C. Tsai

851 total citations
6 papers, 89 citations indexed

About

C. Tsai is a scholar working on Electrical and Electronic Engineering, Condensed Matter Physics and Surfaces, Coatings and Films. According to data from OpenAlex, C. Tsai has authored 6 papers receiving a total of 89 indexed citations (citations by other indexed papers that have themselves been cited), including 6 papers in Electrical and Electronic Engineering, 1 paper in Condensed Matter Physics and 1 paper in Surfaces, Coatings and Films. Recurrent topics in C. Tsai's work include Semiconductor materials and devices (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). C. Tsai is often cited by papers focused on Semiconductor materials and devices (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers) and Advancements in Semiconductor Devices and Circuit Design (4 papers). C. Tsai collaborates with scholars based in United States. C. Tsai's co-authors include Peng Bai, W. Hafez, Jang Hyeok Park, K. Komeyli, G. Curello, C.-H. Jan, I. Post, J. Rizk, C. Prasad and David Yeh and has published in prestigious journals such as .

In The Last Decade

C. Tsai

6 papers receiving 85 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
C. Tsai United States	5	87	5	5	5	4	6	89
K. Komeyli United States	6	72 0.8×	5 1.0×	5 1.0×	5 1.0×	13 3.3×	6	72
C.-H. Jan United States	4	84 1.0×	5 1.0×	11 2.2×	7 1.4×	11 2.8×	6	91
P. Yeh United States	4	126 1.4×	4 0.8×	3 0.6×	2 0.4×	2 0.5×	15	133
H.-E. Wulf Germany	6	110 1.3×	3 0.6×	14 2.8×	4 0.8×	1 0.3×	12	110
R. James United States	2	143 1.6×		5 1.0×	5 1.0×	3 0.8×	3	143
Krishna Sarma India	4	41 0.5×	5 1.0×	3 0.6×	6 1.2×		11	51
M. Rashed United States	6	61 0.7×		13 2.6×	8 1.6×	4 1.0×	19	68
B. Greene United States	5	85 1.0×	1 0.2×	9 1.8×	13 2.6×	3 0.8×	12	88
Yogadissen Andee France	4	50 0.6×	4 0.8×	6 1.2×	1 0.2×		8	50
N. Feilchenfeld United States	8	171 2.0×	1 0.2×	5 1.0×	5 1.0×	6 1.5×	17	174

Countries citing papers authored by C. Tsai

Since Specialization

Citations

This map shows the geographic impact of C. Tsai's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Tsai with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Tsai more than expected).

Fields of papers citing papers by C. Tsai

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Tsai. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Tsai. The network helps show where C. Tsai may publish in the future.

Co-authorship network of co-authors of C. Tsai

This figure shows the co-authorship network connecting the top 25 collaborators of C. Tsai. A scholar is included among the top collaborators of C. Tsai based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. Tsai. C. Tsai is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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6 of 6 papers shown

1.

Prasad, C., Manisha Chahal, Inanc Meric, et al.. (2016). Transistor reliability characterization and comparisons for a 14 nm tri-gate technology optimized for System-on-Chip and foundry platforms. 4B–5. 20 indexed citations

2.

Rahman, Anisur, Peng Bai, G. Curello, et al.. (2013). Reliability studies of a 22nm SoC platform technology featuring 3-D tri-gate, optimized for ultra low power, high performance and high density application. PI.2.1–PI.2.6. 14 indexed citations

3.

Tsai, C., et al.. (2013). E-beam inspection for gap physical defect detection in 28nm CMOS process. 307–309. 2 indexed citations

4.

Rahman, Anisur, M. Agostinelli, Peng Bai, et al.. (2011). Reliability studies of a 32nm System-on-Chip (SoC) platform technology with 2<inf>nd</inf> generation high-k/metal gate transistors. 12. 5D.3.1–5D.3.6. 11 indexed citations

5.

Prasad, C., Peng Bai, W. Hafez, et al.. (2010). Reliability studies on a 45nm low power system-on-chip (SoC) dual gate oxide high-k / metal gate (DG HK+MG) technology. 293–298. 5 indexed citations

6.

Post, I., M.S. Akbar, G. Curello, et al.. (2006). A 65nm CMOS SOC Technology Featuring Strained Silicon Transistors for RF Applications. 1–3. 37 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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