D.W. Berning

2.1k citations

73 papers · 1.6k indexed · h-index 23

Electrical and Electronic Engineering top 2%
- Silicon Carbide Semiconductor Technologies 51
- Semiconductor materials and devices 17
- Electromagnetic Compatibility and Noise Suppression 16
- Electrostatic Discharge in Electronics 15
- Advancements in Semiconductor Devices and Circuit Design 14
- Silicon and Solar Cell Technologies 10
- Integrated Circuits and Semiconductor Failure Analysis 8
- Advanced DC-DC Converters 7
Bioengineering top 5%
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Biomedical Engineering

Co-authors: Allen R. Hefner Ty McNutt Ranbir Singh Sei‐Hyung Ryu Jih‐Sheng Lai H. Alan Mantooth D.L. Blackburn S. Semancik
Cited by: Electrical and Electronic Engineering Bioengineering Atomic and Molecular Physics, and Optics
Journals: IEEE Transactions on Industry Applications (3 papers)Proceedings of the IEEE (3 papers)Solid-State Electronics (3 papers)
Partner nations: United States Egypt Puerto Rico

In The Last Decade

D.W. Berning

73 papers receiving 1.5k citations

Peers

Countries citing papers authored by D.W. Berning

Since Specialization

Citations

This map shows the geographic impact of D.W. Berning's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D.W. Berning with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D.W. Berning more than expected).

Fields of papers citing papers by D.W. Berning

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D.W. Berning. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D.W. Berning. The network helps show where D.W. Berning may publish in the future.

Co-authorship network

The 25 scholars most cited alongside D.W. Berning, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D.W. Berning Line = papers co-authored together D.W. Berning links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	Electro-thermal simulation of 1200 V 4H-SiC MOSFET short-circuit SOA Chung-Kyung Lee,R B Morrison,D.W. Berning,Allen R. Hefner,Sei‐Hyung Ryu,John W. Palmour	2015	30
2	Comparison of 4.5 kV SiC JBS and Si PiN diodes for 4.5 kV Si IGBT anti-parallel diode applications Liu Xiangge,Allen R. Hefner,Karl D. Hobart,Sei‐Hyung Ryu,David Grider,D.W. Berning,Jose M. Ortiz-Rodriguez,Eugene A. Imhoff,Grütter Ghisi	2011	24
3	Recent Advances in High-Voltage, High-Frequency Silicon-Carbide Power Devices Conference record ·Allen R. Hefner,Sei‐Hyung Ryu,Brett Hull,D.W. Berning,Ecenur Korkmaz,Jose M. Ortiz-Rodriguez,Woraruthai Choothian,Liu Xiangge,S. Liu,А. Наимов	2006	50
4	Generalized Test Bed for High-Voltage, High-Power SiC Device Characterization D.W. Berning,Allen R. Hefner,Jose M. Ortiz-Rodriguez,Ecenur Korkmaz,د امينه الابيض	2006	5
5	Physics-based modeling and characterization for silicon carbide power diodes Solid-State Electronics ·Ty McNutt,Allen R. Hefner,H. Alan Mantooth,Santosh Varuhghese,D.W. Berning,Ranbir Singh	2006	11
6	Six-pack IGBT dynamic electro-thermal model: parameter extraction and validation faried hamam,D.W. Berning,Allen R. Hefner,Jih‐Sheng Lai	2004	12
7	Silicon carbide power MOSFET model and parameter extraction sequence Ty McNutt,Allen R. Hefner,Alan Mantooth,D.W. Berning,Sei‐Hyung Ryu	2004	42
8	Parameter extraction sequence for silicon carbide schottky, merged PiN Schottky, and PiN power diode models Ty McNutt,Allen R. Hefner,H. Alan Mantooth,Santosh Varuhghese,D.W. Berning,Ranbir Singh	2003	18
9	A computer-based system for validation of thermal models for multichip power modules Edmondo Peluso,F Azouvi,Allen R. Hefner,Miguel Vélez-Reyes,D.W. Berning	2003	4
10	Characterization of paralleled super junction MOSFET devices under hardand soft-switching conditions Xudong Huang,Kum Sook Park,Jih‐Sheng Lai,Allen R. Hefner,D.W. Berning	2002	26
11	An automated reverse-bias second-breakdown transistor tester Zenodo (CERN European Organization for Nuclear Research) ·D.W. Berning	2002	1
12	Experimental study of reverse-bias failure mechanisms in bipolar mode JFET (BMFET) G. Busatto,D.L. Blackburn,D.W. Berning	2002	2
13	Issues in validating package compact thermal models for natural convection cooled electronic systems Dave Cheshire,D.L. Blackburn,Yogendra Joshi,D.W. Berning	2002	18
14	IGBT half-bridge shoot-through characterization for model validation D.W. Berning,Allen R. Hefner	2002	2
15	Characteristics and utilization of a new class of low on-resistance MOS-gated power device IEEE Transactions on Industry Applications ·Jih‐Sheng Lai,Fadli .,Ehsan M. Nasroullahi,Allen R. Hefner,D.W. Berning,Zhu Zheng-chao	2001	22
16	Characteristics and Utilization of a New Class of Low On-Resistance MOS-Gated Power Device \| NIST Jih‐Sheng Lai,D.W. Berning,Allen R. Hefner,Chien-Chung Shen,Bai Song,Ruguang Zhou	1999	18
17	Scanning Capacitance Microscopy Measurement of 2-D Dopant Profiles across Junctions Journal of Vacuum Science and Technology ·Joseph J. Kopanski,J. F. Marchiando,D.W. Berning,Roger Alvis,H. E. SMITH	1997	2
18	Semiconductor Measurement Technology: A Programmable Reverse-Bias Safe Operating Area Transistor Tester D.W. Berning	1990	7
19	Semiconductor measurement technology: A reverse-bias safe operating area transistor tester Final Report ·D.W. Berning	1979	9
20	Thermal mapping of transistors with a laser scanner Proceedings of the IEEE ·B Gvarishvili,D.W. Berning	1976	6

About D.W. Berning

D.W. Berning is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture, Instrumentation and Mechanical Engineering, having authored 73 papers that have together received 1.6k indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (51 papers), Semiconductor materials and devices (17 papers), Electromagnetic Compatibility and Noise Suppression (16 papers), Electrostatic Discharge in Electronics (15 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Silicon and Solar Cell Technologies (10 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers) and Advanced DC-DC Converters (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Bioengineering (108 citations), Atomic and Molecular Physics, and Optics (155 citations), Condensed Matter Physics (53 citations) and Biomedical Engineering (176 citations). D.W. Berning has collaborated with scholars based in United States, Egypt and Puerto Rico. Frequent co-authors include Allen R. Hefner, Ty McNutt, Ranbir Singh, Sei‐Hyung Ryu, Jih‐Sheng Lai, H. Alan Mantooth, D.L. Blackburn, S. Semancik, David L. Blackburn and John S. Suehle. Their work appears in journals such as IEEE Transactions on Industry Applications, Proceedings of the IEEE, Solid-State Electronics, IEEE Transactions on Power Electronics and IEEE Transactions on Electron Devices.

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