This map shows the geographic impact of A.J. Walton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.J. Walton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.J. Walton more than expected).
This network shows the impact of papers produced by A.J. Walton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.J. Walton. The network helps show where A.J. Walton may publish in the future.
Co-authorship network of co-authors of A.J. Walton
This figure shows the co-authorship network connecting the top 25 collaborators of A.J. Walton.
A scholar is included among the top collaborators of A.J. Walton based on the total number of
citations received by their joint publications. Widths of edges
represent the number of papers authors have co-authored together.
Node borders
signify the number of papers an author published with A.J. Walton. A.J. Walton is excluded from
the visualization to improve readability, since they are connected to all nodes in the network.
Li, Yifan, Yongqing Fu, Brian Flynn, et al.. (2010). Proceedings of the IEEE InternationalConference on Microelectronic Test Structures (ICMTS10).3 indexed citations
12.
Gundlach, A.M., L. Haworth, Stewart Smith, et al.. (2007). IEEE International Conference on Microelectronic Test Structures 2007.2 indexed citations
Smith, Stewart, et al.. (2003). ICMTS 2003: PROCEEDINGS OF THE 2003 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES.1 indexed citations
15.
Walton, A.J.. (1999). Characterisation of Offset Lithographic Films Using Microelectronic Test Structures. IEICE Transactions on Electronics. 82(4). 576–581.9 indexed citations
Walton, A.J., et al.. (1995). The Automatic Generation of Conformal 3D data for Simulation of IC Interconnect Parasitics and Representation of MEM Structures. European Solid-State Device Research Conference. 405–408.1 indexed citations
18.
Walton, A.J., et al.. (1994). Using RSM Techniques to Contour Plot Response Distributions of Semiconductor Processes. European Solid-State Device Research Conference. 829–832.2 indexed citations
19.
Morrow, D. John, et al.. (1990). A new improved electrical vernier to measure mask misalignment. European Solid-State Device Research Conference. 85–88.
20.
Walton, A.J., et al.. (1987). The effect of device geometry on IGFET characteristics. European Solid-State Device Research Conference. 915–918.2 indexed citations
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive
bibliographic database. While OpenAlex provides broad and valuable coverage of the global
research landscape, it—like all bibliographic datasets—has inherent limitations. These include
incomplete records, variations in author disambiguation, differences in journal indexing, and
delays in data updates. As a result, some metrics and network relationships displayed in
Rankless may not fully capture the entirety of a scholar's output or impact.