S. Müllender

410 total citations
20 papers, 302 citations indexed

About

S. Müllender is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, S. Müllender has authored 20 papers receiving a total of 302 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 8 papers in Surfaces, Coatings and Films and 6 papers in Biomedical Engineering. Recurrent topics in S. Müllender's work include Advancements in Photolithography Techniques (7 papers), Optical Coatings and Gratings (7 papers) and Advanced Surface Polishing Techniques (4 papers). S. Müllender is often cited by papers focused on Advancements in Photolithography Techniques (7 papers), Optical Coatings and Gratings (7 papers) and Advanced Surface Polishing Techniques (4 papers). S. Müllender collaborates with scholars based in Germany, Netherlands and France. S. Müllender's co-authors include F. Bijkerk, E. Zoethout, Eric Louis, Robbert Wilhelmus Elisabeth van de Kruijs, Andrei M. Yakunin, Igor A. Makhotkin, E. Louis, Andrey Yakshin, P. W. Loeffen and D.S. Sivia and has published in prestigious journals such as Physical review. B, Condensed matter, Optics Express and Applied Surface Science.

In The Last Decade

S. Müllender

20 papers receiving 287 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
S. Müllender Germany 11 123 105 95 78 75 20 302
M. Mertin Germany 9 134 1.1× 113 1.1× 58 0.6× 137 1.8× 99 1.3× 15 386
Igor A. Makhotkin Netherlands 11 143 1.2× 106 1.0× 79 0.8× 104 1.3× 93 1.2× 46 380
Takashi Imazono Japan 13 86 0.7× 221 2.1× 163 1.7× 117 1.5× 74 1.0× 54 458
Stefan Günster Germany 11 191 1.6× 42 0.4× 75 0.8× 70 0.9× 94 1.3× 29 328
J.C. Banks United States 12 181 1.5× 107 1.0× 78 0.8× 185 2.4× 52 0.7× 31 437
Q. F. Xiao United States 13 60 0.5× 184 1.8× 29 0.3× 66 0.8× 124 1.7× 39 350
R. A. Levesque United States 8 96 0.8× 189 1.8× 53 0.6× 63 0.8× 46 0.6× 12 331
M. Schürmann Germany 11 198 1.6× 29 0.3× 78 0.8× 110 1.4× 82 1.1× 40 364
H. Oetzmann Germany 9 158 1.3× 97 0.9× 53 0.6× 100 1.3× 66 0.9× 16 384
M.R. Went Australia 14 157 1.3× 164 1.6× 271 2.9× 73 0.9× 140 1.9× 33 405

Countries citing papers authored by S. Müllender

Since Specialization
Citations

This map shows the geographic impact of S. Müllender's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Müllender with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Müllender more than expected).

Fields of papers citing papers by S. Müllender

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Müllender. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Müllender. The network helps show where S. Müllender may publish in the future.

