C. D’Emic

1.9k total citations
42 papers, 1.4k citations indexed

About

C. D’Emic is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, C. D’Emic has authored 42 papers receiving a total of 1.4k indexed citations (citations by other indexed papers that have themselves been cited), including 41 papers in Electrical and Electronic Engineering, 10 papers in Atomic and Molecular Physics, and Optics and 3 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in C. D’Emic's work include Semiconductor materials and devices (33 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). C. D’Emic is often cited by papers focused on Semiconductor materials and devices (33 papers), Advancements in Semiconductor Devices and Circuit Design (26 papers) and Integrated Circuits and Semiconductor Failure Analysis (14 papers). C. D’Emic collaborates with scholars based in United States, Japan and Canada. C. D’Emic's co-authors include E. P. Gusev, M. Copel, M. Gribelyuk, H. Schmidt, E. Cartier, D. A. Buchanan, K. Chan, P. Kozlowski, J. Félix and Daniel M. Fleetwood and has published in prestigious journals such as ACS Nano, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

C. D’Emic

42 papers receiving 1.3k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
C. D’Emic United States 18 1.3k 297 213 198 75 42 1.4k
Andreas Mai Germany 18 938 0.7× 209 0.7× 399 1.9× 306 1.5× 56 0.7× 101 1.1k
A. Kalnitsky United States 13 529 0.4× 186 0.6× 112 0.5× 92 0.5× 50 0.7× 47 602
Meishoku Masahara Japan 25 2.4k 1.9× 204 0.7× 200 0.9× 371 1.9× 53 0.7× 232 2.5k
N. Balasubramanian Singapore 18 1.5k 1.2× 262 0.9× 230 1.1× 991 5.0× 27 0.4× 49 1.7k
Maria Eloisa Castagna Italy 12 352 0.3× 240 0.8× 120 0.6× 212 1.1× 31 0.4× 52 483
B. Bayraktaroglu United States 20 1.1k 0.9× 459 1.5× 350 1.6× 132 0.7× 176 2.3× 107 1.3k
Annamaria Zaltron Italy 19 468 0.4× 116 0.4× 382 1.8× 318 1.6× 155 2.1× 47 782
A. Souifi France 13 470 0.4× 239 0.8× 290 1.4× 157 0.8× 27 0.4× 64 600
Henry A. Fernández Finland 13 327 0.3× 319 1.1× 191 0.9× 200 1.0× 75 1.0× 23 622

Countries citing papers authored by C. D’Emic

Since Specialization
Citations

This map shows the geographic impact of C. D’Emic's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. D’Emic with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. D’Emic more than expected).

Fields of papers citing papers by C. D’Emic

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. D’Emic. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. D’Emic. The network helps show where C. D’Emic may publish in the future.

