. 27 indexed citations

7.

Volkerink, E. & Subhasish Mitra. (2003). Efficient seed utilization for reseeding based compression [logic testing]. 232–237. 55 indexed citations

8.

Volkerink, E., et al.. (2003). Test economics for multi-site test with modern cost reduction techniques. 411–416. 49 indexed citations

9.

Volkerink, E., et al.. (2003). Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. Journal of Electronic Testing. 19(2). 125–135. 6 indexed citations

10.

Volkerink, E., et al.. (2003). Packet-based input test data compression techniques. 154–163. 57 indexed citations

11.

Volkerink, E., et al.. (2003). Test vector compression using EDA-ATE synergies. 97–102. 38 indexed citations

12.

Volkerink, E., et al.. (2002). Tackling test trade-offs from design, manufacturing to market using economic modeling. 1098–1107. 17 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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