M. C. Reuter

2.0k total citations
37 papers, 1.6k citations indexed

About

M. C. Reuter is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, M. C. Reuter has authored 37 papers receiving a total of 1.6k indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Atomic and Molecular Physics, and Optics, 25 papers in Electrical and Electronic Engineering and 6 papers in Surfaces, Coatings and Films. Recurrent topics in M. C. Reuter's work include Semiconductor materials and devices (14 papers), Semiconductor materials and interfaces (12 papers) and Surface and Thin Film Phenomena (12 papers). M. C. Reuter is often cited by papers focused on Semiconductor materials and devices (14 papers), Semiconductor materials and interfaces (12 papers) and Surface and Thin Film Phenomena (12 papers). M. C. Reuter collaborates with scholars based in United States and France. M. C. Reuter's co-authors include R. M. Tromp, F. M. Ross, M. Copel, F. K. LeGoues, J. Tersoff, Mattias Hammar, R. Hull, Frances M. Ross, A. W. Denier van der Gon and M. Horn von Hoegen and has published in prestigious journals such as Science, Physical Review Letters and Physical review. B, Condensed matter.

In The Last Decade

M. C. Reuter

36 papers receiving 1.6k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. C. Reuter United States 20 1.1k 993 469 248 192 37 1.6k
L. Jastrzȩbski United States 21 933 0.8× 1.6k 1.6× 622 1.3× 212 0.9× 90 0.5× 114 1.9k
J. P. Pelz United States 27 1.3k 1.2× 1.3k 1.3× 484 1.0× 301 1.2× 118 0.6× 80 2.0k
A. J. Pidduck United Kingdom 19 836 0.7× 748 0.8× 334 0.7× 193 0.8× 54 0.3× 46 1.3k
P. Bedrossian United States 16 758 0.7× 492 0.5× 315 0.7× 207 0.8× 210 1.1× 32 1.2k
M. Cerullo United States 12 1.6k 1.4× 1.6k 1.7× 825 1.8× 408 1.6× 90 0.5× 26 2.4k
C. W. Snyder United States 13 963 0.8× 642 0.6× 372 0.8× 151 0.6× 60 0.3× 20 1.2k
Jeff Drucker United States 24 1.3k 1.1× 1.2k 1.2× 784 1.7× 817 3.3× 215 1.1× 91 2.1k
T. Y. Tan United States 17 950 0.8× 818 0.8× 438 0.9× 126 0.5× 51 0.3× 47 1.4k
Hiroshi Kakibayashi Japan 19 1.1k 0.9× 1.1k 1.1× 760 1.6× 899 3.6× 128 0.7× 61 1.9k
P. M. J. Marée Netherlands 9 805 0.7× 599 0.6× 357 0.8× 113 0.5× 94 0.5× 12 1.1k

Countries citing papers authored by M. C. Reuter

Since Specialization
Citations

This map shows the geographic impact of M. C. Reuter's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. C. Reuter with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. C. Reuter more than expected).

Fields of papers citing papers by M. C. Reuter

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. C. Reuter. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. C. Reuter. The network helps show where M. C. Reuter may publish in the future.

