H. Aziza

473 total citations
57 papers, 235 citations indexed

About

H. Aziza is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Cellular and Molecular Neuroscience. According to data from OpenAlex, H. Aziza has authored 57 papers receiving a total of 235 indexed citations (citations by other indexed papers that have themselves been cited), including 54 papers in Electrical and Electronic Engineering, 10 papers in Hardware and Architecture and 5 papers in Cellular and Molecular Neuroscience. Recurrent topics in H. Aziza's work include Semiconductor materials and devices (37 papers), Ferroelectric and Negative Capacitance Devices (22 papers) and Advanced Memory and Neural Computing (22 papers). H. Aziza is often cited by papers focused on Semiconductor materials and devices (37 papers), Ferroelectric and Negative Capacitance Devices (22 papers) and Advanced Memory and Neural Computing (22 papers). H. Aziza collaborates with scholars based in France, Netherlands and Switzerland. H. Aziza's co-authors include Said Hamdioui, Georgios Ch. Sirakoulis, J.M. Portal, Christophe Müller, M. Bocquet, Mathieu Moreau, Jean‐Michel Portal, A. Virazel, Patrick Girard and F. H. Julien and has published in prestigious journals such as SHILAP Revista de lepidopterología, IEEE Access and Journal of Non-Crystalline Solids.

In The Last Decade

H. Aziza

50 papers receiving 233 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H. Aziza France 9 230 51 30 14 10 57 235
Saeideh Shirinzadeh Germany 10 251 1.1× 95 1.9× 31 1.0× 11 0.8× 14 1.4× 28 288
Mathieu Moreau France 11 330 1.4× 66 1.3× 35 1.2× 12 0.9× 27 2.7× 34 345
Ogun Turkyilmaz France 9 254 1.1× 26 0.5× 30 1.0× 33 2.4× 10 1.0× 15 261
Marina Reyboz France 11 324 1.4× 44 0.9× 16 0.5× 9 0.6× 15 1.5× 29 344
Abhairaj Singh Netherlands 10 177 0.8× 42 0.8× 18 0.6× 13 0.9× 31 3.1× 16 196
G. Cibrario France 7 222 1.0× 16 0.3× 30 1.0× 28 2.0× 13 1.3× 18 229
Rajendra Bishnoi Netherlands 11 223 1.0× 51 1.0× 24 0.8× 11 0.8× 36 3.6× 25 247
Moritz Fieback Netherlands 11 227 1.0× 53 1.0× 58 1.9× 6 0.4× 23 2.3× 45 252
Che-Wei Wu Taiwan 7 428 1.9× 65 1.3× 40 1.3× 34 2.4× 15 1.5× 9 442
P. Asenov United Kingdom 8 230 1.0× 41 0.8× 15 0.5× 4 0.3× 10 1.0× 23 236

Countries citing papers authored by H. Aziza

Since Specialization
Citations

This map shows the geographic impact of H. Aziza's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Aziza with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Aziza more than expected).

Fields of papers citing papers by H. Aziza

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Aziza. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Aziza. The network helps show where H. Aziza may publish in the future.

Co-authorship network of co-authors of H. Aziza

This figure shows the co-authorship network connecting the top 25 collaborators of H. Aziza. A scholar is included among the top collaborators of H. Aziza based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Aziza. H. Aziza is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Aziza, H., et al.. (2025). Experimental Analysis and Circuit-Level Mitigation Strategies for Intermittent Errors in Resistive RAMs. IEEE Transactions on Device and Materials Reliability. 26(1). 93–101.
2.
3.
Aziza, H., et al.. (2025). Conductance variability in RRAM and its implications at the neural network level. Microelectronics Reliability. 166. 115594–115594. 1 indexed citations
4.
Aziza, H., et al.. (2024). Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. 1–5. 1 indexed citations
5.
Aziza, H., et al.. (2022). Experimental Analysis of Oxide-Based RAM Analog Synaptic Behavior. Electronics. 12(1). 49–49. 1 indexed citations
6.
Aziza, H., et al.. (2022). STATE: A Test Structure for Rapid and Reliable Prediction of Resistive RAM Endurance. IEEE Transactions on Device and Materials Reliability. 22(4). 500–505. 8 indexed citations
7.
Aziza, H., Said Hamdioui, Moritz Fieback, et al.. (2021). Multi-Level Control of Resistive RAM (RRAM) Using a Write Termination to Achieve 4 Bits/Cell in High Resistance State. Electronics. 10(18). 2222–2222. 13 indexed citations
8.
Aziza, H., et al.. (2019). A Capacitor-Less CMOS Neuron Circuit for Neuromemristive Networks. HAL (Le Centre pour la Communication Scientifique Directe). 1–4. 10 indexed citations
9.
Aziza, H., et al.. (2018). Resistive RAMs as analog trimming elements. Solid-State Electronics. 142. 52–55. 8 indexed citations
10.
Rahajandraibe, Wenceslas, et al.. (2018). Detection limit of a VCO based detection chain dedicated to particles recognition and tracking. SHILAP Revista de lepidopterología. 170. 9002–9002. 1 indexed citations
11.
Hamdioui, Said, H. Aziza, & Georgios Ch. Sirakoulis. (2014). Memristor based memories: Technology, design and test. 1–7. 38 indexed citations
12.
Aziza, H., et al.. (2014). A Built-In Self-Test Structure (BIST) for Resistive RAMs characterization: Application to bipolar OxRRAM. Solid-State Electronics. 103. 73–78. 4 indexed citations
13.
Aziza, H., et al.. (2012). Non volatile memory reliability evaluation based on oxide defect generation rate during stress and retention test. Solid-State Electronics. 78. 151–155. 1 indexed citations
14.
15.
Aziza, H., et al.. (2010). A new experimental method to extract EEPROM tunnel oxide trap density from threshold voltage distributions. Journal of Non-Crystalline Solids. 357(8-9). 1971–1976.
16.
Portal, J.M., et al.. (2008). A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories. 1–10. 3 indexed citations
17.
Aziza, H., et al.. (2007). An Automated Design Methodology for Charge Pump Circuits. 214–217. 2 indexed citations
18.
19.
Aziza, H., et al.. (2006). Speeding up simulation time in EEPROM memory designs. 285–288. 1 indexed citations
20.
Portal, J.M., et al.. (2004). EEPROM memory: threshold voltage built in self diagnosis. 1. 23–28. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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