G.J. Riedel

565 citations

24 papers · 446 indexed · h-index 12

Impact in

Condensed Matter Physics top 5%
- GaN-based semiconductor devices and materials
Electrical and Electronic Engineering top 10%
- Silicon Carbide Semiconductor Technologies
- Semiconductor materials and devices
- Multilevel Inverters and Converters
- HVDC Systems and Fault Protection
- Advanced DC-DC Converters

Papers in

Condensed Matter Physics 7
- GaN-based semiconductor devices and materials 7
Electrical and Electronic Engineering 21
- Silicon Carbide Semiconductor Technologies 20
- Multilevel Inverters and Converters 5
- Electromagnetic Compatibility and Noise Suppression 5
- Silicon and Solar Cell Technologies 4
- Advanced DC-DC Converters 3
- Electronic Packaging and Soldering Technologies 3

Co-authors: James W. Pomeroy Michael J. Uren Martin Kuball D. J. Wallis K.P. Hilton T. Martin J.O. Maclean Andrei Sarua
Journals: IEEE Electron Device Letters (3 papers)Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment (1 paper)Microelectronics Reliability (1 paper)physica status solidi (a) (1 paper)Bristol Research (University of Bristol) (1 paper)
Partner nations: Switzerland United Kingdom Germany

In The Last Decade

G.J. Riedel

24 papers receiving 434 citations

Peers

Countries citing papers authored by G.J. Riedel

Since Specialization

Citations

This map shows the geographic impact of G.J. Riedel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G.J. Riedel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G.J. Riedel more than expected).

Fields of papers citing papers by G.J. Riedel

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G.J. Riedel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G.J. Riedel. The network helps show where G.J. Riedel may publish in the future.