Co-authorship network of co-authors of M. C. Reuter

This figure shows the co-authorship network connecting the top 25 collaborators of M. C. Reuter. A scholar is included among the top collaborators of M. C. Reuter based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. C. Reuter. M. C. Reuter is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Reuter, M. C., et al.. (2025). Understanding Interphases and Interfaces of Battery Materials at the Nanoscale. Small. 21(34). e2504379–e2504379. 1 indexed citations
2.
Hu, G., J. Nowak, J. Z. Sun, et al.. (2015). STT-MRAM with double magnetic tunnel junctions. 26.3.1–26.3.4. 64 indexed citations
3.
Chou, Yi, M. C. Reuter, F. M. Ross, & Eric A. Stach. (2012). The Growth Of Si Nanowires In UHVTEM And Cs-corrected ETEM. Microscopy and Microanalysis. 18(S2). 1084–1085. 2 indexed citations
4.
Bennett, P. A., David J. Smith, Zhian He, et al.. (2011). In situobservations of endotaxial growth of CoSi2nanowires on Si(110) using ultrahigh vacuum transmission electron microscopy. Nanotechnology. 22(30). 305606–305606. 6 indexed citations
5.
Kodambaka, Suneel, J. Tersoff, M. C. Reuter, Kathleen B. Reuter, & F. M. Ross. (2007). Simultaneous Ge Nanowire Growth Using Solid and Liquid Au Catalysts. Microscopy and Microanalysis. 13(S02). 1 indexed citations
6.
Hannon, J. B., M. Copel, R. Stumpf, M. C. Reuter, & R. M. Tromp. (2004). Critical Role of Surface Steps in the Alloying of Ge on Si(001). Physical Review Letters. 92(21). 216104–216104. 15 indexed citations
7.
Kammler, M., R. Hull, M. C. Reuter, & Frances M. Ross. (2003). Lateral control of self-assembled island nucleation by focused-ion-beam micropatterning. Applied Physics Letters. 82(7). 1093–1095. 60 indexed citations
8.
Hannon, J. B., J. Tersoff, M. C. Reuter, & R. M. Tromp. (2002). Influence of Supersaturation on Surface Structure. Physical Review Letters. 89(26). 266103–266103. 14 indexed citations
9.
Ross, F. M., J. Tersoff, R. M. Tromp, M. C. Reuter, & P. A. Bennett. (1999). Island growth of Ge on Si(001) and CoSi2 on Si(111) studied with UHV electron microscopy. Journal of Electron Microscopy. 48. 1059–1066. 7 indexed citations
10.
Ross, F. M., P. A. Bennett, R. M. Tromp, J. Tersoff, & M. C. Reuter. (1999). Growth kinetics of CoSi2 and Ge islands observed with in situ transmission electron microscopy. Micron. 30(1). 21–32. 24 indexed citations
11.
Ross, F. M., R. M. Tromp, & M. C. Reuter. (1999). Transition States Between Pyramids and Domes During Ge/Si Island Growth. Science. 286(5446). 1931–1934. 378 indexed citations
12.
Stach, E.A., R. Hull, R. M. Tromp, et al.. (1998). Effect of the surface upon misfit dislocation velocities during the growth and annealing of SiGe/Si (001) heterostructures. Journal of Applied Physics. 83(4). 1931–1937. 31 indexed citations
13.
Ross, Frances M., J. Tersoff, M. C. Reuter, F. K. LeGoues, & R. M. Tromp. (1998). In situ transmission electron microscopy observations of the formation of self-assembled Ge islands on Si. Microscopy Research and Technique. 42(4). 281–294. 17 indexed citations
14.
Tromp, R. M., F. K. LeGoues, & M. C. Reuter. (1995). Strain Relief during Growth: CaF2on Si(111). Physical Review Letters. 74(14). 2706–2709. 19 indexed citations
15.
Hoegen, M. Horn‐von, M. Copel, J. C. Tsang, M. C. Reuter, & R. M. Tromp. (1994). Surfactant-mediated growth of Ge on Si(111). Physical review. B, Condensed matter. 50(15). 10811–10822. 64 indexed citations
16.
Tromp, R. M. & M. C. Reuter. (1994). Kinetic Instability in the Growth of CaF2on Si(111). Physical Review Letters. 73(1). 110–113. 36 indexed citations
17.
Falta, J., M. C. Reuter, & R. M. Tromp. (1994). Growth modes of Ge on GaAs(001). Applied Physics Letters. 65(13). 1680–1682. 10 indexed citations
18.
Tromp, R. M. & M. C. Reuter. (1993). Step morphologies on small-miscut Si(001) surfaces. Physical review. B, Condensed matter. 47(12). 7598–7601. 48 indexed citations
19.
Tromp, R. M., et al.. (1991). A new two-dimensional particle detector for a toroidal electrostatic analyzer. Review of Scientific Instruments. 62(11). 2679–2683. 96 indexed citations
20.
Tromp, R. M. & M. C. Reuter. (1988). Structure of the Si(111)-CaF2Interface. Physical Review Letters. 61(15). 1756–1759. 155 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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