Changseok Kang

535 total citations
23 papers, 424 citations indexed

About

Changseok Kang is a scholar working on Electrical and Electronic Engineering, Computer Networks and Communications and Mechanical Engineering. According to data from OpenAlex, Changseok Kang has authored 23 papers receiving a total of 424 indexed citations (citations by other indexed papers that have themselves been cited), including 17 papers in Electrical and Electronic Engineering, 7 papers in Computer Networks and Communications and 3 papers in Mechanical Engineering. Recurrent topics in Changseok Kang's work include Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers) and Advanced Data Storage Technologies (7 papers). Changseok Kang is often cited by papers focused on Semiconductor materials and devices (17 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers) and Advanced Data Storage Technologies (7 papers). Changseok Kang collaborates with scholars based in South Korea, United States and Italy. Changseok Kang's co-authors include Kee-Won Kwon, Ho-Kyu Kang, Jongsun Sel, Kinam Kim, Soon Oh Park, Young‐Woo Park, Jungdal Choi, Chul‐Hwan Kim, Jung Ho Park and Sun‐Woong Kang and has published in prestigious journals such as IEEE Transactions on Electron Devices, Japanese Journal of Applied Physics and IEEE Electron Device Letters.

In The Last Decade

Changseok Kang

22 papers receiving 410 citations

Peers

Changseok Kang

EEE

CNC

RHEUM

SURGE

Trang Thi Thu Nguyen South Korea

Ziqi Chen China

Soumitra Das India

Jing Yan China

Xian Jin Canada

Akira Umezawa Japan

Yuzhen Yang China

Yaoming Shi China

R.M. Lec United States

Albert Lin United States

Trang Thi Thu Nguyen South Korea

Changseok Kang

284 ×0.9

EEE

150 ×1.8

15 ×0.2

CNC

95 ×1.4

RHEUM

6 ×0.2

SURGE

Citations per year, relative to Changseok Kang Changseok Kang (= 1×) peers Trang Thi Thu Nguyen

Countries citing papers authored by Changseok Kang

Since Specialization

Citations

This map shows the geographic impact of Changseok Kang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Changseok Kang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Changseok Kang more than expected).

Fields of papers citing papers by Changseok Kang

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Changseok Kang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Changseok Kang. The network helps show where Changseok Kang may publish in the future.

Co-authorship network of co-authors of Changseok Kang

This figure shows the co-authorship network connecting the top 25 collaborators of Changseok Kang. A scholar is included among the top collaborators of Changseok Kang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Changseok Kang. Changseok Kang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Choi, Se-Weon, et al.. (2018). Influence of the Precipitation of Secondary Phase on the Thermal Diffusivity Change of Al-Mg2Si Alloys. Applied Sciences. 8(11). 2039–2039. 12 indexed citations

Kim, Eun‐Jeong, Jee Young Kim, Jin Hee Cho, & Changseok Kang. (2013). Image features of aspergillosis arising from the pterygopalatine fossa: a case report and literature review. Oral Radiology. 30(2). 192–195. 2 indexed citations

Kim, Youngchan, et al.. (2011). Effects of GBF Treatment Conditions and Scrap Ratio on the Electric Conductivity of Commercial Pure Aluminum. Journal of the Korea Foundry Society. 31(3). 130–136. 1 indexed citations

Kim, Ju-Hyung, Changseok Kang, Jong Yeon Kim, et al.. (2010). New phenomena for the Lifetime Prediction of TANOS-based Charge Trap NAND Flash Memory. 99–100. 8 indexed citations

Lee, Chang‐Hyun, Changseok Kang, Sanghun Jeon, et al.. (2008). Reliability Characteristics of TANOS (TaN/AlO/SiN/Oxide/Si)NAND Flash Memory with Rounded Corner (RC) Structure. 117–118. 5 indexed citations

Lee, Chang Hyun, Jungdal Choi, Young‐Woo Park, et al.. (2008). Highly scalable NAND flash memory with robust immunity to program disturbance using symmetric inversion-type source and drain structure. 118–119. 24 indexed citations

Kang, Sun‐Woong, et al.. (2007). Articular cartilage regeneration with microfracture and hyaluronic acid. Biotechnology Letters. 30(3). 435–439. 78 indexed citations

Kang, Changseok, Jungdal Choi, Changhyun Lee, et al.. (2007). Effects of Lateral Charge Spreading on the Reliability of TANOS (TaN/AlO/SiN/Oxide/Si) NAND Flash Memory. 167–170. 41 indexed citations

Park, Jintaek, Changseok Kang, Ju-Hyung Kim, et al.. (2007). Self Aligned Trap-Shallow Trench Isolation Scheme for the Reliability of TANOS (TaN/AlO/SiN/Oxide/Si) NAND Flash Memory. 110–111. 7 indexed citations

10.

Park, Young‐Woo, Jungdal Choi, Changseok Kang, et al.. (2006). Highly Manufacturable 32Gb Multi -- Level NAND Flash Memory with 0.0098 &#x003BC;m<sup>2</sup> Cell Size using TANOS(Si - Oxide - Al2O3 - TaN) Cell Technology. 1–4. 54 indexed citations

11.

Choi, Jungdal, Changseok Kang, Chang Hyun Lee, et al.. (2006). A novel NAND-type MONOS memory using 63nm process technology for multi-gigabit flash EEPROMs. 327–330. 39 indexed citations

12.

Kang, Changseok, Jang‐Sik Lee, Kitae Park, et al.. (2006). Charge Trapping Memory Cell of TANOS (Si-Oxide-SiN-Al2O3-TaN) Structure Compatible to Conventional NAND Flash Memory. 54–55. 13 indexed citations

13.

Lee, Jang‐Sik, Changseok Kang, Kitae Park, et al.. (2006). Data Retention Characteristics of Nitride-Based Charge Trap Memory Devices with High-k Dielectrics and High-Work-Function Metal Gates for Multi-Gigabit Flash Memory. Japanese Journal of Applied Physics. 45(4S). 3213–3213. 29 indexed citations

14.

Choi, Changhwan, Changseok Kang, Chang Yong Kang, et al.. (2004). Positive bias temperature instability effects of Hf-based nMOSFETs with various nitrogen and silicon profiles. IEEE Electron Device Letters. 26(1). 32–34. 11 indexed citations

15.

Lu, Qiang, Hideki Takeuchi, Tsu-Jae King, et al.. (2003). Hot carrier reliability of n-MOSFET with ultra-thin HfO/sub 2/ gate dielectric and poly-Si gate. 429–430. 8 indexed citations

16.

Lu, Qiang, R. Lin, Hideki Takeuchi, et al.. (2002). Deep-submicron CMOS process integration of HfO/sub 2/ gate dielectric with poly-Si gate. 377–380. 3 indexed citations

17.

Kwon, Kee-Won, et al.. (1996). Thermally Robust Ta2O5 Capacitor for the 256-Mbit DRAM. 16 indexed citations

18.

Kwon, Kee-Won, et al.. (1996). Thermally robust Ta/sub 2/O/sub 5/ capacitor for the 256-Mbit DRAM. IEEE Transactions on Electron Devices. 43(6). 919–923. 61 indexed citations

19.

Kwon, Kee-Won, et al.. (1992). Low Temperature Tantalum Pentoxide Thin Films. MRS Proceedings. 284. 3 indexed citations

20.

Kang, Changseok, et al.. (1985). ChemInform Abstract: THE REALITY OF POLAR TRANSITION STATES OF PHOTOBROMINATION OF TOLUENES BY N‐BROMOSUCCINIMIDE (NBS). Chemischer Informationsdienst. 16(44). 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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