Alok Ranjan

1.2k total citations · 1 hit paper
75 papers, 992 citations indexed

About

Alok Ranjan is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Alok Ranjan has authored 75 papers receiving a total of 992 indexed citations (citations by other indexed papers that have themselves been cited), including 58 papers in Electrical and Electronic Engineering, 22 papers in Materials Chemistry and 12 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Alok Ranjan's work include Semiconductor materials and devices (43 papers), Plasma Diagnostics and Applications (18 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Alok Ranjan is often cited by papers focused on Semiconductor materials and devices (43 papers), Plasma Diagnostics and Applications (18 papers) and Integrated Circuits and Semiconductor Failure Analysis (11 papers). Alok Ranjan collaborates with scholars based in Singapore, United States and Japan. Alok Ranjan's co-authors include Peter L. G. Ventzek, Virendra Pratap Singh, Basil Kuriachen, Surendra Kumar Patel, K. L. Pey, Nagarajan Raghavan, S. J. O’Shea, K. Shubhakar, Michel Bosman and Vincent M. Donnelly and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Alok Ranjan

68 papers receiving 940 citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

Recent research progress in solid state friction-stir welding of aluminium–magnesium alloys: a critical review

2020 210 citations Alok Ranjan et al. profile →

Peers

Alok Ranjan

EEE

Wenjin Yang China

John Osenbach United States

Changyong Chen China

K. Ma Taiwan

Jiahao Yu China

Zhenqiang Ma United States

Srilok Srinivasan United States

Dinh-Phuc Tran Taiwan

Minghuang Huang United States

Ruifeng Yue China

Wenjin Yang China

Alok Ranjan

492 ×0.8

EEE

475 ×1.3

169 ×0.7

95 ×0.8

115 ×1.1

Citations per year, relative to Alok Ranjan Alok Ranjan (= 1×) peers Wenjin Yang

Countries citing papers authored by Alok Ranjan

Since Specialization

Citations

This map shows the geographic impact of Alok Ranjan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alok Ranjan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alok Ranjan more than expected).

Fields of papers citing papers by Alok Ranjan

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alok Ranjan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alok Ranjan. The network helps show where Alok Ranjan may publish in the future.

Co-authorship network of co-authors of Alok Ranjan

This figure shows the co-authorship network connecting the top 25 collaborators of Alok Ranjan. A scholar is included among the top collaborators of Alok Ranjan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alok Ranjan. Alok Ranjan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

Zograf, George, Betül Küçüköz, Alexander Yu. Polyakov, et al.. (2025). Ultrathin 3R-MoS2 metasurfaces with atomically precise edges for efficient nonlinear nanophotonics. Communications Physics. 8(1). 5 indexed citations

Padovani, Andrea, Paolo La Torraca, Fernando Aguirre, et al.. (2025). Microscopic Analysis of Degradation and Breakdown Kinetics in HfO₂ Gate Dielectric after Ions Irradiation. ACS Applied Materials & Interfaces. 17(37). 52814–52825.

Zanotti, Tommaso, Alok Ranjan, S. J. O’Shea, et al.. (2024). Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators. IEEE Transactions on Device and Materials Reliability. 24(2). 184–193. 5 indexed citations

Ranjan, Alok, et al.. (2024). Estimating the Number of Defects in a Single Breakdown Spot of a Gate Dielectric. IEEE Electron Device Letters. 45(5). 809–812. 2 indexed citations

Yankovich, Andrew B., et al.. (2023). Convolution Neural Networks and Position Averaged Convergent Beam Electron Diffraction for Determining the Structure of 2D Materials. Microscopy and Microanalysis. 29(Supplement_1). 691–693. 1 indexed citations

Ranjan, Alok, Andrew B. Yankovich, Kenji Watanabe, Takashi Taniguchi, & Eva Olsson. (2023). Probing Dielectric Breakdown in Single Crystal Hexagonal Boron Nitride. Microscopy and Microanalysis. 29(Supplement_1). 1998–2000. 2 indexed citations

