G. Dambrine

4.9k total citations · 1 hit paper
137 papers, 3.2k citations indexed

About

G. Dambrine is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, G. Dambrine has authored 137 papers receiving a total of 3.2k indexed citations (citations by other indexed papers that have themselves been cited), including 124 papers in Electrical and Electronic Engineering, 31 papers in Biomedical Engineering and 30 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in G. Dambrine's work include Radio Frequency Integrated Circuit Design (67 papers), Advancements in Semiconductor Devices and Circuit Design (49 papers) and Semiconductor materials and devices (27 papers). G. Dambrine is often cited by papers focused on Radio Frequency Integrated Circuit Design (67 papers), Advancements in Semiconductor Devices and Circuit Design (49 papers) and Semiconductor materials and devices (27 papers). G. Dambrine collaborates with scholars based in France, Belgium and Spain. G. Dambrine's co-authors include A. Cappy, E. Playez, Frédéric Héliodore, F. Danneville, H. Happy, Vincent Derycke, Sylvie Lépilliet, J.‐P. Bourgoin, Jean‐Pierre Raskin and Mark C. Hersam and has published in prestigious journals such as Nano Letters, Applied Physics Letters and IEEE Transactions on Microwave Theory and Techniques.

In The Last Decade

G. Dambrine

131 papers receiving 3.0k citations

Hit Papers

align trajectories

What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

A new method for determining the FET small-signal equivalent circuit

1988 1.1k citations G. Dambrine, A. Cappy et al. IEEE Transactions on Microwave Theory and Techniques profile →

Peers

Countries citing papers authored by G. Dambrine

Since Specialization

Citations

This map shows the geographic impact of G. Dambrine's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Dambrine with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Dambrine more than expected).

Fields of papers citing papers by G. Dambrine

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Dambrine. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Dambrine. The network helps show where G. Dambrine may publish in the future.

