K. Onishi
- Electrical and Electronic Engineering top 10%
- Materials Chemistry
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Mechanics of Materials
- Co-authors
- Rino ChoiR. NiehChang Seok KangJ.C. LeeSundararaman GopalanHag‐Ju ChoM.S. AkbarJeong Hee Han
- Topics
- Semiconductor materials and devices (18 papers)Advancements in Semiconductor Devices and Circuit Design (17 papers)Integrated Circuits and Semiconductor Failure Analysis (8 papers)
- Cited by
- Electrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsMaterials Chemistry
- Partner nations
- United StatesItalyTaiwan
In The Last Decade
K. Onishi
17 papers receiving 355 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 374
- Materials Chemistry 70
- Electronic, Optical and Magnetic Materials 42
- Atomic and Molecular Physics, and Optics 39
- Mechanics of Materials 23
Countries citing papers authored by K. Onishi
This map shows the geographic impact of K. Onishi's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Onishi with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Onishi more than expected).
Fields of papers citing papers by K. Onishi
This network shows the impact of papers produced by K. Onishi. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Onishi. The network helps show where K. Onishi may publish in the future.
Co-authorship network of co-authors of K. Onishi
This figure shows the co-authorship network connecting the top 25 collaborators of K. Onishi. A scholar is included among the top collaborators of K. Onishi based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Onishi. K. Onishi is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Dynamic reliability characteristics of ultra-thin HfO 2 | 7 |
| 2 | 40 | |
| 3 | 15 | |
| 4 | 14 | |
| 5 | 4 | |
| 6 | 3 | |
| 7 | 20 | |
| 8 | 4 | |
| 9 | 3 | |
| 10 | 53 | |
| 11 | 29 | |
| 12 | 62 | |
| 13 | 47 | |
| 14 | 3 | |
| 15 | 0 | |
| 16 | 36 | |
| 17 | 27 | |
| 18 | 13 |
About K. Onishi
K. Onishi is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Infectious Diseases, having authored 18 papers that have together received 380 indexed citations. Recurring topics across this work include Semiconductor materials and devices (18 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers) and Integrated Circuits and Semiconductor Failure Analysis (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (374 citations), Electronic, Optical and Magnetic Materials (42 citations) and Materials Chemistry (70 citations). K. Onishi has collaborated with scholars based in United States, Italy and Taiwan. Frequent co-authors include Rino Choi, R. Nieh, Chang Seok Kang, J.C. Lee, Sundararaman Gopalan, Hag‐Ju Cho, M.S. Akbar, Jeong Hee Han, Siddarth Krishnan and Laegu Kang. Their work appears in journals such as Applied Physics Letters, IEEE Transactions on Electron Devices and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.