L. Haworth

436 total citations
35 papers, 379 citations indexed

About

L. Haworth is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanical Engineering. According to data from OpenAlex, L. Haworth has authored 35 papers receiving a total of 379 indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Electrical and Electronic Engineering, 8 papers in Atomic and Molecular Physics, and Optics and 8 papers in Mechanical Engineering. Recurrent topics in L. Haworth's work include Semiconductor materials and devices (13 papers), Electrowetting and Microfluidic Technologies (9 papers) and Modular Robots and Swarm Intelligence (7 papers). L. Haworth is often cited by papers focused on Semiconductor materials and devices (13 papers), Electrowetting and Microfluidic Technologies (9 papers) and Modular Robots and Swarm Intelligence (7 papers). L. Haworth collaborates with scholars based in United Kingdom, United States and Japan. L. Haworth's co-authors include D.I. Westwood, J. Emyr Macdonald, R. D. Tomlinson, Yifan Li, A.J. Walton, William Parkes, Jing‐Tao Lü, J.T.M. Stevenson, Jun Lu and M.J. Hampshire and has published in prestigious journals such as Applied Physics Letters, Applied Surface Science and Thin Solid Films.

In The Last Decade

L. Haworth

35 papers receiving 363 citations

Peers

L. Haworth

EEE

CMP

Emil V. Jelenković Hong Kong

Kazuhiko Tsutsumi Japan

Joshua D. Sulkin United States

M. H. Hong United States

Tommi Suni Finland

Lachlan Smillie Australia

A Stoffel Germany

Mariusz Sochacki Poland

C. Deguet France

P. Nagarkar United States

Emil V. Jelenković Hong Kong

L. Haworth

344 ×1.1

EEE

137 ×1.0

223 ×2.1

58 ×0.6

35 ×0.5

CMP

Citations per year, relative to L. Haworth L. Haworth (= 1×) peers Emil V. Jelenković

Countries citing papers authored by L. Haworth

Since Specialization

Citations

This map shows the geographic impact of L. Haworth's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Haworth with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Haworth more than expected).

Fields of papers citing papers by L. Haworth

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Haworth. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Haworth. The network helps show where L. Haworth may publish in the future.

Co-authorship network of co-authors of L. Haworth

This figure shows the co-authorship network connecting the top 25 collaborators of L. Haworth. A scholar is included among the top collaborators of L. Haworth based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Haworth. L. Haworth is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Li, Yifan, Yongqing Fu, Brian Flynn, et al.. (2012). Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics. IEEE Transactions on Semiconductor Manufacturing. 25(3). 323–330. 5 indexed citations

Li, Yifan, Yongqing Fu, Brian Flynn, et al.. (2010). Proceedings of the IEEE InternationalConference on Microelectronic Test Structures (ICMTS10). 3 indexed citations

Li, Yifan, Yongqing Fu, Brian Flynn, et al.. (2010). Test structures for characterising the integration of EWOD and SAW technologies for microfluidics. 12. 52–57. 5 indexed citations

Li, Yifan, Brian Flynn, William Parkes, et al.. (2009). ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference. 3 indexed citations

Donnelly, S. E., et al.. (2009). A study of defect evolution in multi‐energy helium implanted monocrystalline and polycrystalline silicon. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 6(8). 1964–1968. 2 indexed citations

Gundlach, A.M., L. Haworth, Stewart Smith, et al.. (2007). IEEE International Conference on Microelectronic Test Structures 2007. 2 indexed citations

Alquier, Daniel, et al.. (2007). Modification of He implantation induced defects using fluorine co-implantation. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 257(1-2). 240–243. 1 indexed citations

Gundlach, A.M., L. Haworth, Stewart Smith, et al.. (2007). Extraction of Sheet Resistance and Linewidth from All-Copper ECD Test Structures Fabricated from Silicon Preforms. 13. 14–19. 1 indexed citations

Gundlach, A.M., L. Haworth, A.J. Snell, et al.. (2006). Design and fabrication of a copper test structure for use as an electrical critical dimension reference. 43. 124–129. 4 indexed citations

10.

Emeny, M. T., S.A. Hareland, L. Haworth, et al.. (2004). Ultra high speed, very low power InSbb-based quantum well FETs for logic applications. 196–197. 3 indexed citations

11.

Vishnyakov, Vladimir, et al.. (2002). E-MRS Spring Meeting - June 2002. 1 indexed citations

12.

Haworth, L., et al.. (2002). Semiconductor teaching chips. 19–20. 2 indexed citations

13.

Vishnyakov, Vladimir, S. E. Donnelly, G. Carter, R. C. Birtcher, & L. Haworth. (2001). Helium Bubble Growth in Silicon: Ripening or Bubble Motion and Coalescence?. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 82-84. 267–272. 6 indexed citations

14.

Haworth, L., Jun Lu, D.I. Westwood, & J. Emyr Macdonald. (2000). Atomic hydrogen cleaning, nitriding and annealing InSb (100). Applied Surface Science. 166(1-4). 253–258. 18 indexed citations

15.

Lü, Jing‐Tao, et al.. (1998). An XPS study of the effect of nitrogen exposure time and temperature on the GaAs(001) surface using atomic nitrogen. Applied Surface Science. 123-124. 126–130. 10 indexed citations

16.

Westwood, D.I., et al.. (1997). Nitridation of the GaAs (001) surface using atomic nitrogen. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 15(4). 1133–1138. 32 indexed citations

17.

Haworth, L. & R. D. Tomlinson. (1988). Crystal Data for CuInTe ₂. Powder Diffraction. 3(1). 43–46. 4 indexed citations

18.

Bello, I., et al.. (1985). Gas trapping induced by argon implantation and irradiation of polymer films. Radiation Effects. 89(3-4). 189–204. 12 indexed citations

19.

Tomlinson, R. D., et al.. (1980). The growth and doping of single crystals of CuInTe2. Journal of Crystal Growth. 49(1). 115–119. 26 indexed citations

20.

Haworth, L., et al.. (1980). Growth and Characterization of CuInTe₂ Single Crystals. Japanese Journal of Applied Physics. 19(S3). 77–77. 21 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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