Co-authorship network of co-authors of S. Müllender

This figure shows the co-authorship network connecting the top 25 collaborators of S. Müllender. A scholar is included among the top collaborators of S. Müllender based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with S. Müllender. S. Müllender is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Makhotkin, Igor A., E. Zoethout, Robbert Wilhelmus Elisabeth van de Kruijs, et al.. (2013). Short period La/B and LaN/B multilayer mirrors for ~68 nm wavelength. Optics Express. 21(24). 29894–29894. 46 indexed citations
2.
Makhotkin, Igor A., E. Zoethout, Eric Louis, et al.. (2012). Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge. Optics Express. 20(11). 11778–11778. 29 indexed citations
3.
Makhotkin, Igor A., E. Zoethout, Eric Louis, et al.. (2012). Wavelength selection for multilayer coatings for the lithography generation beyond EUVL. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8322. 832213–832213. 1 indexed citations
4.
Makhotkin, Igor A., E. Zoethout, Eric Louis, et al.. (2012). Wavelength selection for multilayer coatings for lithography generation beyond extreme ultraviolet. Journal of Micro/Nanolithography MEMS and MOEMS. 11(4). 40501–40501. 12 indexed citations
5.
Louis, E., et al.. (2010). Surface morphology of Kr+-polished amorphous Si layers. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 28(4). 552–558. 11 indexed citations
6.
Louis, E., et al.. (2010). High reflectance multilayers for EUVL HVM-projection optics. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7636. 76362T–76362T. 6 indexed citations
7.
Zoethout, E., Eric Louis, Robbert Wilhelmus Elisabeth van de Kruijs, et al.. (2009). Improved contrast and reflectivity of multilayer reflective optics for wavelengths beyond the extreme UV. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7271. 72713V–72713V. 13 indexed citations
8.
Müllender, S., et al.. (2008). Coatings for next generation lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7101. 71010X–71010X. 11 indexed citations
9.
Yakshin, Andrey, Robbert Wilhelmus Elisabeth van de Kruijs, Ileana Nedelcu, et al.. (2007). Enhanced reflectance of interface engineered Mo/Si multilayers produced by thermal particle deposition. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6517. 65170I–65170I. 32 indexed citations
10.
Nedelcu, Ileana, Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, et al.. (2007). Substrate recovery layers for EUVL optics: effects on multilayer reflectivity and surface roughness. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6517. 651730–651730. 1 indexed citations
11.
Laubis, Christian, Andreas Fischer, Frank Scholz, et al.. (2006). Characterization of large off-axis EUV mirrors with high accuracy reflectometry at PTB. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6151. 61510I–61510I. 8 indexed citations
12.
Kruijs, Robbert Wilhelmus Elisabeth van de, E. Zoethout, Andrey Yakshin, et al.. (2006). Nano-size crystallites in Mo/Si multilayer optics. Thin Solid Films. 515(2). 430–433. 26 indexed citations
13.
Louis, E., Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, et al.. (2006). Multilayer optics with spectral purity layers for the EUV wavelength range. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6151. 615139–615139. 5 indexed citations
14.
Böttger, Thomas, et al.. (2005). Laboratory LPP EUV reflectometer working with non-polarized radiation. Applied Surface Science. 252(1). 57–60. 5 indexed citations
15.
Louis, E., Andrey Yakshin, E. Zoethout, et al.. (2005). Enhanced performance of EUV multilayer coatings. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5900. 590002–590002. 5 indexed citations
16.
Kleineberg, U., Th. Westerwalbesloh, U. Heinzmann, et al.. (2003). Effect of substrate roughness on Mo/Si multilayer optics for EUVL produced by UHV-e-beam evaporation and ion polishing. Thin Solid Films. 433(1-2). 230–236. 10 indexed citations
17.
Dietsch, R., et al.. (2001). Mo/Si-multilayers for EUV applications prepared by Pulsed Laser Deposition (PLD). Microelectronic Engineering. 57-58. 9–15. 24 indexed citations
18.
Müllender, S., et al.. (1997). Monolithic Crystal Bender for Dynamical Sagittal Focusing with Compensation for Anticlastic Curvature and Twist Distortions. Journal de Physique IV (Proceedings). 7(C2). C2–317. 1 indexed citations
19.
Loeffen, P. W., R. F. Pettifer, S. Müllender, et al.. (1996). Deconvolution of lifetime broadening at rare-earthLIIIedges compared to resonant inelastic x-ray scattering measurements. Physical review. B, Condensed matter. 54(21). 14877–14880. 55 indexed citations
20.
Müllender, S., et al.. (1995). Active monolithic crystal bender for dynamical sagittal focusing. Physica B Condensed Matter. 208-209. 225–226. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by M. Mertin Breakdown of academic impact, for papers by Igor A. Makhotkin Breakdown of academic impact, for papers by Takashi Imazono Breakdown of academic impact, for papers by Stefan Günster Breakdown of academic impact, for papers by J.C. Banks Breakdown of academic impact, for papers by Q. F. Xiao Breakdown of academic impact, for papers by R. A. Levesque Breakdown of academic impact, for papers by M. Schürmann Breakdown of academic impact, for papers by H. Oetzmann Breakdown of academic impact, for papers by M.R. Went
Rankless by CCL
2026