Jack C. Lee
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- Semiconductor materials and devices 141
- Ferroelectric and Negative Capacitance Devices 98
- Advancements in Semiconductor Devices and Circuit Design 89
- Advanced Memory and Neural Computing 81
- Integrated Circuits and Semiconductor Failure Analysis 29
- Materials Chemistry top 2%
- Electronic and Structural Properties of Oxides 34
- Ferroelectric and Piezoelectric Materials 16
- Polymers and Plastics top 5%
- Statistics and Probability top 2%
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- Semiconductor materials and interfaces 17
- Co-authors
- Byoung Hun LeeR. NiehXiaohan WuYao‐Feng ChangDeji AkinwandeLaegu KangRuijing GeBurt Fowler
- Cited by
- Electrical and Electronic EngineeringMaterials ChemistryCellular and Molecular Neuroscience
- Journals
- Applied Physics Letters (75 papers)Integrated ferroelectrics (8 papers)IEEE Transactions on Electron Devices (6 papers)
- Partner nations
- United StatesTaiwanSouth Korea
In The Last Decade
Jack C. Lee
233 papers receiving 6.2k citations
Hit Papers
Peers
Comparison fields: 5 of 135
- Electrical and Electronic Engineering 5.2k
- Materials Chemistry 2.4k
- Cellular and Molecular Neuroscience 661
- Polymers and Plastics 475
- Statistics and Probability 236
Countries citing papers authored by Jack C. Lee
This map shows the geographic impact of Jack C. Lee's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jack C. Lee with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jack C. Lee more than expected).
Fields of papers citing papers by Jack C. Lee
This network shows the impact of papers produced by Jack C. Lee. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jack C. Lee. The network helps show where Jack C. Lee may publish in the future.
Co-authorship network
The 25 scholars most cited alongside Jack C. Lee, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2023 | 34 | |
| 2 | 2023 | 1 | |
| 3 | 2023 | 3 | |
| 4 | 2022 | 3 | |
| 5 | 2022 | 12 | |
| 6 | 2021 | 18 | |
| 7 | 2021 | 21 | |
| 8 | 2020 | 15 | |
| 9 | 2019 | 19 | |
| 10 | 2018 | 112 | |
| 11 | 2018 | 9 | |
| 12 | 2018 | 29 | |
| 13 | 2017 | 22 | |
| 14 | 2016 | 1 | |
| 15 | 2016 | 1 | |
| 16 | 2014 | 346 | |
| 17 | 2013 | 6 | |
| 18 | Errors affecting split-CV mobility measurements in InGaAs MOS-HEMTs | 2011 | 1 |
| 19 | On Prediction of Financial Distress Using the Discrete-time Survival Model | 2008 | 1 |
| 20 | Finite mixture modelling using the skew normal distribution | 2007 | 147 |
About Jack C. Lee
Jack C. Lee is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Statistics and Probability, having authored 235 papers that have together received 6.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (141 papers), Ferroelectric and Negative Capacitance Devices (98 papers), Advancements in Semiconductor Devices and Circuit Design (89 papers), Advanced Memory and Neural Computing (81 papers), Electronic and Structural Properties of Oxides (34 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers), Semiconductor materials and interfaces (17 papers) and Ferroelectric and Piezoelectric Materials (16 papers). The work is most often cited by research in Electrical and Electronic Engineering (5.2k citations), Materials Chemistry (2.4k citations) and Cellular and Molecular Neuroscience (661 citations). Jack C. Lee has collaborated with scholars based in United States, Taiwan and South Korea. Frequent co-authors include Byoung Hun Lee, R. Nieh, Xiaohan Wu, Yao‐Feng Chang, Deji Akinwande, Laegu Kang, Ruijing Ge, Burt Fowler, Yanzhen Wang and Yen‐Ting Chen. Their work appears in journals such as Applied Physics Letters, Integrated ferroelectrics, IEEE Transactions on Electron Devices, Journal of Applied Physics and Solid-State Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.