K. Komeyli

605 total citations
6 papers, 72 citations indexed

About

K. Komeyli is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Condensed Matter Physics. According to data from OpenAlex, K. Komeyli has authored 6 papers receiving a total of 72 indexed citations (citations by other indexed papers that have themselves been cited), including 6 papers in Electrical and Electronic Engineering, 2 papers in Hardware and Architecture and 1 paper in Condensed Matter Physics. Recurrent topics in K. Komeyli's work include Semiconductor materials and devices (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). K. Komeyli is often cited by papers focused on Semiconductor materials and devices (4 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). K. Komeyli collaborates with scholars based in United States. K. Komeyli's co-authors include C. Tsai, Peng Bai, W. Hafez, Jang Hyeok Park, I. Post, G. Curello, J. Rizk, David Yeh, W. Maly and Jiefeng Lin and has published in prestigious journals such as Proceedings - International Symposium for Testing and Failure Analysis.

In The Last Decade

K. Komeyli

6 papers receiving 70 citations

Peers

Countries citing papers authored by K. Komeyli

Since Specialization

Citations

This map shows the geographic impact of K. Komeyli's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Komeyli with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Komeyli more than expected).

Fields of papers citing papers by K. Komeyli

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Komeyli. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Komeyli. The network helps show where K. Komeyli may publish in the future.

Co-authorship network of co-authors of K. Komeyli

This figure shows the co-authorship network connecting the top 25 collaborators of K. Komeyli. A scholar is included among the top collaborators of K. Komeyli based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Komeyli. K. Komeyli is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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6 of 6 papers shown

#	Work	Indexed citations
1	Localized thermal effects in Gate-all-around devices 2023 ·Colin Landon, Lei Jiang, Daniel Pantuso, Inanc Meric, K. Komeyli, J. Hicks, (unknown)	5
2	Reliability studies of a 32nm System-on-Chip (SoC) platform technology with 2<inf>nd</inf> generation high-k/metal gate transistors 2011 ·Anisur Rahman, M. Agostinelli, Peng Bai, G. Curello, H. Deshpande, W. Hafez, (unknown), K. Komeyli, Jang Hyeok Park, K. Phoa, C. Tsai, J.-Y. Yeh, Jianzhong Xu	11
3	Reliability studies on a 45nm low power system-on-chip (SoC) dual gate oxide high-k / metal gate (DG HK+MG) technology 2010 ·C. Prasad, Peng Bai, (unknown), W. Hafez, J. Hicks, (unknown), Jyi-Tsong Lin, (unknown), K. Komeyli, R. Kotlyar, K. Mistry, I. Post, C. Tsai	5
4	A 65nm CMOS SOC Technology Featuring Strained Silicon Transistors for RF Applications 2006 ·I. Post, M.S. Akbar, G. Curello, (unknown), W. Hafez, (unknown), K. Komeyli, Jiefeng Lin, N. Lindert, Jang Hyeok Park, J. Rizk, (unknown), C. Tsai, David Yeh, Peng Bai, C.-H. Jan	37
5	Analysis of IC Manufacturing Process Deformations: An Automated Approach Using SRAM Bit Fail Maps 2003 ·Proceedings - International Symposium for Testing and Failure Analysis ·(unknown), Michael Ferdman, W. Maly, K. Komeyli	8
6	Layout analysis to extract open nets caused by systematic failure mechanisms 2003 ·S. Chakravarty, K. Komeyli, (unknown), (unknown), (unknown), (unknown)	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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