J.T.M. Stevenson

790 citations

93 papers · 603 indexed · h-index 13

Impact in

Electrical and Electronic Engineering top 10%
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Photolithography Techniques
- Electrowetting and Microfluidic Technologies
- Semiconductor materials and devices
- Advanced MEMS and NEMS Technologies
Surfaces, Coatings and Films top 10%

Papers in

Surfaces, Coatings and Films 13
- Electron and X-Ray Spectroscopy Techniques 9
Electrical and Electronic Engineering 81
- Advancements in Photolithography Techniques 30
- Integrated Circuits and Semiconductor Failure Analysis 28
- Semiconductor materials and devices 17
- Advanced MEMS and NEMS Technologies 15
- Electronic Packaging and Soldering Technologies 11

Co-authors: A.J. Walton Stewart Smith A.M. Gundlach Jonathan G. Terry Martin McCallum Andrew C. Hourd L. Haworth William Parkes
Journals: IEEE Transactions on Semiconductor Manufacturing (17 papers)IEEE Transactions on Device and Materials Reliability (3 papers)IET Nanobiotechnology (2 papers)Microelectronic Engineering (2 papers)Electronics Letters (2 papers)
Partner nations: United Kingdom United States Belgium

In The Last Decade

J.T.M. Stevenson

82 papers receiving 581 citations

Peers

Countries citing papers authored by J.T.M. Stevenson

Since Specialization

Citations

This map shows the geographic impact of J.T.M. Stevenson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.T.M. Stevenson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.T.M. Stevenson more than expected).

Fields of papers citing papers by J.T.M. Stevenson

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.T.M. Stevenson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.T.M. Stevenson. The network helps show where J.T.M. Stevenson may publish in the future.