Co-authors

The 25 scholars most cited alongside G.J. Riedel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with G.J. Riedel Line = papers co-authored together G.J. Riedel links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	A study to improve IGBT reliability in power electronics applications J. Hunting, Enea Bianda, G.J. Riedel	2015	1
2	A feasibility study of using gate-emitter voltage method to estimate IGBT online junction temperature in practical applications G.J. Riedel, J. Hunting, Enea Bianda, Francisco Archanco Fernández, C. R. Newman	2015	4
3	Active thermal protection and lifetime extension in 3L-NPC-inverter in the low modulation range Guang-Nian Chen, G.J. Riedel, Νικόλαος Οικονόμου, Mario Pacas	2015	13
4	PWM for active thermal protection in three level neutral point clamped inverters Guang-Nian Chen, Νικόλαος Οικονόμου, G.J. Riedel, Mario Pacas	2014	16
5	PWM for active thermal protection in three level neutral point clamped inverters Guang-Nian Chen, G.J. Riedel, Νικόλαος Οικονόμου, Mario Pacas	2013	9
6	On reliability of medium voltage multilevel converters عبدالرحيم رحموني, G.J. Riedel, A. Korn, P. Steimer, TalaKhaled Albassri	2013	39
7	Reliability of Large Area Solder Joints within IGBT Modules: Numerical Modeling and Experimental Results G.J. Riedel, A.N. Nikolishin, P. Zimemrman, H. Beyer, Chen Yong-xue	2012	17
8	Thermal Networks for Time-Variant Cooling Systems: Modeling Approach and Accuracy Requirements for Lifetime Prediction Liu Tian mo, G.J. Riedel	2012	3
9	The influence of thermal cycling methods on the interconnection reliability evaluation within IGBT modules Chunlei Liu, Ansa Shahid, G.J. Riedel, Нонна Робертовна Шахназарян, Norbert Hofmann	2012	16
10	Reliability prediction sensitivity analysis - how to perform reliability prediction time efficiently G.J. Riedel, Till Huesgen, A.N. Nikolishin	2012	6
11	Risk assessment using design review based on failure mode A.N. Nikolishin, G.J. Riedel, A. Ruiz de León San Juan	2011	4
12	Active lifetime extension — Demonstrated for voltage source converters G.J. Riedel, Νικόλαος Οικονόμου, A.N. Nikolishin, Didier Cottet	2010	7
13	Reducing Thermal Resistance of AlGaN/GaN Electronic Devices Using Novel Nucleation Layers IEEE Electron Device Letters ·G.J. Riedel, James W. Pomeroy, K.P. Hilton, J.O. Maclean, D. J. Wallis, Michael J. Uren, T. Martin, Urban Forsberg, Anders Lundskog, A. Kakanakova‐Georgieva, Г. Позина, Erik Janzén, R. Lossy, Jaromil, Frank Brunner, Joachim Würfl, Martin Kuball	2009	66
14	Nanosecond Timescale Thermal Dynamics of AlGaN/GaN Electronic Devices IEEE Electron Device Letters ·G.J. Riedel, James W. Pomeroy, K.P. Hilton, J.O. Maclean, D. J. Wallis, Michael J. Uren, T. Martin, Martin Kuball	2008	39
15	Nanosecond Time-Resolved Raman Thermography: Probing Device and Channel Temperature in Pulsed-Operated GaN and GaAs HEMTs James W. Pomeroy, G.J. Riedel, Michael J. Uren, T. Martin, Andrew Bullen, Yasmine Zemrani, Martin Kuball	2008	4
16	Time‐resolved nanosecond sub‐micron resolution thermal analysis of high‐power AlGaN/GaN HFETs physica status solidi (a) ·M. Kuball, G.J. Riedel, James W. Pomeroy, Andrei Sarua, Michael J. Uren, Trevor Martin, K.P. Hilton, D. J. Wallis	2007	2
17	Time-Resolved Temperature Measurement of AlGaN/GaN Electronic Devices Using Micro-Raman Spectroscopy IEEE Electron Device Letters ·Martin Kuball, G.J. Riedel, James W. Pomeroy, Andrei Sarua, Michael J. Uren, T. Martin, K.P. Hilton, J.O. Maclean, D. J. Wallis	2007	122
18	Thermal Properties and Reliability of GaN Microelectronics: Sub-Micron Spatial and Nanosecond Time Resolution Thermography Martin Kuball, James W. Pomeroy, R. Simms, G.J. Riedel, Hangfeng Ji, Andrei Sarua, Michael J. Uren, Trevor Martin	2007	18
19	Reliability of High-Speed Devices: Probing of Self-Heating with Nanosecond Time-Resolution Bristol Research (University of Bristol) ·Martin Kuball, G.J. Riedel, 清爾リピット・水田, Andrei Sarua, Michael J. Uren, Trevor Martin, K.P. Hilton, J.O. Maclean, Betty Babanoury	2007	1
20	Radiation damage of wavelength shifters and its recovery in the presence of oxygen Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ·K. Wick, G.J. Riedel, R. Uniyal, C.R. BALL	1989	14

About G.J. Riedel

G.J. Riedel is a scholar working on Condensed Matter Physics, Electrical and Electronic Engineering, Software, Safety, Risk, Reliability and Quality and Radiation, having authored 24 papers that have together received 446 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (20 papers), GaN-based semiconductor devices and materials (7 papers), Multilevel Inverters and Converters (5 papers), Electromagnetic Compatibility and Noise Suppression (5 papers), Silicon and Solar Cell Technologies (4 papers), Semiconductor Quantum Structures and Devices (3 papers), Advanced DC-DC Converters (3 papers) and Electronic Packaging and Soldering Technologies (3 papers). The work is most often cited by research in Condensed Matter Physics (215 citations), Electrical and Electronic Engineering (369 citations), Materials Chemistry (111 citations), Safety, Risk, Reliability and Quality (19 citations) and Atomic and Molecular Physics, and Optics (51 citations). G.J. Riedel has collaborated with scholars based in Switzerland, United Kingdom and Germany. Frequent co-authors include James W. Pomeroy, Michael J. Uren, Martin Kuball, D. J. Wallis, K.P. Hilton, T. Martin, J.O. Maclean, Andrei Sarua, Νικόλαος Οικονόμου and Mario Pacas. Their work appears in journals such as IEEE Electron Device Letters, Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, Microelectronics Reliability, physica status solidi (a) and Bristol Research (University of Bristol).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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