D. Adderton

662 total citations
12 papers, 519 citations indexed

About

D. Adderton is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering and Electrical and Electronic Engineering. According to data from OpenAlex, D. Adderton has authored 12 papers receiving a total of 519 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Atomic and Molecular Physics, and Optics, 6 papers in Biomedical Engineering and 5 papers in Electrical and Electronic Engineering. Recurrent topics in D. Adderton's work include Force Microscopy Techniques and Applications (11 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Mechanical and Optical Resonators (4 papers). D. Adderton is often cited by papers focused on Force Microscopy Techniques and Applications (11 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers) and Mechanical and Optical Resonators (4 papers). D. Adderton collaborates with scholars based in United States, New Zealand and Germany. D. Adderton's co-authors include C. F. Quate, Jonathan D. Adams, Todd Sulchek, S. C. Minne, Robert Hsieh, A. Atalar, G.G. Yaralioglu, J. P. Cleveland, Virgil B. Elings and Kathryn Wilder and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Review of Scientific Instruments.

In The Last Decade

D. Adderton

11 papers receiving 502 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
D. Adderton United States	7	458	258	238	44	40	12	519
T. Sulzbach Germany	12	403 0.9×	211 0.8×	221 0.9×	53 1.2×	5 0.1×	28	469
W. Henschel Germany	11	306 0.7×	685 2.7×	345 1.4×	32 0.7×	10 0.3×	25	769
C. Baur Germany	11	351 0.8×	165 0.6×	269 1.1×	68 1.5×	17 0.4×	19	489
Víctor Barcons Spain	11	289 0.6×	116 0.4×	132 0.6×	58 1.3×	9 0.2×	25	396
Thomas E. Carver United States	4	430 0.9×	216 0.8×	237 1.0×	35 0.8×	3 0.1×	7	534
James R. Von Ehr United States	9	197 0.4×	128 0.5×	164 0.7×	177 4.0×	19 0.5×	11	377
Randal J. Grow United States	5	404 0.9×	170 0.7×	165 0.7×	138 3.1×	7 0.2×	5	527
Emmanuel Dubois France	14	551 1.2×	630 2.4×	363 1.5×	182 4.1×	3 0.1×	41	845
Laurent Mazenq France	11	108 0.2×	199 0.8×	172 0.7×	31 0.7×	4 0.1×	25	297
M. Miyamoto Japan	12	197 0.4×	339 1.3×	230 1.0×	136 3.1×	5 0.1×	31	476

Countries citing papers authored by D. Adderton

Since Specialization

Citations

This map shows the geographic impact of D. Adderton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Adderton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Adderton more than expected).

Fields of papers citing papers by D. Adderton

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Adderton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Adderton. The network helps show where D. Adderton may publish in the future.

Co-authorship network of co-authors of D. Adderton

This figure shows the co-authorship network connecting the top 25 collaborators of D. Adderton. A scholar is included among the top collaborators of D. Adderton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. Adderton. D. Adderton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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12 of 12 papers shown

Alper, Başak, et al.. (2010). Immersed in Unfolding Complex Systems. 291–309. 1 indexed citations

Sulchek, Todd, Robert Hsieh, Jonathan D. Adams, et al.. (2000). High-speed tapping mode imaging with active Q control for atomic force microscopy. Applied Physics Letters. 76(11). 1473–1475. 172 indexed citations

Sulchek, Todd, Robert Hsieh, Jonathan D. Adams, et al.. (2000). High-speed atomic force microscopy in liquid. Review of Scientific Instruments. 71(5). 2097–2099. 88 indexed citations

Adderton, D., et al.. (1999). Electrostatic Force Spectroscopy and Imaging of Bi Wires: Spatially Resolved Quantum Confinement. Physical Review Letters. 82(19). 3887–3890. 26 indexed citations

Kolbesen, Bernd O., D. Adderton, G. Schindler, et al.. (1999). Scanning Probe Microscopy (SPM) for the Investigation of Local Electrical Properties of High-K Dielectric/Ferroelectric Films. MRS Proceedings. 567. 2 indexed citations

Sulchek, Todd, S. C. Minne, Jonathan D. Adams, et al.. (1999). Dual integrated actuators for extended range high speed atomic force microscopy. Applied Physics Letters. 75(11). 1637–1639. 49 indexed citations

Kolbesen, Bernd O., D. Adderton, Peter Wolf, et al.. (1999). Characterization of high-K dielectric/ferroelectric materials : Capabilities of scanning probe microscopy (SPM). 3895. 188–195.

Workman, Richard K., et al.. (1999). Effects of moisture on Fowler–Nordheim characterization of thin silicon-oxide films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(5). 2753–2758. 6 indexed citations

Adams, Jonathan D., S. C. Minne, Scott R. Manalis, et al.. (1998). High throughput, high resolution scanning probe microscopy. Bilkent University Institutional Repository (Bilkent University). 259–263. 2 indexed citations

10.

Wilder, Kathryn, et al.. (1998). Noncontact nanolithography using the atomic force microscope. Applied Physics Letters. 73(17). 2527–2529. 84 indexed citations

11.

Erickson, Andrew, et al.. (1996). Quantitative scanning capacitance microscopy analysis of two-dimensional dopant concentrations at nanoscale dimensions. Journal of Electronic Materials. 25(2). 301–304. 25 indexed citations

12.

Neubauer, G., Andrew Erickson, C. C. Williams, et al.. (1996). Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(1). 426–432. 64 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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