Co-authorship network of co-authors of C. D’Emic

This figure shows the co-authorship network connecting the top 25 collaborators of C. D’Emic. A scholar is included among the top collaborators of C. D’Emic based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. D’Emic. C. D’Emic is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Gottwald, M., G. Hu, P. L. Trouilloud, et al.. (2024). First Demonstration of High Retention Energy Barriers and 2 ns Switching, Using Magnetic Ordered-Alloy-Based STT MRAM Devices. 1–2. 1 indexed citations
2.
Safranski, Christopher, G. Hu, J. Z. Sun, et al.. (2022). Reliable Sub-Nanosecond Switching in Magnetic Tunnel Junctions for MRAM Applications. IEEE Transactions on Electron Devices. 69(12). 7180–7183. 13 indexed citations
3.
Safranski, Christopher, G. Hu, J. Z. Sun, et al.. (2022). Reliable Sub-nanosecond MRAM with Double Spin-torque Magnetic Tunnel Junctions. 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits). 288–289. 11 indexed citations
4.
Cai, Jin, T.H. Ning, C. D’Emic, et al.. (2014). On the Device Design and Drive-Current Capability of SOI Lateral Bipolar Transistors. IEEE Journal of the Electron Devices Society. 2(5). 105–113. 16 indexed citations
5.
Zafar, Sufi, et al.. (2011). Optimization of pH sensing using silicon nanowire field effect transistors with HfO2as the sensing surface. Nanotechnology. 22(40). 405501–405501. 51 indexed citations
6.
Tega, Naoki, Zhibin Ren, Masaharu Kobayashi, et al.. (2011). Understanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETs. 148–149. 19 indexed citations
7.
Miki, Hiroshi, Naoki Tega, Zhibin Ren, et al.. (2010). Hysteretic drain-current behavior due to random telegraph noise in Scaled-down FETs with high-κ/metal-gate stacks. 28.1.1–28.1.4. 9 indexed citations
8.
Félix, J., Hao Xiong, Daniel M. Fleetwood, et al.. (2004). Interface trapping properties of nMOSFETs with Al2O3/SiOxNy/Si(100) gate dielectric stacks after exposure to ionizing radiation. Microelectronic Engineering. 72(1-4). 50–54. 12 indexed citations
9.
Gusev, E. P., C. D’Emic, Sufi Zafar, & Atul Kumar. (2004). Charge trapping and detrapping in HfO2 high-κ gate stacks. Microelectronic Engineering. 72(1-4). 273–277. 30 indexed citations
10.
Gusev, E. P., Huiling Shang, M. Copel, et al.. (2004). Microstructure and thermal stability of HfO2 gate dielectric deposited on Ge(100). Applied Physics Letters. 85(12). 2334–2336. 79 indexed citations
11.
Solomon, P. M., D.J. Frank, J. Jopling, et al.. (2004). Tunnel current measurements on P/N junction diodes and implications for future device design. ed 30. 9.3.1–9.3.4. 7 indexed citations
12.
Zhou, X. J., Leonidas Tsetseris, Sergey N. Rashkeev, et al.. (2004). Negative bias-temperature instabilities in metal–oxide–silicon devices with SiO2 and SiOxNy/HfO2 gate dielectrics. Applied Physics Letters. 84(22). 4394–4396. 33 indexed citations
13.
Xiong, Hao, Daniel M. Fleetwood, J. Félix, E. P. Gusev, & C. D’Emic. (2003). Low-frequency noise and radiation response of metal-oxide-semiconductor transistors with Al2O3/SiOxNy/Si(100) gate stacks. Applied Physics Letters. 83(25). 5232–5234. 16 indexed citations
14.
Chu, J. O., C. D’Emic, Steven J. Koester, et al.. (2002). Electron and hole mobility enhancement in strained SOI by wafer bonding. IEEE Transactions on Electron Devices. 49(9). 1566–1571. 43 indexed citations
15.
Buchanan, D. A., E. P. Gusev, E. Cartier, et al.. (2002). 80 nm polysilicon gated n-FETs with ultra-thin Al/sub 2/O/sub 3/ gate dielectric for ULSI applications. 223–226. 34 indexed citations
16.
Gusev, E. P., E. Cartier, D. A. Buchanan, et al.. (2001). Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues. Microelectronic Engineering. 59(1-4). 341–349. 318 indexed citations
17.
Mooney, P. M., C. D’Emic, J. O. Chu, et al.. (1997). Defect states in strain-relaxed Si0.7Ge0.3 layers grown at low temperature. Journal of Applied Physics. 82(2). 688–695. 9 indexed citations
18.
Heath, James R., R. Stanley Williams, J. J. Shiang, et al.. (1996). Spatially Confined Chemistry:  Fabrication of Ge Quantum Dot Arrays. The Journal of Physical Chemistry. 100(8). 3144–3149. 32 indexed citations
19.
D’Emic, C., K. Chan, & J. M. Blum. (1992). Deep trench plasma etching of single crystal silicon using SF6/O2 gas mixtures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(3). 1105–1110. 36 indexed citations
20.
Greenlief, C. Michael, Joseph F. Bringley, B. A. Scott, et al.. (1990). In situ determination of the effects of carbon dioxide and other volatile impurities on yttrium barium copper oxide (YBa2Cu3O7-x). Chemistry of Materials. 2(4). 416–420. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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