Andrew Erickson

546 total citations
16 papers, 417 citations indexed

About

Andrew Erickson is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, Andrew Erickson has authored 16 papers receiving a total of 417 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 12 papers in Atomic and Molecular Physics, and Optics and 2 papers in Surfaces, Coatings and Films. Recurrent topics in Andrew Erickson's work include Force Microscopy Techniques and Applications (12 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Semiconductor materials and devices (5 papers). Andrew Erickson is often cited by papers focused on Force Microscopy Techniques and Applications (12 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers) and Semiconductor materials and devices (5 papers). Andrew Erickson collaborates with scholars based in United States and Singapore. Andrew Erickson's co-authors include Steven P. DenBaars, J. P. Ibbetson, P. Kozodoy, Y. E. Strausser, James S. Speck, P. Hansen, Umesh K. Mishra, E. J. Tarsa, V. Narayanamurti and D. Adderton and has published in prestigious journals such as Applied Physics Letters, Journal of Electronic Materials and Materials Science in Semiconductor Processing.

In The Last Decade

Andrew Erickson

14 papers receiving 401 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Andrew Erickson United States 7 283 234 183 119 79 16 417
Veli-Matti Airaksinen Finland 10 302 1.1× 149 0.6× 127 0.7× 74 0.6× 36 0.5× 23 381
R. C. Tu Taiwan 11 168 0.6× 179 0.8× 312 1.7× 80 0.7× 142 1.8× 30 424
L. Reißmann Germany 9 124 0.4× 174 0.7× 256 1.4× 84 0.7× 92 1.2× 14 332
N. M. Shmidt Russia 12 232 0.8× 150 0.6× 327 1.8× 77 0.6× 187 2.4× 53 431
H. Gräbeldinger Germany 9 250 0.9× 294 1.3× 125 0.7× 103 0.9× 56 0.7× 16 387
R. Kumar Singapore 12 181 0.6× 243 1.0× 70 0.4× 117 1.0× 144 1.8× 23 395
Lorenzo Lugani Switzerland 13 274 1.0× 136 0.6× 268 1.5× 123 1.0× 140 1.8× 21 404
S. Rennesson France 11 270 1.0× 146 0.6× 302 1.7× 75 0.6× 141 1.8× 28 457
S.K. Mathis United States 7 233 0.8× 162 0.7× 219 1.2× 53 0.4× 72 0.9× 12 375
P.J. van der Wel Netherlands 12 254 0.9× 246 1.1× 178 1.0× 43 0.4× 69 0.9× 34 438

Countries citing papers authored by Andrew Erickson

Since Specialization
Citations

This map shows the geographic impact of Andrew Erickson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andrew Erickson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andrew Erickson more than expected).

Fields of papers citing papers by Andrew Erickson

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Andrew Erickson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andrew Erickson. The network helps show where Andrew Erickson may publish in the future.

Co-authorship network of co-authors of Andrew Erickson

This figure shows the co-authorship network connecting the top 25 collaborators of Andrew Erickson. A scholar is included among the top collaborators of Andrew Erickson based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Andrew Erickson. Andrew Erickson is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

16 of 16 papers shown
1.
Alvis, Roger, et al.. (2015). Plasma FIB DualBeam Delayering for Atomic Force NanoProbing of 14 nm FinFET Devices in an SRAM Array. Proceedings - International Symposium for Testing and Failure Analysis. 2 indexed citations
2.
Erickson, Andrew, et al.. (2008). Calibration of Nanoprobe Capacitance-Voltage Spectroscopy (NCVS). Proceedings - International Symposium for Testing and Failure Analysis. 30910. 204–208. 2 indexed citations
3.
Erickson, Andrew, et al.. (2007). Challenges of Atomic Force Probe Characterization of Logic Based Embedded DRAM for On-Processor Applications. Proceedings - International Symposium for Testing and Failure Analysis. 30903. 46–51. 1 indexed citations
4.
Erickson, Andrew, et al.. (2006). Atomic Force Probe Kelvin Measurements of Large MOSFET Devices at Contact Level for Accurate Device Threshold Characteristics. Proceedings - International Symposium for Testing and Failure Analysis. 30897. 497–502. 3 indexed citations
5.
6.
Erickson, Andrew, et al.. (2004). Current Image Atomic Force Microscopy (CI-AFM) Combined with Atomic Force Probing (AFP) for Location and Characterization of Advanced Technology Node. Proceedings - International Symposium for Testing and Failure Analysis. 30873. 42–46. 18 indexed citations
7.
8.
9.
Erickson, Andrew. (2002). What Can a Failure Analyst Do With an AFM?. Proceedings - International Symposium for Testing and Failure Analysis. 30774. 455–459. 1 indexed citations
10.
Wolf, Peter, et al.. (2001). Electrical characterization of semiconductor materials and devices using scanning probe microscopy. Materials Science in Semiconductor Processing. 4(1-3). 71–76. 31 indexed citations
11.
Nakakura, C.Y., Dale L. Hetherington, M.R. Shaneyfelt, Patrick J. Shea, & Andrew Erickson. (1999). Observation of metal–oxide–semiconductor transistor operation using scanning capacitance microscopy. Applied Physics Letters. 75(15). 2319–2321. 26 indexed citations
12.
Schroeder, Paul G., et al.. (1999). Spatially resolved dopant profiling of patterned Si wafers by bias-applied phase-imaging tapping-mode atomic force microscopy. Applied Physics Letters. 74(10). 1421–1423. 4 indexed citations
13.
Hansen, P., Y. E. Strausser, Andrew Erickson, et al.. (1998). Scanning capacitance microscopy imaging of threading dislocations in GaN films grown on (0001) sapphire by metalorganic chemical vapor deposition. Applied Physics Letters. 72(18). 2247–2249. 223 indexed citations
14.
Erickson, Andrew, et al.. (1996). Quantitative scanning capacitance microscopy analysis of two-dimensional dopant concentrations at nanoscale dimensions. Journal of Electronic Materials. 25(2). 301–304. 25 indexed citations
15.
Neubauer, G., Andrew Erickson, C. C. Williams, et al.. (1996). Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(1). 426–432. 64 indexed citations
16.
Erickson, Andrew, et al.. (1994). Ultraviolet laser-based communication system for short-range tactical applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2115. 79–79. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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