Oliver C. Wells

1.3k total citations
56 papers, 836 citations indexed

About

Oliver C. Wells is a scholar working on Surfaces, Coatings and Films, Electrical and Electronic Engineering and Structural Biology. According to data from OpenAlex, Oliver C. Wells has authored 56 papers receiving a total of 836 indexed citations (citations by other indexed papers that have themselves been cited), including 50 papers in Surfaces, Coatings and Films, 34 papers in Electrical and Electronic Engineering and 18 papers in Structural Biology. Recurrent topics in Oliver C. Wells's work include Electron and X-Ray Spectroscopy Techniques (49 papers), Advancements in Photolithography Techniques (26 papers) and Advanced Electron Microscopy Techniques and Applications (18 papers). Oliver C. Wells is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (49 papers), Advancements in Photolithography Techniques (26 papers) and Advanced Electron Microscopy Techniques and Applications (18 papers). Oliver C. Wells collaborates with scholars based in United States, United Kingdom and South Sudan. Oliver C. Wells's co-authors include L. Marton, T. E. Everhart, N. G. Ainslie, S. K. Lahiri, F. M. d’Heurle, R. Savoy, A. N. Broers, L. Gignac, David C. Joy and Masahiro Kawasaki and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physics Today.

In The Last Decade

Oliver C. Wells

53 papers receiving 753 citations

Peers

Countries citing papers authored by Oliver C. Wells

Since Specialization

Citations

This map shows the geographic impact of Oliver C. Wells's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Oliver C. Wells with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Oliver C. Wells more than expected).

Fields of papers citing papers by Oliver C. Wells

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Oliver C. Wells. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Oliver C. Wells. The network helps show where Oliver C. Wells may publish in the future.

Co-authorship network of co-authors of Oliver C. Wells

This figure shows the co-authorship network connecting the top 25 collaborators of Oliver C. Wells. A scholar is included among the top collaborators of Oliver C. Wells based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Oliver C. Wells. Oliver C. Wells is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope 2006 ·Scanning ·Oliver C. Wells, L. Gignac, Conal E. Murray, (unknown), J. Bruley	8
2	Imaging and analysis of subsurface Cu interconnects by detecting backscattered electrons in the scanning electron microscope 2005 ·Journal of Applied Physics ·L. Gignac, Masahiro Kawasaki, (unknown), Oliver C. Wells	27
3	Top-down topography of deeply etched silicon in the scanning electron microscope 2004 ·Review of Scientific Instruments ·Oliver C. Wells, Conal E. Murray, (unknown), Lynne Gignac	1
4	Application of the low‐loss scanning electron microscope image to integrated circuit technology. Part 1– applications to accurate dimension measurements 2001 ·Scanning ·Michael T. Postek, András Vládar, Oliver C. Wells, (unknown)	11
5	Application of the low‐loss scanning electron microscope image to integrated circuit technology. Part II— chemically‐mechanically planarized samples 2001 ·Scanning ·Oliver C. Wells, (unknown), András Vládar, Michael T. Postek	2
6	Improved in-lens low-loss electron detector for the Scanning Electron Microscope 1991 ·Proceedings annual meeting Electron Microscopy Society of America ·Oliver C. Wells, Eric Munro	1
7	Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope 1987 ·Journal of Applied Physics ·Oliver C. Wells, Ping‐chin Cheng	1
8	Low-loss electron images of uncoated photoresist in the scanning electron microscope 1986 ·Applied Physics Letters ·Oliver C. Wells	15
9	Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field 1986 ·Journal of Microscopy ·Oliver C. Wells, (unknown)	5
10	Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM) 1985 ·Journal of Microscopy ·Oliver C. Wells, Phillip J. Bailey	1
11	Some theoretical aspects of type‐1 magnetic contrast in the scanning electron microscope 1985 ·Journal of Microscopy ·Oliver C. Wells	8
12	Backscattered Electron (BSE) Imaging in the Scanning Electron Microscope (SEM) - Measurement of Surface Layer Mass-Thickness 1982 ·Digital Commons - USU (Utah State University) ·Oliver C. Wells, R. Savoy, Phillip J. Bailey	2
13	Reciprocity between the reflection electron microscope and the low-loss scanning electron microscope 1980 ·Applied Physics Letters ·Oliver C. Wells	3
14	Proposed Scheme for a Directional Low-Loss Detector 1976 ·Proceedings annual meeting Electron Microscopy Society of America ·Oliver C. Wells	0
15	Scanning Electron Microscopy 1975 ·Physics Today ·Oliver C. Wells, L. Marton	155
16	Collector Turret for Scanning Electron Microscope 1970 ·Review of Scientific Instruments ·Oliver C. Wells, (unknown)	4
17	Investigation of Electron-Optical Systems by Scanning Electron Microscopy 1969 ·Review of Scientific Instruments ·Oliver C. Wells	1
18	Calculation of the heat-affected zone during pulsed electron-beam machining 1965 ·IEEE Transactions on Electron Devices ·Oliver C. Wells	5
19	A novel method of semiconductor device measurements 1964 ·Proceedings of the IEEE ·T. E. Everhart, Oliver C. Wells, (unknown)	38
20	Examination of Nylon Spinneret Holes by Scanning Electron Microscopy† 1959 ·Journal of Electronics and Control ·Oliver C. Wells	4

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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