Ranjan, Alok, Hejun Xu, Chaolun Wang, et al.. (2023). Probing resistive switching in HfO2/Al2O3 bilayer oxides using in-situ transmission electron microscopy. Applied Materials Today. 31. 101739–101739. 9 indexed citations

Ranjan, Alok, et al.. (2023). Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces. ACS Applied Electronic Materials. 5(9). 5176–5186. 2 indexed citations

Ranjan, Alok, Francesco Maria Puglisi, Joel Molina‐Reyes, et al.. (2022). Spatially Controlled Generation and Probing of Random Telegraph Noise in Metal Nanocrystal Embedded HfO₂ Using Defect Nanospectroscopy. ACS Applied Electronic Materials. 4(8). 3909–3921. 6 indexed citations

10.

Ranjan, Alok, Leeladhar Nagdeve, Harish Kumar, & Abhishek Mishra. (2022). Tribological Performance of Aluminium Metal Matrix Hybrid Composites. MAPAN. 37(4). 845–858. 1 indexed citations

11.

Longo, Roberto C., H. Ueda, Kyeongjae Cho, Alok Ranjan, & Peter L. G. Ventzek. (2022). Mechanisms for Graphene Growth on SiO₂ Using Plasma-Enhanced Chemical Vapor Deposition: A Density Functional Theory Study. ACS Applied Materials & Interfaces. 14(7). 9492–9503. 9 indexed citations

12.

Ranjan, Alok, Nagarajan Raghavan, Matthew Holwill, et al.. (2021). Dielectric Breakdown in Single-Crystal Hexagonal Boron Nitride. ACS Applied Electronic Materials. 3(8). 3547–3554. 46 indexed citations

13.

Ranjan, Alok, S. J. O’Shea, Michel Bosman, Nagarajan Raghavan, & K. L. Pey. (2020). Localized Probing of Dielectric Breakdown in Multilayer Hexagonal Boron Nitride. ACS Applied Materials & Interfaces. 12(49). 55000–55010. 16 indexed citations

14.

Chen, Zhiying, et al.. (2020). Factors influencing ion energy distributions in pulsed inductively coupled argon plasmas. Journal of Physics D Applied Physics. 53(33). 335202–335202. 4 indexed citations

15.

Longo, Roberto C., Peter L. G. Ventzek, Barton Lane, et al.. (2020). Interaction of oxygen with polystyrene and polyethylene polymer films: A mechanistic study. Journal of Applied Physics. 127(2). 22 indexed citations

16.

Ranjan, Alok, K. L. Pey, & S. J. O’Shea. (2019). The interplay between drift and electrical measurement in conduction atomic force microscopy. Review of Scientific Instruments. 90(7). 73701–73701. 7 indexed citations

17.

Ranjan, Alok, Nagarajan Raghavan, Francesco Maria Puglisi, et al.. (2019). Boron Vacancies Causing Breakdown in 2D Layered Hexagonal Boron Nitride Dielectrics. IEEE Electron Device Letters. 40(8). 1321–1324. 20 indexed citations

18.

Ranjan, Alok, Om Prakash Tiwari, & Anil Kumar Yadav. (2018). An experiment of improvement in solar panel efficiency using solar concentration by number of mirrors. International journal of advance research, ideas and innovations in technology. 4(3). 2227–2233.

19.

Ranjan, Alok, Nagarajan Raghavan, S. J. O’Shea, et al.. (2018). Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films. Scientific Reports. 8(1). 64 indexed citations

20.

Puglisi, Francesco Maria, Alok Ranjan, Nagarajan Raghavan, et al.. (2017). Localized characterization of charge transport and random telegraph noise at the nanoscale in HfO2 films combining scanning tunneling microscopy and multi-scale simulations. Journal of Applied Physics. 122(2). 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact