Frank Scholze

5.5k total citations
263 papers, 4.2k citations indexed

About

Frank Scholze is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Radiation. According to data from OpenAlex, Frank Scholze has authored 263 papers receiving a total of 4.2k indexed citations (citations by other indexed papers that have themselves been cited), including 143 papers in Electrical and Electronic Engineering, 104 papers in Surfaces, Coatings and Films and 102 papers in Radiation. Recurrent topics in Frank Scholze's work include Advancements in Photolithography Techniques (79 papers), X-ray Spectroscopy and Fluorescence Analysis (69 papers) and Calibration and Measurement Techniques (63 papers). Frank Scholze is often cited by papers focused on Advancements in Photolithography Techniques (79 papers), X-ray Spectroscopy and Fluorescence Analysis (69 papers) and Calibration and Measurement Techniques (63 papers). Frank Scholze collaborates with scholars based in Germany, Netherlands and Belgium. Frank Scholze's co-authors include G. Ulm, Michael Krumrey, M. Procop, H. Neumann, Christian Laubis, Hans Rabus, R. Klein, R. Thornagel, Alexander Gottwald and M. Richter and has published in prestigious journals such as SHILAP Revista de lepidopterología, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

Frank Scholze

257 papers receiving 3.9k citations

Peers

Countries citing papers authored by Frank Scholze

Since Specialization

Citations

This map shows the geographic impact of Frank Scholze's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frank Scholze with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frank Scholze more than expected).

Fields of papers citing papers by Frank Scholze

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Frank Scholze. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frank Scholze. The network helps show where Frank Scholze may publish in the future.

Co-authorship network of co-authors of Frank Scholze

This figure shows the co-authorship network connecting the top 25 collaborators of Frank Scholze. A scholar is included among the top collaborators of Frank Scholze based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Frank Scholze. Frank Scholze is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Laser-induced fluorescence spectroscopy for kinetic temperature measurement of xenon neutrals and ions in the discharge chamber of a radiofrequency ion source 2023 ·(unknown), Christoph Eichhorn, Frank Scholze, D. Spemann	7
2	Nested Sampling aided determination of tantalum optical constants in the EUV spectral range 2022 ·Applied Optics ·(unknown), (unknown), (unknown), Vicky Philipsen, (unknown), Frank Scholze, (unknown), (unknown), (unknown), Victor Soltwisch	2
3	On the optical constants of cobalt in the M-absorption edge region 2022 ·Optik ·(unknown), (unknown), (unknown), (unknown), Vicky Philipsen, Frank Scholze, (unknown), (unknown), (unknown), (unknown), (unknown), (unknown), Christian Laubis, Victor Soltwisch	1
4	Characterization of Ru4-xTax (x = 1,2,3) alloy as material candidate for EUV low-n mask 2021 ·Micro and Nano Engineering ·(unknown), Jean‐François de Marneffe, Karl Opsomer, Christophe Detavernier, Annelies Delabie, (unknown), (unknown), Andy Goodyear, Mike Cooke, (unknown), Victor Soltwisch, Frank Scholze, Vicky Philipsen	10
5	Grazing incidence-x-ray fluorescence for a dimensional and compositional characterization of well-ordered 2D and 3D nanostructures 2020 ·Nanotechnology ·Philipp Hönicke, (unknown), Yves Kayser, (unknown), Jürgen Probst, Frank Scholze, Victor Soltwisch, Thomas Weimann, Burkhard Beckhoff	13
6	Calibration of NICER detectors at the synchrotron radiation facility BESSY-II 2017 ·G. Prigozhin, James F. Steiner, Andrew Malonis, J. Doty, Beverly LaMarr, Ronald A. Remillard, Frank Scholze, Christian Laubis, Michael Krumrey, Keith C. Gendreau	0
7	Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurements 2016 ·Journal of Applied Crystallography ·Anton Haase, S. Bajt, Philipp Hönicke, Victor Soltwisch, Frank Scholze	28
8	New reference and test materials for the characterization of energy dispersive X-ray spectrometers at scanning electron microscopes 2014 ·Analytical and Bioanalytical Chemistry ·(unknown), Michael Krumrey, Christian Laubis, Frank Scholze, Vasile‐Dan Hodoroaba	2
9	A maximum likelihood approach to the inverse problem of scatterometry 2012 ·Optics Express ·(unknown), Hermann Groß, Frank Scholze, M. Wurm, Clemens Elster, Markus Bär	38
10	Improved grating reconstruction by determination of line roughness in extreme ultraviolet scatterometry 2012 ·Optics Letters ·(unknown), Sebastian Heidenreich, Hermann Groß, Andreas Rathsfeld, Frank Scholze, Markus Bär	19
11	Profile reconstruction in EUV scatterometry: Modeling and uncertainty estimates 2009 ·Open MIND ·Hermann Groß, Andreas Rathsfeld, Frank Scholze, Markus Bär	1
12	Rigorous FEM-Simulation of EUV-Masks: Influence of Shape and Material Parameters 2006 ·Jan Pomplun, Sven Burger, Frank Schmidt, Lin Zschiedrich, Frank Scholze, Christian Laubis, U. Dersch	13
13	Characterization of large off-axis EUV mirrors with high accuracy reflectometry at PTB 2006 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Christian Laubis, (unknown), Andreas Fischer, (unknown), Frank Scholz, (unknown), Frank Scholze, G. Ulm, (unknown), S. Müllender, (unknown), Eric Louis, E. Zoethout	8
14	Status of EUV reflectometry at PTB 2005 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Frank Scholze, Christian Laubis, (unknown), Andreas Fischer, (unknown), Frank Scholz, (unknown), G. Ulm	18
15	Calibration of space instrumentation with synchrotron radiation 2005 ·Advances in Space Research ·M. Richter, Alexander Gottwald, Frank Scholze, R. Thornagel, G. Ulm	21
16	Ion Beam Characterisation of the RIT 10 Ion Thruster 2003 ·39th AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit ·Michael Zeuner, Frank Scholze, M. Tartz, H. Neumann, Hans Leiter, (unknown)	4
17	Irradiation stability of silicon photodiodes for extreme-ultraviolet radiation 2003 ·Applied Optics ·Frank Scholze, R. Klein, (unknown)	19
18	<title>Progress in Mo/Si multilayer coating technology for EUVL optics</title> 2000 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Eric Louis, Andrey Yakshin, (unknown), (unknown), R. Stuik, (unknown), (unknown), F. Bijkerk, (unknown), (unknown), M. Mertin, D. Schmitz, Frank Scholze, G. Ulm	40
19	<title>Quantum efficiency of the XMM pn-CCD camera</title> 1999 ·Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE ·Robert Hartmann, Gisela Hartner, U. G. Briel, K. Dennerl, F. Haberl, Lothar Strueder, J. Truêmper, (unknown), E. Kendziorra, J.‐F. Hochedez, Erick Jourdain, P. Dhez, (unknown), J. Auerhammer, D. Schmitz, Frank Scholze, G. Ulm	11
20	High-accuracy detector calibration in the 3–1500 eV spectral range at the PTB radiometry laboratory 1998 ·Journal of Synchrotron Radiation ·Frank Scholze, (unknown), Peter Kuschnerus, Hans Rabus, M. Richter, G. Ulm	6

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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