Frank Scholze
- Electrical and Electronic Engineering top 2%
- Radiation top 0.2%
- Surfaces, Coatings and Films top 0.2%
- Biomedical Engineering top 5%
- Computational Mechanics top 1%
- Topics
- Advancements in Photolithography Techniques (79 papers)X-ray Spectroscopy and Fluorescence Analysis (69 papers)Calibration and Measurement Techniques (63 papers)
- Journals
- SHILAP Revista de lepidopterologíaPhysical review. B, Condensed matterApplied Physics Letters
- Partner nations
- GermanyNetherlandsBelgium
In The Last Decade
Frank Scholze
257 papers receiving 3.9k citations
Peers
Comparison fields: 5 of 79
- Electrical and Electronic Engineering 1.9k
- Radiation 1.6k
- Surfaces, Coatings and Films 1.3k
- Biomedical Engineering 897
- Computational Mechanics 760
Countries citing papers authored by Frank Scholze
This map shows the geographic impact of Frank Scholze's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frank Scholze with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frank Scholze more than expected).
Fields of papers citing papers by Frank Scholze
This network shows the impact of papers produced by Frank Scholze. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frank Scholze. The network helps show where Frank Scholze may publish in the future.
Co-authorship network of co-authors of Frank Scholze
This figure shows the co-authorship network connecting the top 25 collaborators of Frank Scholze. A scholar is included among the top collaborators of Frank Scholze based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Frank Scholze. Frank Scholze is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 7 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 10 | |
| 5 | 13 | |
| 6 | Calibration of NICER detectors at the synchrotron radiation facility BESSY-II | 0 |
| 7 | 28 | |
| 8 | 2 | |
| 9 | 38 | |
| 10 | 19 | |
| 11 | 1 | |
| 12 | Rigorous FEM-Simulation of EUV-Masks: Influence of Shape and Material Parameters | 13 |
| 13 | 8 | |
| 14 | 18 | |
| 15 | 21 | |
| 16 | 4 | |
| 17 | 19 | |
| 18 | 40 | |
| 19 | 11 | |
| 20 | 6 |
About Frank Scholze
Frank Scholze is a scholar working on Surfaces, Coatings and Films, Radiation and Aerospace Engineering, having authored 263 papers that have together received 4.2k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (79 papers), X-ray Spectroscopy and Fluorescence Analysis (69 papers) and Calibration and Measurement Techniques (63 papers). The work is most often cited by research in Surfaces, Coatings and Films (1.3k citations), Radiation (1.6k citations) and Structural Biology (54 citations). Frank Scholze has collaborated with scholars based in Germany, Netherlands and Belgium. Frequent co-authors include G. Ulm, Michael Krumrey, M. Procop, H. Neumann, Christian Laubis, Hans Rabus, R. Klein, R. Thornagel, Alexander Gottwald and M. Richter. Their work appears in journals such as SHILAP Revista de lepidopterología, Physical review. B, Condensed matter and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.