Co-authorship network of co-authors of G. Dambrine

This figure shows the co-authorship network connecting the top 25 collaborators of G. Dambrine. A scholar is included among the top collaborators of G. Dambrine based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with G. Dambrine. G. Dambrine is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work	Indexed citations
1	Exploring Nanorobotics Integration with Microwave and Millimeter-Wave Techniques for Advanced On-wafer Measurement 2024 ·SPIRE - Sciences Po Institutional REpository ·(unknown), (unknown), (unknown), (unknown), Maxime Berthe, G. Dambrine, (unknown)	0
2	A comparison of pad metallization in miniaturized microfabricated silicon microcantilever-based wafer probes for low contact force low skate on-wafer measurements 2021 ·Journal of Micromechanics and Microengineering ·(unknown), (unknown), (unknown), G. Dambrine, (unknown), S. Arscott	6
3	Near-Field Scanning Millimeter-Wave Microscope Operating Inside a Scanning Electron Microscope: Towards Quantitative Electrical Nanocharacterization 2021 ·Applied Sciences ·(unknown), D. Théron, (unknown), (unknown), Sophie Eliet, (unknown), G. Dambrine, Kamel Haddadi	2
4	Near-Field Scanning Millimeter-wave Microscope Combined with a Scanning Electron Microscope 2017 ·HAL (Le Centre pour la Communication Scientifique Directe) ·G. Dambrine, Kamel Haddadi, (unknown), (unknown), D. Théron	1
5	Quantitative impedance characterization of sub-10 nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope 2014 ·Nanotechnology ·Fei Wang, Nicolas Clément, D. Ducatteau, David Troadec, Hassan Tanbakuchi, Bernard Legrand, G. Dambrine, D. Théron	18
6	Miniaturized Microcantilever-based RF Microwave Probes Using MEMS Technologies 2014 ·Procedia Engineering ·(unknown), S. Arscott, Kamel Haddadi, T. Lasri, (unknown), Sylvie Lépilliet, G. Dambrine	3
7	High frequency performance of Tellurium σ-doped AlSb/InAs HEMTs at low power supply 2010 ·A. Olivier, (unknown), (unknown), Yannick Roelens, L. Desplanque, F. Danneville, G. Dambrine, X. Wallart, S. Bollaert	1
8	Investigation of SiGe HBT potentialities under cryogenic temperature 2009 ·HAL (Le Centre pour la Communication Scientifique Directe) ·(unknown), F. Danneville, G. Dambrine, (unknown), P. Chevalier	6
9	MOSFETs RF Noise Optimization via Channel Engineering 2008 ·IEEE Electron Device Letters ·(unknown), (unknown), G. Dambrine, F. Danneville	12
10	Nonlinear Characterization and Modeling of Carbon Nanotube Field-Effect Transistors 2008 ·IEEE Transactions on Microwave Theory and Techniques ·Arnaud Curutchet, D. Théron, (unknown), D. Ducatteau, H. Happy, G. Dambrine, Jean-Marc Bethoux, Vincent Derycke, Christophe Gaquière	4
11	High-Frequency Noise Performance of 60-nm Gate-Length FinFETs 2008 ·IEEE Transactions on Electron Devices ·Jean‐Pierre Raskin, G. Pailloncy, Dimitri Lederer, F. Danneville, G. Dambrine, Stefaan Decoutere, A. Mercha, Bertrand Parvais	48
12	65 nm HR SOI CMOS Technology: emergence of Millimeter-Wave SoC 2007 ·HAL (Le Centre pour la Communication Scientifique Directe) ·(unknown), S. Montusclat, Baudouin Martineau, D. Gloria, C. Raynaud, S. Boret, G. Dambrine, Sylvie Lépilliet, Romain Pilard	9
13	DC and RF Performance of 0.2-0.4 /spl mu/m Gate Length InAs/AlSb HEMTs 2007 ·HAL (Le Centre pour la Communication Scientifique Directe) ·(unknown), Éric Lefebvre, (unknown), L. Desplanque, X. Wallart, Yannick Roelens, G. Dambrine, A. Cappy, (unknown), Jan Grahn	1
14	High-Speed SiGe BiCMOS Technologies: 120-nm Status and End-of-Roadmap Challenges 2007 ·HAL (Le Centre pour la Communication Scientifique Directe) ·P. Chevalier, (unknown), (unknown), (unknown), Laurent Rubaldo, (unknown), (unknown), Timothy O. Dickson, N. Zerounian, (unknown), D. Dutartre, (unknown), F. Aniel, G. Dambrine, A. Chantre	26
15	A microscopic interpretation of the RF noise performance of fabricated FDSOI MOSFETs 2006 ·IEEE Transactions on Electron Devices ·Raúl Rengel, María J. Martín, T. González, J. Mateos, D. Pardo, G. Dambrine, Jean‐Pierre Raskin, F. Danneville	13
16	A Monte Carlo investigation of the RF performance of partially-depleted SOI MOSFETs 2006 ·Semiconductor Science and Technology ·Raúl Rengel, María J. Martín, G. Dambrine, F. Danneville	3
17	Very high broadband electromagnetic characterization method of film‐shaped materials using coplanar 2002 ·Microwave and Optical Technology Letters ·Juan Hinojosa, K. Lmimouni, Sylvie Lépilliet, G. Dambrine	8
18	Noise Modelling in Linear and Nonlinear Devices 1999 ·IEICE Transactions on Electronics ·A. Cappy, F. Danneville, G. Dambrine, (unknown)	3
19	High-frequency four noise parameters of silicon-on-insulator-based technology MOSFET for the design of low-noise RF integrated circuits 1999 ·IEEE Transactions on Electron Devices ·G. Dambrine, Jean‐Pierre Raskin, F. Danneville, (unknown), J.-P. Colinge, A. Cappy	55
20	Noise analysis in devices under non-linear operation 1997 ·European Solid-State Device Research Conference ·A. Cappy, (unknown), G. Dambrine	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact