G. Neubauer

1.3k total citations
30 papers, 950 citations indexed

About

G. Neubauer is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, G. Neubauer has authored 30 papers receiving a total of 950 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Atomic and Molecular Physics, and Optics, 15 papers in Electrical and Electronic Engineering and 10 papers in Materials Chemistry. Recurrent topics in G. Neubauer's work include Force Microscopy Techniques and Applications (11 papers), Diamond and Carbon-based Materials Research (6 papers) and Metal and Thin Film Mechanics (5 papers). G. Neubauer is often cited by papers focused on Force Microscopy Techniques and Applications (11 papers), Diamond and Carbon-based Materials Research (6 papers) and Metal and Thin Film Mechanics (5 papers). G. Neubauer collaborates with scholars based in United States, Germany and Israel. G. Neubauer's co-authors include Gary M. McClelland, Sidney Cohen, William D. Nix, Paul A. Flinn, D. Frank Ogletree, Miquel Salmerón, Albert Folch, Masahiko Tomitori, C. Mathew Mate and Don Horne and has published in prestigious journals such as Journal of Applied Physics, Langmuir and The Journal of Physical Chemistry.

In The Last Decade

G. Neubauer

30 papers receiving 915 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
G. Neubauer United States 13 614 410 315 263 213 30 950
Ch. Loppacher Switzerland 13 1.1k 1.8× 532 1.3× 387 1.2× 274 1.0× 392 1.8× 22 1.3k
Stephen Berkebile United States 16 368 0.6× 607 1.5× 365 1.2× 162 0.6× 197 0.9× 42 1.1k
J. David Schall United States 17 377 0.6× 143 0.3× 742 2.4× 368 1.4× 165 0.8× 38 1.0k
Ahmet Oral Türkiye 19 919 1.5× 448 1.1× 286 0.9× 74 0.3× 296 1.4× 70 1.3k
H. Sternschulte Germany 19 583 0.9× 334 0.8× 1.2k 3.9× 363 1.4× 213 1.0× 36 1.4k
Joachim Ahner United States 18 374 0.6× 268 0.7× 338 1.1× 56 0.2× 163 0.8× 42 689
Bert Stegemann Germany 19 368 0.6× 717 1.7× 581 1.8× 71 0.3× 161 0.8× 69 1.1k
V. Yu. Yurov Russia 17 332 0.5× 221 0.5× 482 1.5× 197 0.7× 195 0.9× 47 758
Irina V. Lebedeva Russia 21 429 0.7× 270 0.7× 1.1k 3.4× 64 0.2× 136 0.6× 69 1.3k
J.E. Bourée France 17 166 0.3× 616 1.5× 720 2.3× 198 0.8× 142 0.7× 89 1.1k

Countries citing papers authored by G. Neubauer

Since Specialization
Citations

This map shows the geographic impact of G. Neubauer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Neubauer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Neubauer more than expected).

Fields of papers citing papers by G. Neubauer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Neubauer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Neubauer. The network helps show where G. Neubauer may publish in the future.

Co-authorship network of co-authors of G. Neubauer

This figure shows the co-authorship network connecting the top 25 collaborators of G. Neubauer. A scholar is included among the top collaborators of G. Neubauer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Neubauer. G. Neubauer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Erickson, Andrew, et al.. (1996). Quantitative scanning capacitance microscopy analysis of two-dimensional dopant concentrations at nanoscale dimensions. Journal of Electronic Materials. 25(2). 301–304. 25 indexed citations
2.
Neubauer, G., Andrew Erickson, C. C. Williams, et al.. (1996). Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(1). 426–432. 64 indexed citations
3.
Hack, Mike, et al.. (1994). Mechanical properties and adhesion measurements of films used in advanced packages. 108–113. 2 indexed citations
4.
Pan, Shijie, et al.. (1993). Reaction of DI water and silicon and its effect on gate oxide integrity. 90 9. 28–31. 4 indexed citations
5.
Germann, Geoffrey J., Sidney Cohen, G. Neubauer, et al.. (1993). Atomic scale friction of a diamond tip on diamond (100) and (111) surfaces. Journal of Applied Physics. 73(1). 163–167. 85 indexed citations
6.
Hoffmann, H., et al.. (1993). Transient small-angle neutron scattering experiments on micellar solutions with a shear-induced structural transition. The Journal of Physical Chemistry. 97(17). 4514–4522. 17 indexed citations
7.
Neubauer, G., et al.. (1992). Imaging VLSI cross sections by atomic force microscopy. 73. 299–303. 4 indexed citations
8.
Chiang, Chien, et al.. (1992). Hardness and Modulus Studies on Dielectric Thin Films. MRS Proceedings. 265(1). 219–230. 9 indexed citations
9.
Neubauer, G., et al.. (1992). Imaging VLSI Cross Sections by Atomic Force Microscopy. MRS Proceedings. 265(1). 283–288. 6 indexed citations
10.
Salmerón, Miquel, D. Frank Ogletree, Carmen Ocal, et al.. (1991). Tip-surface forces during imaging by scanning tunneling microscopy. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 9(2). 1347–1352. 48 indexed citations
11.
Neubauer, G., Sidney Cohen, Gary M. McClelland, & H. Seki. (1990). Nanotribology of Diamond Films Studied by Atomic Force Microscopy. MRS Proceedings. 188. 1 indexed citations
12.
Neubauer, G., Sidney Cohen, Gary M. McClelland, Don Horne, & C. Mathew Mate. (1990). Force microscopy with a bidirectional capacitance sensor. Review of Scientific Instruments. 61(9). 2296–2308. 118 indexed citations
13.
Cohen, Sidney, G. Neubauer, & Gary M. McClelland. (1990). Nanomechanics of a Au–Ir contact using a bidirectional atomic force microscope. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(4). 3449–3454. 62 indexed citations
14.
Neubauer, G., Sidney Cohen, & Gary M. McClelland. (1989). Measurement of Micromechanical Properties Using Atomic Force Microscope with Capacitative. MRS Proceedings. 153. 2 indexed citations
15.
Kalus, J., et al.. (1988). Transient SANS studies of rodlike micelles on a time scale of 100 ms. Journal of Applied Crystallography. 21(6). 777–780. 7 indexed citations
16.
Neubauer, G., Ludolf Herbst, H. Hoffmann, K. Ibel, & J. Kalus. (1988). The Transient Alignment of Rodlike Micelles in a Shear Gradient. Materials science forum. 27-28. 147–150. 2 indexed citations
17.
Heidberg, J., et al.. (1987). Laser-induced resonant ablation of molecular solids on carbon films: time of flight spectra as a function of coverage and fluence. Journal of Electron Spectroscopy and Related Phenomena. 45. 249–260. 6 indexed citations
18.
Heidberg, J., et al.. (1987). Laser-induced resonant desorption and ablation on ultra-thin carbon films. Surface Science. 189-190. 946–953. 8 indexed citations
19.
Neubauer, G., et al.. (1986). The shape of hexadecyloctyldimethylammoniumbromide micelles in aqueous solutions. Chemical Physics. 110(2-3). 247–253. 9 indexed citations
20.
Haul, R., et al.. (1982). Ethene epoxidation on silver oxide surface layers. Surface Science. 122(2). L622–L628. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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