Co-authorship network

The 25 scholars most cited alongside J.T.M. Stevenson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.T.M. Stevenson Line = papers co-authored together J.T.M. Stevenson links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	Fabrication and Measurement of Test Structures to Monitor Stress in SU-8 Films IEEE Transactions on Semiconductor Manufacturing ·Stewart Smith, Kisung Lee, Muhamad Taufik Fadhilah, Giuseppe Schiavone, Christopher J. Wilson, Alton B. Horsfall, Jonathan G. Terry, J.T.M. Stevenson, Andrew R. Mount, A.J. Walton	2012	11
2	Fabrication of test structures to monitor stress in SU-8 films used for MEMS applications Stewart Smith, Kisung Lee, Muhamad Taufik Fadhilah, Christopher J. Wilson, Alton B. Horsfall, Jonathan G. Terry, J.T.M. Stevenson, Andrew R. Mount, A.J. Walton	2010	3
3	Application of Matching Structures to Identify the Source of Systematic Dimensional Offsets in GHOST Proximity Corrected Photomasks Discovery Research Portal (University of Dundee) ·Stewart Smith, Andreas Tsiamis, Martin McCallum, Andrew C. Hourd, J.T.M. Stevenson, A.J. Walton	2009	1
4	Comparison of measurement techniques for advanced photomask metrology Discovery Research Portal (University of Dundee) ·Stewart Smith, Andreas Tsiamis, Martin McCallum, Andrew C. Hourd, J.T.M. Stevenson, A.J. Walton, Ronald G. Dixson, Richard A. Allen, Benjamin Cornier, M.W. Cresswell, Ndubuisi G. Orji	2008	2
5	An evaluation of test structures for measuring the contact resistance of 3-D bonded interconnects Huamao Lin, Stewart Smith, J.T.M. Stevenson, A.M. Gundlach, Camelia Dunare, A.J. Walton	2008	11
6	Direct Measurement of Electromigration-Induced Stress in Interconnect Structures IEEE Transactions on Device and Materials Reliability ·Christopher J. Wilson, Alton B. Horsfall, A.G. O’Neill, Nicolas G. Wright, S.J. Bull, Jonathan G. Terry, J.T.M. Stevenson, A.J. Walton	2007	9
7	Development of Eectrilcal On-Mask CD Test Structures Based on Optical Metrology Features Andreas Tsiamis, Stewart Smith, Martin McCallum, Andrew C. Hourd, Roth Vs, J.T.M. Stevenson, A.J. Walton	2007	9
8	Design and fabrication of a copper test structure for use as an electrical critical dimension reference MANJIT SINGH, MONG-FONG HORNG, CHUN-CHIH LO, D.VETRITHANGAM, SIVA SHANKAR, Levente Nagy, A.M. Gundlach, L. Haworth, Natalya N. Sizova, A.J. Snell, J.T.M. Stevenson, A.J. Walton, Richard A. Allen, M.W. Cresswell	2006	4
9	Implementation of a wireless power transfer and communications system for an implantable drug delivery system Tong Tang, Duanhong Song, Brian Flynn, J.T.M. Stevenson, A.M. Gundlach, H. Martin Reekie, Alan F. Murray, D. Renshaw, B. Dhillon, Akira Ohtori, Yusuke Inoue, Jonathan G. Terry, A.J. Walton	2006	3
10	Application of CMP for Integrating MEMS and CMOS Technology Nhi T T T, J.T.M. Stevenson, A.M. Gundlach, Camelia Dunare, A.J. Walton	2005	3
11	An Objective Method Of Assessing Metal Patterning Quality J.T.M. Stevenson, Jeff Gow, Amy Yocum	2005	0
12	Design and fabrication of the detector technology for SCUBA-2 IEE Proceedings - Science Measurement and Technology ·A.J. Walton, William Parkes, Jonathan G. Terry, Camelia Dunare, J.T.M. Stevenson, A.M. Gundlach, Nurmini Huzaimah, K. D. Irwin, Joel N. Ullom, W. S. Holland, William Duncan, Michael D. Audley, P. A. R. Ade, R. Sudiwala, Eric Schulte	2004	9
13	Design Rules to Minimize the Effect of Joule Heating in Greek Cross Test Structures IEEE Transactions on Semiconductor Manufacturing ·V. Dubenskyy, Andi Anugrah Saputra, Stewart Smith, J.T.M. Stevenson, A.J. Walton	2004	5
14	Test structures to characterise a novel circuit fabrication technique that uses offset lithography Brunel University Research Archive (BURA) (Brunel University London) ·A.J. Walton, J.T.M. Stevenson, Marie Fallon, P.S.A. Evans, B.J. Ramsey, David J. Harrison	2002	4
15	Wire-segment holographic test structures for statistical interconnect metrology iliedom, J.T.M. Stevenson, P. Christie, A.J. Walton	2002	1
16	<title>Microfabrication and packaging of deformable mirror devices</title> Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Natalya N. Sizova, Stephen C. Graham, A.M. Gundlach, J.T.M. Stevenson, W.J. Hossack, D.G. Vass, Gardner de Andrade Arrais, Elena N. Waidmann, Kevin R. Ward	2000	1
17	Investigation of novel structures on silicon backplane SLMs TA Redaktionen, Gardner de Andrade Arrais, D. J. Quattrochi, D.G. Vass, Heong Won Jeon, K. Seunarine, أحمد المغاوري مروان, Ian Underwood, J.T.M. Stevenson	1997	1
18	Fabrication of 200 nm field effect transistor byX-ray lithography with a laser-plasmaX-ray source Electronics Letters ·Aşkın Çelikkol, I. C. E. Turcu, Philip D. Prewett, A.M. Gundlach, J.T.M. Stevenson, A.J. Walton, Natalya N. Sizova, M. L. Green, Shunxin Min, R. E. Burge, Paul Mitchell	1995	2
19	A new improved electrical vernier to measure mask misalignment European Solid-State Device Research Conference ·D. John Morrow, A.J. Walton, A K Tripathi, Marie Fallon, J.T.M. Stevenson, I. Bediaga	1990	0
20	Wafer Scale Etch Assessment Using Single Layer Test Patterns I. Bediaga, J.T.M. Stevenson, A.J. Walton, J. M. Robertson	1986	2

About J.T.M. Stevenson

J.T.M. Stevenson is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering and Mechanics of Materials, having authored 93 papers that have together received 603 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (30 papers), Integrated Circuits and Semiconductor Failure Analysis (28 papers), Advanced Surface Polishing Techniques (21 papers), Semiconductor materials and devices (17 papers), Advanced MEMS and NEMS Technologies (15 papers), Copper Interconnects and Reliability (12 papers), Electronic Packaging and Soldering Technologies (11 papers) and Electron and X-Ray Spectroscopy Techniques (9 papers). The work is most often cited by research in Electrical and Electronic Engineering (502 citations), Surfaces, Coatings and Films (58 citations), Biomedical Engineering (264 citations), Electronic, Optical and Magnetic Materials (68 citations) and Hardware and Architecture (23 citations). J.T.M. Stevenson has collaborated with scholars based in United Kingdom, United States and Belgium. Frequent co-authors include A.J. Walton, Stewart Smith, A.M. Gundlach, Jonathan G. Terry, Martin McCallum, Andrew C. Hourd, L. Haworth, William Parkes, Yifan Li and Alton B. Horsfall. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Device and Materials Reliability, IET Nanobiotechnology, Microelectronic Engineering and Electronics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact